Sfoglia per Autore

opzioni
Mostrati risultati da 1 a 20 di 80
Titolo Data di pubblicazione Autore(i) Rivista Editore
Laser Diode Reliability 1-gen-2021 Mura, Giovanna - ISTE Press Ltd. - Elsevier
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms 1-gen-2021 Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter - -
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH 1-gen-2021 Mura, Giovanna; Fois, Gabriele - AIT Series Trends in earth observation Volume 2
Laser Diode DC Measurement Protocols 1-gen-2021 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. - Elsevier
CdTe solar cells: technology, operation and reliability 1-gen-2021 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. JOURNAL OF PHYSICS D. APPLIED PHYSICS -
Analysis of Fake Amplifiers 1-gen-2021 Mura, G.; Murru, R.; Martines, G. - IEEE
Analysis of counterfeit electronics 1-gen-2020 Mura, G.; Murru, R.; Martines, G. MICROELECTRONICS RELIABILITY -
Peculiar failure mechanisms in GaN power transistors 1-gen-2020 Vanzi, M.; Mura, G. MICROELECTRONICS RELIABILITY -
Optical gain in laser diodes with null reflectivity 1-gen-2019 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. MICROELECTRONICS RELIABILITY -
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1-gen-2018 Vanzi, M.; Mura, G.; SANNA VALLE, Valerio - SPIE
From automotive to space qualification: Overlaps, gaps and possible convergence 1-gen-2018 Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G. - IEEE (Institute of Electrical and Electronics Engineers)
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1-gen-2018 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno JOURNAL OF ELECTRONIC MATERIALS -
Reliability concerns from the gray market 1-gen-2018 Mura, Giovanna MICROELECTRONICS RELIABILITY -
Further improvements of an extended Hakki-Paoli method 1-gen-2018 Vanzi, M.; Mura, G.; Martines, G. MICROELECTRONICS RELIABILITY -
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1-gen-2017 Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. - IEEE (Institute of Electrical and Electronics Engineers)
Analysis of GaN based high-power diode lasers after singular degradation events 1-gen-2017 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS -
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities 1-gen-2017 Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M. MICROELECTRONICS RELIABILITY -
Practical optical gain by an extended Hakki-Paoli method 1-gen-2017 Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. MICROELECTRONICS RELIABILITY -
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs 1-gen-2017 Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO - -
Extended Modal Gain Measurement in DFB Laser Diodes 1-gen-2017 Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L. IEEE PHOTONICS TECHNOLOGY LETTERS -
Mostrati risultati da 1 a 20 di 80
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile