A method for the determination of the eigenfrequencies of certain nanostructures, is presented. The method is based on measuring eigenfrequencies of an extended system consisting of a highly oriented array of identical nanotubes or nanocrystals located on a substrate. Zinc oxide microcrystals and nanocrystals were used for the calculations as they have excellent optical properties and mechanical properties. The calculation results show that the extended-system spectrum can be approximately represented as a combination of substrate eigenfrequencies and frequencies generated by a unique nanocrystal.
On the determination of eigenfrequencies for nanometer-size objects
Eremeyev V. A.
;
2006-01-01
Abstract
A method for the determination of the eigenfrequencies of certain nanostructures, is presented. The method is based on measuring eigenfrequencies of an extended system consisting of a highly oriented array of identical nanotubes or nanocrystals located on a substrate. Zinc oxide microcrystals and nanocrystals were used for the calculations as they have excellent optical properties and mechanical properties. The calculation results show that the extended-system spectrum can be approximately represented as a combination of substrate eigenfrequencies and frequencies generated by a unique nanocrystal.
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