Aim of this paper is both the description and the characterisation of a third generation X-ray microtomography. The setuo has been completely made in our laboratory for the non destructive analysis of composite materials. The characterisation tests, which evidence limits and possibilities of the system are discussed.

Caratterizzazione di un tomografo di terza generazione

BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO
1997-01-01

Abstract

Aim of this paper is both the description and the characterisation of a third generation X-ray microtomography. The setuo has been completely made in our laboratory for the non destructive analysis of composite materials. The characterisation tests, which evidence limits and possibilities of the system are discussed.
1997
X-ray microtomography, Non-destructive analysis; Composite materials.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11584/10089
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