MURA, GIOVANNA

MURA, GIOVANNA  

DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA  

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Risultati 1 - 20 di 85 (tempo di esecuzione: 0.024 secondi).
Titolo Data di pubblicazione Autore(i) Rivista Editore
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films 1-gen-2023 Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M. IEEE ACCESS -
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant 1-gen-2023 Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M MICROELECTRONICS RELIABILITY -
Electronic Components Authentication via Physical Analysis 1-gen-2023 Mura, G.; Carta, S.; Ricci, P. C.; Martines, G. - -
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 1-gen-2023 Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M. IEEE JOURNAL OF PHOTOVOLTAICS -
Reliability risks from counterfeit electronics 1-gen-2022 Mura, Giovanna; Martines, Giovanni - IEEE
Analysis of Fake Amplifiers 1-gen-2021 Mura, G.; Murru, R.; Martines, G. - IEEE
CdTe solar cells: technology, operation and reliability 1-gen-2021 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. JOURNAL OF PHYSICS D. APPLIED PHYSICS -
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH 1-gen-2021 Mura, Giovanna; Fois, Gabriele - AIT Series Trends in earth observation Volume 2
Laser Diode DC Measurement Protocols 1-gen-2021 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. - Elsevier
Laser Diode Reliability 1-gen-2021 Mura, Giovanna - ISTE Press Ltd. - Elsevier
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms 1-gen-2021 Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter - -
Analysis of counterfeit electronics 1-gen-2020 Mura, G.; Murru, R.; Martines, G. MICROELECTRONICS RELIABILITY -
Peculiar failure mechanisms in GaN power transistors 1-gen-2020 Vanzi, M.; Mura, G. MICROELECTRONICS RELIABILITY -
New paradigm for EBIC amplifier on FIB X-section 1-gen-2019 SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO - -
Optical gain in laser diodes with null reflectivity 1-gen-2019 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. MICROELECTRONICS RELIABILITY -
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1-gen-2018 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno JOURNAL OF ELECTRONIC MATERIALS -
From automotive to space qualification: Overlaps, gaps and possible convergence 1-gen-2018 Vaion, R. Enrici; Medda, M.; Mancaleoni, A.; Mura, G. - IEEE (Institute of Electrical and Electronics Engineers)
Further improvements of an extended Hakki-Paoli method 1-gen-2018 Vanzi, M.; Mura, G.; Martines, G. MICROELECTRONICS RELIABILITY -
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1-gen-2018 Vanzi, M.; Mura, G.; SANNA VALLE, Valerio - SPIE
Reliability concerns from the gray market 1-gen-2018 Mura, Giovanna MICROELECTRONICS RELIABILITY -