UNICA IRIS Institutional Research Information System

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Mostrati risultati da 1 a 20 di 26
Titolo Data di pubblicazione Autore(i) Rivista Editore
Accelerated carbonation by cement kiln dust in aqueous slurries: chemical and mineralogical investigation 1-gen-2017 Medas, Daniela; Cappai, GIOVANNA SALVATORICA; DE GIUDICI, GIOVANNI BATTISTA; Piredda, Martina; Podda, Simona GREENHOUSE GASES -
XEBIC at the Dual Beam 1-gen-2013 Vanzi, Massimo; Podda, Simona; Musu, E; Cao, R. MICROELECTRONICS RELIABILITY -
Implementation of TV-rate EBIC at a Dual BEam 1-gen-2011 Vanzi, Massimo; Podda, Simona; Tatti, F. - -
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1-gen-2011 Vanzi, Massimo; Podda, Simona - Elisabetta Falcieri
3D reconstruction of FIB microstructures from BSE images 1-gen-2010 Podda, Simona; R., Pintus; E., Musu; Vanzi, Massimo - -
3D Sculptures from SEM images 1-gen-2008 Pintus, R; Podda, Simona; Vanzi, Massimo - -
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy 1-gen-2008 Pintus, R; Podda, Simona; Vanzi, Massimo IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT -
SEM Remote Control with a 3D option 1-gen-2008 Mighela, F; Perra, Cristian; Pintus, R; Podda, Simona; Vanzi, Massimo MICROSCOPY AND MICROANALYSIS -
Improvements in automated Photometric Stereo 3D SEM 1-gen-2008 R., Pintus; Podda, Simona; Vanzi, Massimo MICROSCOPY AND MICROANALYSIS -
Effects of BSE detector geometry on 3D SEM 1-gen-2006 Podda, Simona; Pintus, R; Vanzi, Massimo - -
Practical SEM 3D by BSE Photometric Stereo 1-gen-2006 Pintus, R; Podda, Simona; Vanzi, Massimo - -
Stability and performance evaluation of High Brightness Light Emitting Diodes under DC and pulsed bias conditions 1-gen-2006 M., Meneghini; L., Trevisanello; Podda, Simona; S., Buso; G., Spiazzi; G., Meneghesso; E., Zanoni - -
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy 1-gen-2006 Pintus, R; Podda, Simona; Vanzi, Massimo - -
High brightness GaN LEDs degradation during DC and pulsed stress 1-gen-2006 M., Meneghini; Podda, Simona; A., Morelli; R., Pintus; L., Trevisanello; G., Meneghesso; Vanzi, Massimo; E., Zanoni MICROELECTRONICS RELIABILITY -
High Brightness InGaN LEDs degradation at high injection current bias 1-gen-2006 S., Levada; M., Meneghini; E., Zanoni; S., Buso; G., Spiazzi; Meneghesso, G; Mura, Giovanna; Podda, Simona; Vanzi, Massimo - -
Image Alignment for 3D reconstruction in a SEM 1-gen-2005 Pintus, R; Podda, Simona; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Quantitative 3D reconstruction from BS imaging 1-gen-2004 Pintus, R.; Podda, Simona; Mighela, F.; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Failure Analysis of RuO2 Thick Film Chip Resistors 1-gen-2004 Podda, Simona; Vanzi, Massimo; Cassanelli, G.; Fantini, F. MICROELECTRONICS RELIABILITY -
Reliability of visible GaN LEDs in plastic package 1-gen-2003 G., Meneghesso; S., Levada; E., Zanoni; G., Scamarcio; Mura, Giovanna; Podda, Simona; Vanzi, Massimo; S., Du; I., Eliashevich MICROELECTRONICS RELIABILITY -
Failure modes and mechanisms of DC-aged GaN LEDs 1-gen-2002 Meneghesso, G; Levada, S; Zanoni, E; Podda, Simona; Mura, Giovanna; Vanzi, Massimo; Cavallini, A; Castaldini, A; Du, S; Eliashevich, I. - -
Mostrati risultati da 1 a 20 di 26
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