Sfoglia per Autore
Degradation mechanisms of white LEDs for lighting applications
2010-01-01 M., Meneghini; M., DAL LAGO; L., Rodighiero; Mura, Giovanna; Vanzi, Massimo; G., Meneghesso
Optimized "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment
2010-01-01 Quadri, G; P., Spezzigu; C., Caddeo; O., Gilard; L., Bechou; Vanzi, Massimo
3D reconstruction of FIB microstructures from BSE images
2010-01-01 Podda, Simona; R., Pintus; E., Musu; Vanzi, Massimo
Prediction of Phototransistor Spectral Responsivity Degradation in a Space Environment using DOE methodology
2010-01-01 Spezzigu, P; L., Bechou; G., Quadri; O., Gilard; C., Caddeo; Y., Ousten; Vanzi, Massimo
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM
2010-01-01 S., Podda; R., Pintus; E., Musu; Vanzi, Massimo
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis
2010-01-01 Mura, Giovanna; Vanzi, Massimo
Trapped mobile charges effects on electrooptical performances in silicon phototransistors for space applications
2009-01-01 P., Spezzigu; G., Quadri; O., Gilard; L., Bechou; Y., Ousten; Vanzi, Massimo
Implementation of a "Design of experiments" methodology for the prediction of phototransistor degradation in a space environment
2009-01-01 Spezzigu, P; Caddeo, Claudia; Quadri, G; Gilard, O; Bechou, L; Ousten, Y; Vanzi, Massimo
Customized and highly reliable channel phototransistor array for aerospace optical encoders
2009-01-01 M., Bregoli; A., Maglione; A., Collini; P., Bellutti; P., Spezzigu; L., Bechou; Vanzi, Massimo
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices
2009-01-01 Mura, Giovanna; Vanzi, Massimo
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs
2009-01-01 Meneghesso, G; Meneghini, M; Trivellin, N; Rodighiero, L; Mura, Giovanna; Vanzi, Massimo; Zanoni, E.
Silicon phototransistor reliability assessment and new selection strategies for space applications
2008-01-01 Spezzigu, P; Bechou, L; Deshayes, Y; Ousten, Y; Quadri, G; Gilard, O; Vanzi, Massimo
A model for the DC characteristics of a laser diode
2008-01-01 Vanzi, Massimo
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels
2008-01-01 Mura, Giovanna; L., Trevisanello; Vanzi, Massimo; G., Meneghesso; E., Zanoni
Evaluation of static and dynamic performances of silicon-based bipolar phototransistors under radiation
2008-01-01 Quadri, G; Gilard, O; L., ROUX J; Spezzigu, P; Bechou, L; Vanzi, Massimo; Ousten, Y; Gibard, D.
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy
2008-01-01 Pintus, R; Podda, Simona; Vanzi, Massimo
Improvements in automated Photometric Stereo 3D SEM
2008-01-01 R., Pintus; Podda, Simona; Vanzi, Massimo
Accelerated Life Test of High Brightness Light Emitting Diodes
2008-01-01 L., Trevisanello; M., Meneghini; Mura, Giovanna; Vanzi, Massimo; M., Pavesi; G., Meneghesso; E., Zanoni
SEM Remote Control with a 3D option
2008-01-01 Mighela, F; Perra, Cristian; Pintus, R; Podda, Simona; Vanzi, Massimo
Sulfur-contamination of High Power White LEDs
2008-01-01 Mura, Giovanna; Cassanelli, G; Fantini, F; Vanzi, Massimo
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