Here a first X-ray microtomograph for analysing defects in composite materials is described and characterised. After a brief presentation of the system, the characterisation tests conducted to assess its efficiency are discussed.
Characterisation of an X-Ray System with GaAs Detector for Composite Material Analysis
BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO;RANDACCIO, PAOLO
1998-01-01
Abstract
Here a first X-ray microtomograph for analysing defects in composite materials is described and characterised. After a brief presentation of the system, the characterisation tests conducted to assess its efficiency are discussed.
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