Sfoglia per Autore
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs
2017-01-01 Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO
Extended Modal Gain Measurement in DFB Laser Diodes
2017-01-01 Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L.
Analysis of GaN based high-power diode lasers after singular degradation events
2017-01-01 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W.
Practical optical gain by an extended Hakki-Paoli method
2017-01-01 Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers
2017-01-01 Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M.
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities
2017-01-01 Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M.
Single Event Transient acquisition and mapping for space device Characterization
2016-01-01 Pilia, Roberta; Bascoul, Guillaume; Sanchez, Kevin; Mura, Giovanna; Infante, Fulvio
Side-Mode Excitation in Single-Mode Laser Diodes
2016-01-01 Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue
2016-01-01 Mura, Giovanna; Vanzi, Massimo
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes
2016-01-01 De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico
Reverse bias degradation of metal wrap through silicon solar cells
2016-01-01 Barbato, M.; Barbato, A.; Meneghini, M.; Cester, A.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G.; Meneghesso, G.
ESD tests on 850 nm GaAs-based VCSELs
2016-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K.
Degradation mechanisms and lifetime of state-of-the-art green laser diodes
2015-01-01 Marioli, M; Meneghini, M; Rossi, F; Salviati, G; de Santi, C; Mura, Giovanna; Meneghesso, G; Zanoni, E.
Clamp voltage and ideality factor in laser diodes
2015-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni
Reliability issues in Optical Emitters
2015-01-01 Vanzi, Massimo; Mura, Giovanna
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells
2015-01-01 Barbato, M.; Meneghini, M.; Cester, A.; Barbato, A.; Zanoni, E.; Meneghesso, G.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G.
Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress
2014-01-01 Meneghini, M; Carraro, S; Meneghesso, G; Trivellin, N; Mura, Giovanna; Rossi, F; Salviati, G; Holc, K; Weig, T; Schade, L; Karunakaran, M; Wagner, J; Schwarz U., T; Zanoni, E.
FIB-induced electro-optical alterations in a DFB InP laser diode
2014-01-01 Mura, Giovanna; Vanzi, Massimo; Marcello, G.
Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis
2014-01-01 Barbato, M.; Meneghini, M; Cester, A; Mura, Giovanna; Zanoni, E; Meneghesso, G.
Reliability prediction and real world for LED lamps
2014-01-01 Mura, Giovanna; Vanzi, Massimo
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Analytical model for the I-V characteristics of fresh and degraded commercial LEDs | 1-gen-2017 | Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO | - | - |
| Extended Modal Gain Measurement in DFB Laser Diodes | 1-gen-2017 | Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L. | IEEE PHOTONICS TECHNOLOGY LETTERS | - |
| Analysis of GaN based high-power diode lasers after singular degradation events | 1-gen-2017 | Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. | PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS | - |
| Practical optical gain by an extended Hakki-Paoli method | 1-gen-2017 | Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. | MICROELECTRONICS RELIABILITY | - |
| Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers | 1-gen-2017 | Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. | - | IEEE (Institute of Electrical and Electronics Engineers) |
| Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities | 1-gen-2017 | Enrici Vaion, R.; Medda, M.; Mancaleoni, A.; Mura, G.; Pintus, A.; De Tomasi, M. | MICROELECTRONICS RELIABILITY | - |
| Single Event Transient acquisition and mapping for space device Characterization | 1-gen-2016 | Pilia, Roberta; Bascoul, Guillaume; Sanchez, Kevin; Mura, Giovanna; Infante, Fulvio | MICROELECTRONICS RELIABILITY | - |
| Side-Mode Excitation in Single-Mode Laser Diodes | 1-gen-2016 | Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - |
| Logics of Failure Analysis: 20 Years of rules of the Rue Morgue | 1-gen-2016 | Mura, Giovanna; Vanzi, Massimo | - | Institute of Electrical and Electronics Engineers Inc. |
| Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes | 1-gen-2016 | De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico | IEEE TRANSACTIONS ON NANOTECHNOLOGY | - |
| Reverse bias degradation of metal wrap through silicon solar cells | 1-gen-2016 | Barbato, M.; Barbato, A.; Meneghini, M.; Cester, A.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G.; Meneghesso, G. | SOLAR ENERGY MATERIALS AND SOLAR CELLS | - |
| ESD tests on 850 nm GaAs-based VCSELs | 1-gen-2016 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K. | MICROELECTRONICS RELIABILITY | - |
| Degradation mechanisms and lifetime of state-of-the-art green laser diodes | 1-gen-2015 | Marioli, M; Meneghini, M; Rossi, F; Salviati, G; de Santi, C; Mura, Giovanna; Meneghesso, G; Zanoni, E. | PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE | - |
| Clamp voltage and ideality factor in laser diodes | 1-gen-2015 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni | MICROELECTRONICS RELIABILITY | - |
| Reliability issues in Optical Emitters | 1-gen-2015 | Vanzi, Massimo; Mura, Giovanna | - | IEEE Computer Society |
| Stress-induced instabilities of shunt paths in high efficiency MWT solar cells | 1-gen-2015 | Barbato, M.; Meneghini, M.; Cester, A.; Barbato, A.; Zanoni, E.; Meneghesso, G.; Mura, Giovanna; Tonini, D.; Voltan, A.; Cellere, G. | - | - |
| Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress | 1-gen-2014 | Meneghini, M; Carraro, S; Meneghesso, G; Trivellin, N; Mura, Giovanna; Rossi, F; Salviati, G; Holc, K; Weig, T; Schade, L; Karunakaran, M; Wagner, J; Schwarz U., T; Zanoni, E. | - | SPIE, the international society for optics and photonics |
| FIB-induced electro-optical alterations in a DFB InP laser diode | 1-gen-2014 | Mura, Giovanna; Vanzi, Massimo; Marcello, G. | MICROELECTRONICS RELIABILITY | - |
| Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis | 1-gen-2014 | Barbato, M.; Meneghini, M; Cester, A; Mura, Giovanna; Zanoni, E; Meneghesso, G. | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - |
| Reliability prediction and real world for LED lamps | 1-gen-2014 | Mura, Giovanna; Vanzi, Massimo | - | IEEE (Institute of Electrical and Electronics Engineers, Inc.) |
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