Aim of this paper is both the description and the characterisation of a third generation X-ray microtomography. The setuo has been completely made in our laboratory for the non destructive analysis of composite materials. The characterisation tests, which evidence limits and possibilities of the system are discussed.
Caratterizzazione di un tomografo di terza generazione
BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO
1997-01-01
Abstract
Aim of this paper is both the description and the characterisation of a third generation X-ray microtomography. The setuo has been completely made in our laboratory for the non destructive analysis of composite materials. The characterisation tests, which evidence limits and possibilities of the system are discussed.
File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
Aias97-1.pdf
accesso aperto
Descrizione: Articolo principale
Tipologia:
versione editoriale (VoR)
Dimensione
483.98 kB
Formato
Adobe PDF
|
483.98 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
