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Mostrati risultati da 21 a 40 di 115
Titolo Data di pubblicazione Autore(i) Rivista Editore
Recent improvements in photometric stereo for rock art 3D imaging 1-gen-2015 Dessì, R; Mannu, C; Rodriguez, Giuseppe; Tanda, Giuseppa; Vanzi, Massimo DIGITAL APPLICATIONS IN ARCHAEOLOGY AND CULTURAL HERITAGE -
Photometric stereo for 3D mapping of carvings and relieves: case studies on prehistorical art in Sardinia 1-gen-2014 Vanzi, Massimo; Mannu, C; Dessì, R; Rodriguez, Giuseppe; Tanda, Giuseppa ÂNGULO -
Reliability prediction and real world for LED lamps 1-gen-2014 Mura, Giovanna; Vanzi, Massimo - IEEE (Institute of Electrical and Electronics Engineers, Inc.)
Ideality factor and threshold voltage in laser diodes 1-gen-2014 Vanzi, Massimo; Mura, Giovanna; Marcello, G. - -
FIB-induced electro-optical alterations in a DFB InP laser diode 1-gen-2014 Mura, Giovanna; Vanzi, Massimo; Marcello, G. MICROELECTRONICS RELIABILITY -
Optical losses in single-mode laser diodes 1-gen-2013 Vanzi, Massimo; Mura, Giovanna; Marongiu, M.; Tomasi, T. MICROELECTRONICS RELIABILITY -
Faulty failure analyses 1-gen-2013 Mura, Giovanna; Vanzi, Massimo - IEEE
“Hot-plugging” of led modules: electrical characterization and device degradation 1-gen-2013 Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E. MICROELECTRONICS RELIABILITY -
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1-gen-2013 Compagnin, A; Meneghini, M; Barbato, M; Giliberto, V; Cester, A; Vanzi, Massimo; Mura, Giovanna; Zanoni, E; Meneghesso, G. MICROELECTRONICS RELIABILITY -
The role of the optical trans-characteristics in laser diode analysis 1-gen-2013 Mura, Giovanna; Vanzi, Massimo; Marcello, G.; Cao, R. MICROELECTRONICS RELIABILITY -
XEBIC at the Dual Beam 1-gen-2013 Vanzi, Massimo; Podda, Simona; Musu, E; Cao, R. MICROELECTRONICS RELIABILITY -
External cavity ITLA degradation 1-gen-2012 Mura, Giovanna; Vanzi, Massimo; Martines, Giovanni; T., Tomasi; R., Cao; M., Marongiu - -
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1-gen-2012 M., Meneghini; M., Bertin; G., dal Santo; A., Stocco; A., Chini; D., Marcon; P. E., Malinowski; Mura, Giovanna; E., Musu; Vanzi, Massimo; G., Meneghesso; E., Zanoni - -
Phosphors for LED-based light sources: Thermal properties and reliability issues 1-gen-2012 Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E. MICROELECTRONICS RELIABILITY -
Chip and package-related degradation of high power white LEDs 1-gen-2012 Meneghini, M; Dal Lago, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Menegnesso, G; Zanoni, E. MICROELECTRONICS RELIABILITY -
Implementation of TV-rate EBIC at a Dual BEam 1-gen-2011 Vanzi, Massimo; Podda, Simona; Tatti, F. - -
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1-gen-2011 Vanzi, Massimo; Podda, Simona - Elisabetta Falcieri
DC parameters for laser diodes from experimental curves 1-gen-2011 Vanzi, Massimo; Mura, Giovanna; Martines, Giovanni MICROELECTRONICS RELIABILITY Elsevier
An original DoE-based tool for silicon photodetectors EoL estimation in space environments 1-gen-2011 Vanzi, Massimo; Spezzigu, P; Bechou, L; Quadri, G; Gilard, O; Ousten, Y. MICROELECTRONICS RELIABILITY Elsevier
Degradation mechanisms of white LEDs for lighting applications 1-gen-2010 M., Meneghini; M., DAL LAGO; L., Rodighiero; Mura, Giovanna; Vanzi, Massimo; G., Meneghesso - -
Mostrati risultati da 21 a 40 di 115
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