We describe a test carried out by using a two-Thickness interferometer to investigate the effect of the surface stress on the measurement of the silicon lattice constant.

A two thickness interferometer for lattice strain investigations

MELIS, CLAUDIO;
2016

Abstract

We describe a test carried out by using a two-Thickness interferometer to investigate the effect of the surface stress on the measurement of the silicon lattice constant.
978-1-4673-9134-4
Avogadro constant; Optical interferometry; Precision measurements; Silicon lattice parameter; Surface stress; X-ray interferometry; Electrical and electronic engineering; Instrumentation
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11584/196231
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