Electronics authentication using electrical measurements and machine learning

The problem of counterfeiting in electronics is not recent but still critical today. Identifying counterfeit devices can be a complex task since not all suspicious items are necessarily inauthentic. The paper deals with the non-destructive detection of counterfeiting in electronics by using only electrical measurements. This approach paves the way for machine learning classification-assisted counterfeit detection through electrical measurements. Physical de-processing provides the final confirmation.