Sfoglia per Autore
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant
2023-01-01 Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M
Electronic Components Authentication via Physical Analysis
2023-01-01 Mura, G.; Carta, S.; Ricci, P. C.; Martines, G.
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells
2023-01-01 Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films
2023-01-01 Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.
Reliability risks from counterfeit electronics
2022-01-01 Mura, Giovanna; Martines, Giovanni
CdTe solar cells: technology, operation and reliability
2021-01-01 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G.
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH
2021-01-01 Mura, Giovanna; Fois, Gabriele
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms
2021-01-01 Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter
Laser Diode Reliability
2021-01-01 Mura, Giovanna
Laser Diode DC Measurement Protocols
2021-01-01 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G.
Analysis of Fake Amplifiers
2021-01-01 Mura, G.; Murru, R.; Martines, G.
Analysis of counterfeit electronics
2020-01-01 Mura, G.; Murru, R.; Martines, G.
Peculiar failure mechanisms in GaN power transistors
2020-01-01 Vanzi, M.; Mura, G.
Optical gain in laser diodes with null reflectivity
2019-01-01 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y.
New paradigm for EBIC amplifier on FIB X-section
2019-01-01 SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes
2018-01-01 Vanzi, M.; Mura, G.; SANNA VALLE, Valerio
From automotive to space qualification: Overlaps, gaps and possible convergence
2018-01-01 Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G.
Further improvements of an extended Hakki-Paoli method
2018-01-01 Vanzi, M.; Mura, G.; Martines, G.
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices
2018-01-01 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno
Reliability concerns from the gray market
2018-01-01 Mura, Giovanna
Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
---|---|---|---|---|
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant | 1-gen-2023 | Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M | MICROELECTRONICS RELIABILITY | - |
Electronic Components Authentication via Physical Analysis | 1-gen-2023 | Mura, G.; Carta, S.; Ricci, P. C.; Martines, G. | - | - |
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells | 1-gen-2023 | Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M. | IEEE JOURNAL OF PHOTOVOLTAICS | - |
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films | 1-gen-2023 | Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M. | IEEE ACCESS | - |
Reliability risks from counterfeit electronics | 1-gen-2022 | Mura, Giovanna; Martines, Giovanni | - | IEEE |
CdTe solar cells: technology, operation and reliability | 1-gen-2021 | Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. | JOURNAL OF PHYSICS D. APPLIED PHYSICS | - |
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH | 1-gen-2021 | Mura, Giovanna; Fois, Gabriele | - | AIT Series Trends in earth observation Volume 2 |
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms | 1-gen-2021 | Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter | - | - |
Laser Diode Reliability | 1-gen-2021 | Mura, Giovanna | - | ISTE Press Ltd. - Elsevier |
Laser Diode DC Measurement Protocols | 1-gen-2021 | Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. | - | Elsevier |
Analysis of Fake Amplifiers | 1-gen-2021 | Mura, G.; Murru, R.; Martines, G. | - | IEEE |
Analysis of counterfeit electronics | 1-gen-2020 | Mura, G.; Murru, R.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
Peculiar failure mechanisms in GaN power transistors | 1-gen-2020 | Vanzi, M.; Mura, G. | MICROELECTRONICS RELIABILITY | - |
Optical gain in laser diodes with null reflectivity | 1-gen-2019 | Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. | MICROELECTRONICS RELIABILITY | - |
New paradigm for EBIC amplifier on FIB X-section | 1-gen-2019 | SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO | - | - |
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes | 1-gen-2018 | Vanzi, M.; Mura, G.; SANNA VALLE, Valerio | - | SPIE |
From automotive to space qualification: Overlaps, gaps and possible convergence | 1-gen-2018 | Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G. | - | IEEE (Institute of Electrical and Electronics Engineers) |
Further improvements of an extended Hakki-Paoli method | 1-gen-2018 | Vanzi, M.; Mura, G.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices | 1-gen-2018 | Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno | JOURNAL OF ELECTRONIC MATERIALS | - |
Reliability concerns from the gray market | 1-gen-2018 | Mura, Giovanna | MICROELECTRONICS RELIABILITY | - |
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