MARTINES, GIOVANNI

MARTINES, GIOVANNI  

DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA  

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Risultati 1 - 20 di 46 (tempo di esecuzione: 0.002 secondi).
Titolo Data di pubblicazione Autore(i) Rivista Editore
A computer-assisted noise parameter test-set for the characterization of microwave transistors in terms of noise, gain and scattering parameters 1-gen-1986 Martines, Giovanni; Sannino, M. - -
A computer-controlled test-set for the complete characterization of GaAs low noise devices 1-gen-1988 Martines, Giovanni; Sannino, M. - -
A global approach to the noise and small-signal characterization of microwave field-effect transistors 1-gen-2001 Caddemi, A; Martines, Giovanni - World Scientific
A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters 1-gen-1987 Martines, Giovanni; M., Sannino IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES -
A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters 1-gen-1991 Martines, Giovanni; M., Sannino - -
A new automated test-set for the characterization of low-noise devices in terms of noise, gain and scattering parameters 1-gen-1990 Garbo, G; Martines, Giovanni; Sannino, M. - -
A novel approach to determine the start-up conditions in microwave negative impedance oscillator design 1-gen-2007 Monni, M; Martines, Giovanni - Horizon House Publications Ltd
A simpler method for life-testing laser diodes 1-gen-1999 Vanzi, Massimo; Martines, Giovanni; Bonfiglio, Annalisa; Licheri, M; Darco, R; Salmini, G; DE PALO, R. MICROELECTRONICS RELIABILITY Elsevier science
An automated lifetest equipment for optical emitters 1-gen-2002 Giglio, M; Martines, Giovanni; Mura, Giovanna; Podda, Simona; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
An automated measuring system for the simultaneous determination of noise, gain and scattering parameters of HEMTs 1-gen-1991 Martines, Giovanni; Sannino, M. - -
An automated test-set for the complete characterization on low noise microwave transistors 1-gen-1990 Martines, Giovanni; Sannino, M. MICROWAVE ENGINEERING EUROPE -
Analysis of counterfeit electronics 1-gen-2020 Mura, G.; Murru, R.; Martines, G. MICROELECTRONICS RELIABILITY -
Analysis of Fake Amplifiers 1-gen-2021 Mura, G.; Murru, R.; Martines, G. - IEEE
Automated test-set for accurate measurements of minimum noise figure of GaAs FETs 1-gen-1990 Garbo, G; Martines, Giovanni; Sannino, M. - -
Automatic characterization and modeling of microwave low noise HEMTs 1-gen-1992 Caddemi, A; Martines, Giovanni; Sannino, M. - -
Automatic characterization and modeling of microwave low-noise HEMTs 1-gen-1992 A., Caddemi; Martines, Giovanni; M., Sannino IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT -
CAD-oriented HEMT models from noise and scattering measurements 1-gen-1992 Caddemi, A; Martines, Giovanni; Sannino, M. - -
CAD-oriented modeling of low-noise HEMTs 1-gen-1992 Caddemi, A; Martines, Giovanni; Sannino, M. - -
CAD-oriented modeling of pseudomorphic HEMTs from simultaneous noise and scattering measurements 1-gen-1993 Caddemi, A; Gambino, G; Lio, M; Martines, Giovanni; Sannino, M. - -
Characterization and modeling of low noise HEMTs for microwave radio link 1-gen-1991 Caddemi, A; Martines, Giovanni; Sannino, M. - -