GILMORE, IAN STUART
GILMORE, IAN STUART
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Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry
2019-01-01 Tiddia, Mariavitalia; Mihara, Ichiro; Seah, Martin P.; Ferraz Trindade, Gustavo; Kollmer, Felix; Roberts, Clive J.; Hague, Richard; Mula, Guido; Gilmore, Ian S.; Havelund, Rasmus
Using a porous matrix to study, characterize and recover damaged signal after focused ion beam cutting
2018-01-01 Tiddia, M.; Mula, G.; Mihara, I.; Havelund, R.; Gilmore, I.
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry | 1-gen-2019 | Tiddia, Mariavitalia; Mihara, Ichiro; Seah, Martin P.; Ferraz Trindade, Gustavo; Kollmer, Felix; Roberts, Clive J.; Hague, Richard; Mula, Guido; Gilmore, Ian S.; Havelund, Rasmus | ACS APPLIED MATERIALS & INTERFACES | - |
| Using a porous matrix to study, characterize and recover damaged signal after focused ion beam cutting | 1-gen-2018 | Tiddia, M.; Mula, G.; Mihara, I.; Havelund, R.; Gilmore, I. | - | - |