Sfoglia per Autore
Laser Diode Reliability
2021-01-01 Mura, Giovanna
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms
2021-01-01 Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH
2021-01-01 Mura, Giovanna; Fois, Gabriele
Laser Diode DC Measurement Protocols
2021-01-01 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G.
CdTe solar cells: technology, operation and reliability
2021-01-01 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G.
Analysis of Fake Amplifiers
2021-01-01 Mura, G.; Murru, R.; Martines, G.
Analysis of counterfeit electronics
2020-01-01 Mura, G.; Murru, R.; Martines, G.
Peculiar failure mechanisms in GaN power transistors
2020-01-01 Vanzi, M.; Mura, G.
Optical gain in laser diodes with null reflectivity
2019-01-01 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y.
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes
2018-01-01 Vanzi, M.; Mura, G.; SANNA VALLE, Valerio
From automotive to space qualification: Overlaps, gaps and possible convergence
2018-01-01 Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G.
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices
2018-01-01 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno
Reliability concerns from the gray market
2018-01-01 Mura, Giovanna
Further improvements of an extended Hakki-Paoli method
2018-01-01 Vanzi, M.; Mura, G.; Martines, G.
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers
2017-01-01 Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M.
Analysis of GaN based high-power diode lasers after singular degradation events
2017-01-01 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W.
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities
2017-01-01 Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M.
Practical optical gain by an extended Hakki-Paoli method
2017-01-01 Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs
2017-01-01 Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO
Extended Modal Gain Measurement in DFB Laser Diodes
2017-01-01 Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L.
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Laser Diode Reliability | 1-gen-2021 | Mura, Giovanna | - | ISTE Press Ltd. - Elsevier |
| Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms | 1-gen-2021 | Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter | - | - |
| CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH | 1-gen-2021 | Mura, Giovanna; Fois, Gabriele | - | AIT Series Trends in earth observation Volume 2 |
| Laser Diode DC Measurement Protocols | 1-gen-2021 | Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. | - | Elsevier |
| CdTe solar cells: technology, operation and reliability | 1-gen-2021 | Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. | JOURNAL OF PHYSICS D. APPLIED PHYSICS | - |
| Analysis of Fake Amplifiers | 1-gen-2021 | Mura, G.; Murru, R.; Martines, G. | - | IEEE |
| Analysis of counterfeit electronics | 1-gen-2020 | Mura, G.; Murru, R.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
| Peculiar failure mechanisms in GaN power transistors | 1-gen-2020 | Vanzi, M.; Mura, G. | MICROELECTRONICS RELIABILITY | - |
| Optical gain in laser diodes with null reflectivity | 1-gen-2019 | Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. | MICROELECTRONICS RELIABILITY | - |
| Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes | 1-gen-2018 | Vanzi, M.; Mura, G.; SANNA VALLE, Valerio | - | SPIE |
| From automotive to space qualification: Overlaps, gaps and possible convergence | 1-gen-2018 | Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G. | - | IEEE (Institute of Electrical and Electronics Engineers) |
| Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices | 1-gen-2018 | Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno | JOURNAL OF ELECTRONIC MATERIALS | - |
| Reliability concerns from the gray market | 1-gen-2018 | Mura, Giovanna | MICROELECTRONICS RELIABILITY | - |
| Further improvements of an extended Hakki-Paoli method | 1-gen-2018 | Vanzi, M.; Mura, G.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
| Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers | 1-gen-2017 | Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. | - | IEEE (Institute of Electrical and Electronics Engineers) |
| Analysis of GaN based high-power diode lasers after singular degradation events | 1-gen-2017 | Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. | PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS | - |
| Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities | 1-gen-2017 | Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M. | MICROELECTRONICS RELIABILITY | - |
| Practical optical gain by an extended Hakki-Paoli method | 1-gen-2017 | Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. | MICROELECTRONICS RELIABILITY | - |
| Analytical model for the I-V characteristics of fresh and degraded commercial LEDs | 1-gen-2017 | Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO | - | - |
| Extended Modal Gain Measurement in DFB Laser Diodes | 1-gen-2017 | Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L. | IEEE PHOTONICS TECHNOLOGY LETTERS | - |
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