MARCELLO, GIULIA
MARCELLO, GIULIA
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Laser Diode DC Measurement Protocols
2021-01-01 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G.
LASER DIODES AND THEIR RELIABILITY. PHYSICAL MODELS AND EXPERIMENTAL VALIDATION.
2017-04-11
ESD tests on 850 nm GaAs-based VCSELs
2016-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K.
Side-Mode Excitation in Single-Mode Laser Diodes
2016-01-01 Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna
Clamp voltage and ideality factor in laser diodes
2015-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni
Proton irradiation effects on commercial laser diodes
2015-01-01 Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Laser Diode DC Measurement Protocols | 1-gen-2021 | Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. | - | Elsevier |
| LASER DIODES AND THEIR RELIABILITY. PHYSICAL MODELS AND EXPERIMENTAL VALIDATION. | 11-apr-2017 | - | - | Università degli Studi di Cagliari |
| ESD tests on 850 nm GaAs-based VCSELs | 1-gen-2016 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K. | MICROELECTRONICS RELIABILITY | - |
| Side-Mode Excitation in Single-Mode Laser Diodes | 1-gen-2016 | Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - |
| Clamp voltage and ideality factor in laser diodes | 1-gen-2015 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni | MICROELECTRONICS RELIABILITY | - |
| Proton irradiation effects on commercial laser diodes | 1-gen-2015 | Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro | - | Institute of Electrical and Electronics Engineers Inc. |