ANGIONI, DANIELE
ANGIONI, DANIELE
DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA
Adversarial Attacks Against Uncertainty Quantification
2023-01-01 Ledda, Emanuele; Angioni, Daniele; Piras, Giorgio; Fumera, Giorgio; Biggio, Battista; Roli, Fabio
AI Security and Safety: The PRALab Research Experience
2023-01-01 Demontis, Ambra; Pintor, Maura; Demetrio, Luca; Sotgiu, Angelo; Angioni, Daniele; Piras, Giorgio; Gupta, Srishti; Biggio, Battista; Roli, Fabio
ImageNet-Patch: A Dataset for Benchmarking Machine Learning Robustness against Adversarial Patches
2023-01-01 Pintor, Maura; Angioni, Daniele; Sotgiu, Angelo; Demetrio, Luca; Demontis, Ambra; Biggio, Battista; Roli, Fabio
Robust Machine Learning for Malware Detection over Time
2022-01-01 Angioni, Daniele; Demetrio, Luca; Pintor, Maura; Biggio, Battista
Are spoofs from latent fingerprints a real threat for the best state-of-art liveness detectors?
2021-01-01 Casula, R.; Orru', G.; Angioni, D.; Feng, X.; Marcialis, G. L.; Roli, F.
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Adversarial Attacks Against Uncertainty Quantification | 1-gen-2023 | Ledda, Emanuele; Angioni, Daniele; Piras, Giorgio; Fumera, Giorgio; Biggio, Battista; Roli, Fabio | - | IEEE COMPUTER SOC |
| AI Security and Safety: The PRALab Research Experience | 1-gen-2023 | Demontis, Ambra; Pintor, Maura; Demetrio, Luca; Sotgiu, Angelo; Angioni, Daniele; Piras, Giorgio; Gupta, Srishti; Biggio, Battista; Roli, Fabio | - | CEUR-WS Team, Redaktion Sun SITE |
| ImageNet-Patch: A Dataset for Benchmarking Machine Learning Robustness against Adversarial Patches | 1-gen-2023 | Pintor, Maura; Angioni, Daniele; Sotgiu, Angelo; Demetrio, Luca; Demontis, Ambra; Biggio, Battista; Roli, Fabio | PATTERN RECOGNITION | - |
| Robust Machine Learning for Malware Detection over Time | 1-gen-2022 | Angioni, Daniele; Demetrio, Luca; Pintor, Maura; Biggio, Battista | - | - |
| Are spoofs from latent fingerprints a real threat for the best state-of-art liveness detectors? | 1-gen-2021 | Casula, R.; Orru', G.; Angioni, D.; Feng, X.; Marcialis, G. L.; Roli, F. | - | Institute of Electrical and Electronics Engineers |