PODDA, SIMONA

PODDA, SIMONA  

Mostra records
Risultati 1 - 20 di 26 (tempo di esecuzione: 0.031 secondi).
Titolo Data di pubblicazione Autore(i) Rivista Editore
3D reconstruction of FIB microstructures from BSE images 1-gen-2010 Podda, Simona; R., Pintus; E., Musu; Vanzi, Massimo - -
3D Sculptures from SEM images 1-gen-2008 Pintus, R; Podda, Simona; Vanzi, Massimo - -
A specimen-current branching approach for FA of long Electromigration test lines 1-gen-2002 C., Caprile; I., DE MUNARI; M., Impronta; Podda, Simona; A., Scorzoni; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Accelerated carbonation by cement kiln dust in aqueous slurries: chemical and mineralogical investigation 1-gen-2017 Medas, Daniela; Cappai, GIOVANNA SALVATORICA; DE GIUDICI, GIOVANNI BATTISTA; Piredda, Martina; Podda, Simona GREENHOUSE GASES -
An automated lifetest equipment for optical emitters 1-gen-2002 Giglio, M; Martines, Giovanni; Mura, Giovanna; Podda, Simona; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy 1-gen-2006 Pintus, R; Podda, Simona; Vanzi, Massimo - -
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy 1-gen-2008 Pintus, R; Podda, Simona; Vanzi, Massimo IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT -
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1-gen-2011 Vanzi, Massimo; Podda, Simona - Elisabetta Falcieri
Backside Failure Analysis of GaAs ICs after EDS tests 1-gen-2002 Meneghesso, G; Cocco, A; Mura, Giovanna; Podda, Simona; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Effects of BSE detector geometry on 3D SEM 1-gen-2006 Podda, Simona; Pintus, R; Vanzi, Massimo - -
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 1-gen-2002 L., Sponton; L., Cerati; G., Croce; Mura, Giovanna; Podda, Simona; Vanzi, Massimo; G., Meneghesso MICROELECTRONICS RELIABILITY -
Failure Analysis of RuO2 Thick Film Chip Resistors 1-gen-2004 Podda, Simona; Vanzi, Massimo; Cassanelli, G.; Fantini, F. MICROELECTRONICS RELIABILITY -
Failure modes and mechanisms of DC-aged GaN LEDs 1-gen-2002 Meneghesso, G; Levada, S; Zanoni, E; Podda, Simona; Mura, Giovanna; Vanzi, Massimo; Cavallini, A; Castaldini, A; Du, S; Eliashevich, I. - -
High brightness GaN LEDs degradation during DC and pulsed stress 1-gen-2006 M., Meneghini; Podda, Simona; A., Morelli; R., Pintus; L., Trevisanello; G., Meneghesso; Vanzi, Massimo; E., Zanoni MICROELECTRONICS RELIABILITY -
High Brightness InGaN LEDs degradation at high injection current bias 1-gen-2006 S., Levada; M., Meneghini; E., Zanoni; S., Buso; G., Spiazzi; Meneghesso, G; Mura, Giovanna; Podda, Simona; Vanzi, Massimo - -
Image Alignment for 3D reconstruction in a SEM 1-gen-2005 Pintus, R; Podda, Simona; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Implementation of TV-rate EBIC at a Dual BEam 1-gen-2011 Vanzi, Massimo; Podda, Simona; Tatti, F. - -
Improvements in automated Photometric Stereo 3D SEM 1-gen-2008 R., Pintus; Podda, Simona; Vanzi, Massimo MICROSCOPY AND MICROANALYSIS -
Invenstigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs 1-gen-2001 Meneghesso, G.; Podda, Simona; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Investigation on ESD-stressed GaN/InGaN- on-sapphire Blue LED 1-gen-2001 Podda, Simona; Vanzi, Massimo; Meneghesso, G. - -