Here a first X-ray microtomograph for analysing defects in composite materials is described and characterised. After a brief presentation of the system, the characterisation tests conducted to assess its efficiency are discussed.
Characterisation of an X-Ray System with GaAs Detector for Composite Material Analysis
BERTOLINO, FILIPPO;GATTO, GIANLUCA;GINESU, FRANCESCO;RANDACCIO, PAOLO
1998-01-01
Abstract
Here a first X-ray microtomograph for analysing defects in composite materials is described and characterised. After a brief presentation of the system, the characterisation tests conducted to assess its efficiency are discussed.
File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
KEM1998-2.pdf
Solo gestori archivio
Descrizione: Articolo principale
Tipologia:
versione editoriale (VoR)
Dimensione
316.53 kB
Formato
Adobe PDF
|
316.53 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I metadati presenti in IRIS UNICA sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono protetti da diritto d'autore, salvo diversa indicazione.
