PODDA, SIMONA
PODDA, SIMONA
Accelerated carbonation by cement kiln dust in aqueous slurries: chemical and mineralogical investigation
2017-01-01 Medas, Daniela; Cappai, GIOVANNA SALVATORICA; DE GIUDICI, GIOVANNI BATTISTA; Piredda, Martina; Podda, Simona
XEBIC at the Dual Beam
2013-01-01 Vanzi, Massimo; Podda, Simona; Musu, E; Cao, R.
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics
2011-01-01 Vanzi, Massimo; Podda, Simona
Implementation of TV-rate EBIC at a Dual BEam
2011-01-01 Vanzi, Massimo; Podda, Simona; Tatti, F.
3D reconstruction of FIB microstructures from BSE images
2010-01-01 Podda, Simona; R., Pintus; E., Musu; Vanzi, Massimo
3D Sculptures from SEM images
2008-01-01 Pintus, R; Podda, Simona; Vanzi, Massimo
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy
2008-01-01 Pintus, R; Podda, Simona; Vanzi, Massimo
Improvements in automated Photometric Stereo 3D SEM
2008-01-01 R., Pintus; Podda, Simona; Vanzi, Massimo
SEM Remote Control with a 3D option
2008-01-01 Mighela, F; Perra, Cristian; Pintus, R; Podda, Simona; Vanzi, Massimo
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy
2006-01-01 Pintus, R; Podda, Simona; Vanzi, Massimo
Effects of BSE detector geometry on 3D SEM
2006-01-01 Podda, Simona; Pintus, R; Vanzi, Massimo
High brightness GaN LEDs degradation during DC and pulsed stress
2006-01-01 M., Meneghini; Podda, Simona; A., Morelli; R., Pintus; L., Trevisanello; G., Meneghesso; Vanzi, Massimo; E., Zanoni
High Brightness InGaN LEDs degradation at high injection current bias
2006-01-01 S., Levada; M., Meneghini; E., Zanoni; S., Buso; G., Spiazzi; Meneghesso, G; Mura, Giovanna; Podda, Simona; Vanzi, Massimo
Practical SEM 3D by BSE Photometric Stereo
2006-01-01 Pintus, R; Podda, Simona; Vanzi, Massimo
Stability and performance evaluation of High Brightness Light Emitting Diodes under DC and pulsed bias conditions
2006-01-01 M., Meneghini; L., Trevisanello; Podda, Simona; S., Buso; G., Spiazzi; G., Meneghesso; E., Zanoni
Image Alignment for 3D reconstruction in a SEM
2005-01-01 Pintus, R; Podda, Simona; Vanzi, Massimo
Failure Analysis of RuO2 Thick Film Chip Resistors
2004-01-01 Podda, Simona; Vanzi, Massimo; Cassanelli, G.; Fantini, F.
Quantitative 3D reconstruction from BS imaging
2004-01-01 Pintus, R.; Podda, Simona; Mighela, F.; Vanzi, Massimo
Reliability of visible GaN LEDs in plastic package
2003-01-01 G., Meneghesso; S., Levada; E., Zanoni; G., Scamarcio; Mura, Giovanna; Podda, Simona; Vanzi, Massimo; S., Du; I., Eliashevich
A specimen-current branching approach for FA of long Electromigration test lines
2002-01-01 C., Caprile; I., DE MUNARI; M., Impronta; Podda, Simona; A., Scorzoni; Vanzi, Massimo
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Accelerated carbonation by cement kiln dust in aqueous slurries: chemical and mineralogical investigation | 1-gen-2017 | Medas, Daniela; Cappai, GIOVANNA SALVATORICA; DE GIUDICI, GIOVANNI BATTISTA; Piredda, Martina; Podda, Simona | GREENHOUSE GASES | - |
| XEBIC at the Dual Beam | 1-gen-2013 | Vanzi, Massimo; Podda, Simona; Musu, E; Cao, R. | MICROELECTRONICS RELIABILITY | - |
| Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics | 1-gen-2011 | Vanzi, Massimo; Podda, Simona | - | Elisabetta Falcieri |
| Implementation of TV-rate EBIC at a Dual BEam | 1-gen-2011 | Vanzi, Massimo; Podda, Simona; Tatti, F. | - | - |
| 3D reconstruction of FIB microstructures from BSE images | 1-gen-2010 | Podda, Simona; R., Pintus; E., Musu; Vanzi, Massimo | - | - |
| 3D Sculptures from SEM images | 1-gen-2008 | Pintus, R; Podda, Simona; Vanzi, Massimo | - | - |
| An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy | 1-gen-2008 | Pintus, R; Podda, Simona; Vanzi, Massimo | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | - |
| Improvements in automated Photometric Stereo 3D SEM | 1-gen-2008 | R., Pintus; Podda, Simona; Vanzi, Massimo | MICROSCOPY AND MICROANALYSIS | - |
| SEM Remote Control with a 3D option | 1-gen-2008 | Mighela, F; Perra, Cristian; Pintus, R; Podda, Simona; Vanzi, Massimo | MICROSCOPY AND MICROANALYSIS | - |
| An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy | 1-gen-2006 | Pintus, R; Podda, Simona; Vanzi, Massimo | - | - |
| Effects of BSE detector geometry on 3D SEM | 1-gen-2006 | Podda, Simona; Pintus, R; Vanzi, Massimo | - | - |
| High brightness GaN LEDs degradation during DC and pulsed stress | 1-gen-2006 | M., Meneghini; Podda, Simona; A., Morelli; R., Pintus; L., Trevisanello; G., Meneghesso; Vanzi, Massimo; E., Zanoni | MICROELECTRONICS RELIABILITY | - |
| High Brightness InGaN LEDs degradation at high injection current bias | 1-gen-2006 | S., Levada; M., Meneghini; E., Zanoni; S., Buso; G., Spiazzi; Meneghesso, G; Mura, Giovanna; Podda, Simona; Vanzi, Massimo | - | - |
| Practical SEM 3D by BSE Photometric Stereo | 1-gen-2006 | Pintus, R; Podda, Simona; Vanzi, Massimo | - | - |
| Stability and performance evaluation of High Brightness Light Emitting Diodes under DC and pulsed bias conditions | 1-gen-2006 | M., Meneghini; L., Trevisanello; Podda, Simona; S., Buso; G., Spiazzi; G., Meneghesso; E., Zanoni | - | - |
| Image Alignment for 3D reconstruction in a SEM | 1-gen-2005 | Pintus, R; Podda, Simona; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | - |
| Failure Analysis of RuO2 Thick Film Chip Resistors | 1-gen-2004 | Podda, Simona; Vanzi, Massimo; Cassanelli, G.; Fantini, F. | MICROELECTRONICS RELIABILITY | - |
| Quantitative 3D reconstruction from BS imaging | 1-gen-2004 | Pintus, R.; Podda, Simona; Mighela, F.; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | - |
| Reliability of visible GaN LEDs in plastic package | 1-gen-2003 | G., Meneghesso; S., Levada; E., Zanoni; G., Scamarcio; Mura, Giovanna; Podda, Simona; Vanzi, Massimo; S., Du; I., Eliashevich | MICROELECTRONICS RELIABILITY | - |
| A specimen-current branching approach for FA of long Electromigration test lines | 1-gen-2002 | C., Caprile; I., DE MUNARI; M., Impronta; Podda, Simona; A., Scorzoni; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | - |