A fundamental aspect of a system’s performance over time is the number of faults it generates. The relationship between the software engineering concept of ‘coupling’ (i.e., the degree of inter-connectedness of a system’s components) and faults is still a research question attracting attention and a relationship with strong implications for performance; excessive coupling is generally acknowledged to contribute to fault-proneness. In this paper, we explore the relationship between faults and coupling. Two releases from each of three open-source Eclipse projects (six releases in total) were used as an empirical basis and coupling and fault data extracted from those systems. A contrasting coupling profile between fault-free and fault-prone classes was observed and this result was statistically supported. Object-oriented (OO) classes with low values of fan-in (incoming coupling) and fan-out (outgoing coupling) appeared to support fault-free classes, while classes with high fan-out supported relatively fault-prone classes. We also considered size as an influence on fault-proneness. The study thus emphasizes the importance of minimizing coupling where possible (and particularly that of fan-out); failing to control coupling may store up problems for later in a system’s life; equally, controlling class size should be a concomitant goal.

System Performance Analyses through Object‐oriented Fault and Coupling Prisms

TONELLI, ROBERTO;MARCHESI, MICHELE;
2014-01-01

Abstract

A fundamental aspect of a system’s performance over time is the number of faults it generates. The relationship between the software engineering concept of ‘coupling’ (i.e., the degree of inter-connectedness of a system’s components) and faults is still a research question attracting attention and a relationship with strong implications for performance; excessive coupling is generally acknowledged to contribute to fault-proneness. In this paper, we explore the relationship between faults and coupling. Two releases from each of three open-source Eclipse projects (six releases in total) were used as an empirical basis and coupling and fault data extracted from those systems. A contrasting coupling profile between fault-free and fault-prone classes was observed and this result was statistically supported. Object-oriented (OO) classes with low values of fan-in (incoming coupling) and fan-out (outgoing coupling) appeared to support fault-free classes, while classes with high fan-out supported relatively fault-prone classes. We also considered size as an influence on fault-proneness. The study thus emphasizes the importance of minimizing coupling where possible (and particularly that of fan-out); failing to control coupling may store up problems for later in a system’s life; equally, controlling class size should be a concomitant goal.
2014
978-1-4503-2733-6
Coupling; Fan-in; Fan-out
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11584/54560
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