Sfoglia per Autore
Early stages of the mechanical alloying of TiC-TiN powder mixtures
2013-01-01 Mura, Giovanna; Musu, E; Delogu, Francesco
Faulty failure analyses
2013-01-01 Mura, Giovanna; Vanzi, Massimo
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi
2013-01-01 Musu, E.; Mura, Giovanna; Ligios, G.; Delogu, Francesco
“Hot-plugging” of led modules: electrical characterization and device degradation
2013-01-01 Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E.
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence
2013-01-01 M., Meneghini; S., Carraro; G., Meneghesso; N., Trivellin; Mura, Giovanna; F., Rossi; G., Salviati; K., Holc; T., Weig; L., Schade; M. A., Karunakaran; J., Wagner; U. T., Schwarz; AND E., Zanoni
The role of the optical trans-characteristics in laser diode analysis
2013-01-01 Mura, Giovanna; Vanzi, Massimo; Marcello, G.; Cao, R.
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells
2013-01-01 Compagnin, A; Meneghini, M; Barbato, M; Giliberto, V; Cester, A; Vanzi, Massimo; Mura, Giovanna; Zanoni, E; Meneghesso, G.
Optical losses in single-mode laser diodes
2013-01-01 Vanzi, Massimo; Mura, Giovanna; Marongiu, M.; Tomasi, T.
External cavity ITLA degradation
2012-01-01 Mura, Giovanna; Vanzi, Massimo; Martines, Giovanni; T., Tomasi; R., Cao; M., Marongiu
Phosphors for LED-based light sources: Thermal properties and reliability issues
2012-01-01 Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E.
MIM Capacitor_related early-stage field failures
2012-01-01 Lu, J; Cao, B; Wu, W; Dai, Y; Huang, C; Mura, Giovanna
Chip and package-related degradation of high power white LEDs
2012-01-01 Meneghini, M; Dal Lago, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Menegnesso, G; Zanoni, E.
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps
2012-01-01 M., Meneghini; M., Bertin; G., dal Santo; A., Stocco; A., Chini; D., Marcon; P. E., Malinowski; Mura, Giovanna; E., Musu; Vanzi, Massimo; G., Meneghesso; E., Zanoni
DC parameters for laser diodes from experimental curves
2011-01-01 Vanzi, Massimo; Mura, Giovanna; Martines, Giovanni
Degradation mechanisms of white LEDs for lighting applications
2010-01-01 M., Meneghini; M., DAL LAGO; L., Rodighiero; Mura, Giovanna; Vanzi, Massimo; G., Meneghesso
Faulty Failure Analyses
2010-01-01 Mura, Giovanna; Vanzi, Massimo
A review on the physical mechanisms that limit the reliability of GaN-based LEDs
2010-01-01 Matteo, Meneghini; Augusto, Tazzoli; Gaudenzio, Meneghesso; Mura, Giovanna; Enrico, Zanoni
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis
2010-01-01 Mura, Giovanna; Vanzi, Massimo
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs
2009-01-01 Meneghesso, G; Meneghini, M; Trivellin, N; Rodighiero, L; Mura, Giovanna; Vanzi, Massimo; Zanoni, E.
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices
2009-01-01 Mura, Giovanna; Vanzi, Massimo
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Early stages of the mechanical alloying of TiC-TiN powder mixtures | 1-gen-2013 | Mura, Giovanna; Musu, E; Delogu, Francesco | MATERIALS CHEMISTRY AND PHYSICS | - |
| Faulty failure analyses | 1-gen-2013 | Mura, Giovanna; Vanzi, Massimo | - | IEEE |
| Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi | 1-gen-2013 | Musu, E.; Mura, Giovanna; Ligios, G.; Delogu, Francesco | JOURNAL OF ALLOYS AND COMPOUNDS | - |
| “Hot-plugging” of led modules: electrical characterization and device degradation | 1-gen-2013 | Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E. | MICROELECTRONICS RELIABILITY | - |
| Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence | 1-gen-2013 | M., Meneghini; S., Carraro; G., Meneghesso; N., Trivellin; Mura, Giovanna; F., Rossi; G., Salviati; K., Holc; T., Weig; L., Schade; M. A., Karunakaran; J., Wagner; U. T., Schwarz; AND E., Zanoni | APPLIED PHYSICS LETTERS | - |
| The role of the optical trans-characteristics in laser diode analysis | 1-gen-2013 | Mura, Giovanna; Vanzi, Massimo; Marcello, G.; Cao, R. | MICROELECTRONICS RELIABILITY | - |
| Thermal and electrical investigation of the reverse bias degradation of silicon solar cells | 1-gen-2013 | Compagnin, A; Meneghini, M; Barbato, M; Giliberto, V; Cester, A; Vanzi, Massimo; Mura, Giovanna; Zanoni, E; Meneghesso, G. | MICROELECTRONICS RELIABILITY | - |
| Optical losses in single-mode laser diodes | 1-gen-2013 | Vanzi, Massimo; Mura, Giovanna; Marongiu, M.; Tomasi, T. | MICROELECTRONICS RELIABILITY | - |
| External cavity ITLA degradation | 1-gen-2012 | Mura, Giovanna; Vanzi, Massimo; Martines, Giovanni; T., Tomasi; R., Cao; M., Marongiu | - | - |
| Phosphors for LED-based light sources: Thermal properties and reliability issues | 1-gen-2012 | Dal Lago, M; Meneghini, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Meneghesso, G; Zanoni, E. | MICROELECTRONICS RELIABILITY | - |
| MIM Capacitor_related early-stage field failures | 1-gen-2012 | Lu, J; Cao, B; Wu, W; Dai, Y; Huang, C; Mura, Giovanna | MICROELECTRONICS RELIABILITY | - |
| Chip and package-related degradation of high power white LEDs | 1-gen-2012 | Meneghini, M; Dal Lago, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Menegnesso, G; Zanoni, E. | MICROELECTRONICS RELIABILITY | - |
| A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps | 1-gen-2012 | M., Meneghini; M., Bertin; G., dal Santo; A., Stocco; A., Chini; D., Marcon; P. E., Malinowski; Mura, Giovanna; E., Musu; Vanzi, Massimo; G., Meneghesso; E., Zanoni | - | - |
| DC parameters for laser diodes from experimental curves | 1-gen-2011 | Vanzi, Massimo; Mura, Giovanna; Martines, Giovanni | MICROELECTRONICS RELIABILITY | Elsevier |
| Degradation mechanisms of white LEDs for lighting applications | 1-gen-2010 | M., Meneghini; M., DAL LAGO; L., Rodighiero; Mura, Giovanna; Vanzi, Massimo; G., Meneghesso | - | - |
| Faulty Failure Analyses | 1-gen-2010 | Mura, Giovanna; Vanzi, Massimo | - | - |
| A review on the physical mechanisms that limit the reliability of GaN-based LEDs | 1-gen-2010 | Matteo, Meneghini; Augusto, Tazzoli; Gaudenzio, Meneghesso; Mura, Giovanna; Enrico, Zanoni | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
| The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis | 1-gen-2010 | Mura, Giovanna; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | - |
| Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs | 1-gen-2009 | Meneghesso, G; Meneghini, M; Trivellin, N; Rodighiero, L; Mura, Giovanna; Vanzi, Massimo; Zanoni, E. | - | - |
| Lot reliability issues in commercial off the shelf (COTS) microelectronic devices | 1-gen-2009 | Mura, Giovanna; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | - |
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