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Mostrati risultati da 61 a 80 di 85
Titolo Data di pubblicazione Autore(i) Rivista Editore
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1-gen-2009 Mura, Giovanna; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 1-gen-2008 Mura, Giovanna; L., Trevisanello; Vanzi, Massimo; G., Meneghesso; E., Zanoni - -
Accelerated Life Test of High Brightness Light Emitting Diodes 1-gen-2008 L., Trevisanello; M., Meneghini; Mura, Giovanna; Vanzi, Massimo; M., Pavesi; G., Meneghesso; E., Zanoni IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY -
Sulfur-contamination of High Power White LEDs 1-gen-2008 Mura, Giovanna; Cassanelli, G; Fantini, F; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Failure Analysis of High Power White LEDs 1-gen-2008 G., Cassanelli; F., Fantini; Mura, Giovanna - -
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 1-gen-2007 Mura, Giovanna; Vanzi, Massimo IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY -
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 1-gen-2007 L. R., Trevisanello; M., Meneghini; Mura, Giovanna; C., Sanna; S., Buso; G., Spiazzi; Vanzi, Massimo; G., Meneghesso; E., Zanoni - -
High temperature electro-optical degradation of InGaN/GaN HBLEDs 1-gen-2007 M., Meneghini; L., Trevisanello; C., Sanna; Mura, Giovanna; G., Meneghesso; Vanzi, Massimo; Zanoni, E. MICROELECTRONICS RELIABILITY -
Brightness InGaN LEDs degradation at high injection current bias 1-gen-2006 Levada, S; Meneghini, M; Zanoni, E; Buso, S; Spiazzi, G; Meneghesso, G; Podda, S; Mura, Giovanna; Vanzi, Massimo - -
Failure Analysis-assisted FMEA 1-gen-2006 Cassanelli, G; Fantini, F; Mura, Giovanna; Vanzi, Massimo; Plano, B. MICROELECTRONICS RELIABILITY -
High Brightness InGaN LEDs degradation at high injection current bias 1-gen-2006 S., Levada; M., Meneghini; E., Zanoni; S., Buso; G., Spiazzi; Meneghesso, G; Mura, Giovanna; Podda, Simona; Vanzi, Massimo - -
The rules of the Rue Morgue: a decade later 1-gen-2006 Mura, Giovanna; Vanzi, Massimo; Cassanelli, G; Fantini, F. - -
Failure Analysis And Field Failures: A Real Shortcut To Reliability Improvements 1-gen-2006 Mura, Giovanna; G., Cassanelli - -
Reliability predictions in electronic industrial applications 1-gen-2005 Cassanelli, G; Mura, Giovanna; Cesaretti, F; Vanzi, Massimo; Fantini, F. MICROELECTRONICS RELIABILITY -
Failure analysis of RFIC Amplifiers 1-gen-2004 Vanzi, Massimo; Micheletti, G.; Mura, Giovanna MICROELECTRONICS RELIABILITY -
Analysis of RFIC Amplifiers 1-gen-2004 Mura, Giovanna; Vanzi, Massimo; G., Micheletti MICROELECTRONICS RELIABILITY -
Reliability of visible GaN LEDs in plastic package 1-gen-2003 G., Meneghesso; S., Levada; E., Zanoni; G., Scamarcio; Mura, Giovanna; Podda, Simona; Vanzi, Massimo; S., Du; I., Eliashevich MICROELECTRONICS RELIABILITY -
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 1-gen-2003 Mura, Giovanna; Vanzi, Massimo; Ciappa, M; Stangoni, M; Fichtner, W. MICROELECTRONICS RELIABILITY -
Failure modes and mechanisms of DC-aged GaN LEDs 1-gen-2002 Meneghesso, G; Levada, S; Zanoni, E; Podda, Simona; Mura, Giovanna; Vanzi, Massimo; Cavallini, A; Castaldini, A; Du, S; Eliashevich, I. - -
Backside Failure Analysis of GaAs ICs after EDS tests 1-gen-2002 Meneghesso, G; Cocco, A; Mura, Giovanna; Podda, Simona; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Mostrati risultati da 61 a 80 di 85
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