Here a first X-ray microtomograph for analysing defects in composite materials is described and characterised. After a brief presentation of the system, the characterisation tests conducted to assess its efficiency are discussed.

Characterisation of an X-Ray System with GaAs Detector for Composite Material Analysis

BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO;RANDACCIO, PAOLO
1998-01-01

Abstract

Here a first X-ray microtomograph for analysing defects in composite materials is described and characterised. After a brief presentation of the system, the characterisation tests conducted to assess its efficiency are discussed.
1998
1013-9826
Microtomography, Defect Analysis.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11584/5082
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