MURA, GIOVANNA
MURA, GIOVANNA
DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA
Counterfeit electronics in industry 4.0: risks and detection
2025-01-01 Mura, Giovanna; Carta, Simone; Montisci, Giorgio; Urru, Alessandro; Musa, Michela; Andronico, Pietro
Counterfeit electronics: A threat for new space economy
2025-01-01 Mura, Giovanna
Defects in InGaN QW structures: microscopic properties and modeling
2025-01-01 Meneghini, M.; Nicoletto, M.; Piva, F.; Roccato, N.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Rossi, F.; Mura, G.; Gasparotto, A.; Becht, C.; Kusch, G.; Ji, Y.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Trivellin, N.; Meneghesso, G.; Zanoni, E.; Oliver, R.; Grandjean, N.; Schwarz, U. T.
Detecting counterfeit electronic circuits: the effect of PCB thickness and dielectric permittivity on the electromagnetic fingerprint
2025-01-01 Mura, G.; Muntoni, G.; Casula, G. A.; Mattana, E.; Ortu, P.; Pilia, S.; Andronico, P.; Montisci, G.
Electronics authentication using electrical measurements and machine learning
2025-01-01 Carta, S.; Urru, A.; Musa, M.; Andronico, P.; Mura, G.
Enhancing Thermal and Radiation Hardness of All-Organic Printed Transistors by a Flexible and Transparent Encapsulation Layer for Low Earth Orbit Applications
2025-01-01 Casula, G.; Ricci, P. C.; Cosseddu, P.; Mura, G.; Lai, S.
Catastrophic degradation of LEDs: failure analysis and perspective
2024-01-01 Trivellin, N.; Caria, A.; Huang, A.; Piva, F.; Buffolo, M.; De Santi, C.; Magnien, J.; Rosc, J.; Mura, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Counterfeit Electronics Detection Via Physical Analysis
2024-01-01 Mura, Giovanna
Evaluation of flexible organic transistor stability in harsh conditions
2024-01-01 Casula, G.; Ricci, P. C.; Mura, G.; Lai, S.
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs
2024-01-01 Nicoletto, Marco; Caria, Alessandro; Rampazzo, Fabiana; De Santi, Carlo; Buffolo, Matteo; Mura, Giovanna; Rossi, Francesca; Huang, Xuanqi; Fu, Houqiang; Chen, Hong; Zhao, Yuji; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress
2024-01-01 Caria, Alessandro; Fraccaroli, Riccardo; Pierobon, Giulia; Castellaro, Thomas; Mura, Giovanna; Ricci, Pier Carlo; De Santi, Carlo; Buffolo, Matteo; Trivellin, Nicola; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo
The Threat of Counterfeit Electronics to the Development of CubeSats
2024-01-01 Mura, Giovanna
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films
2023-01-01 Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.
A transparent curved microstrip patch antenna
2023-01-01 Muntoni, G.; Mura, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.; Montisci, G.
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant
2023-01-01 Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M
Electronic components authentication via physical analysis
2023-01-01 Mura, G.; Carta, S.; Ricci, P. C.; Martines, G.
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells
2023-01-01 Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Reliability risks from counterfeit electronics
2022-01-01 Mura, Giovanna; Martines, Giovanni
Analysis of Fake Amplifiers
2021-01-01 Mura, G.; Murru, R.; Martines, G.
CdTe solar cells: technology, operation and reliability
2021-01-01 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G.
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Counterfeit electronics in industry 4.0: risks and detection | 1-gen-2025 | Mura, Giovanna; Carta, Simone; Montisci, Giorgio; Urru, Alessandro; Musa, Michela; Andronico, Pietro | - | RESEARCH PUBLISHING |
| Counterfeit electronics: A threat for new space economy | 1-gen-2025 | Mura, Giovanna | - | - |
| Defects in InGaN QW structures: microscopic properties and modeling | 1-gen-2025 | Meneghini, M.; Nicoletto, M.; Piva, F.; Roccato, N.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Rossi, F.; Mura, G.; Gasparotto, A.; Becht, C.; Kusch, G.; Ji, Y.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Trivellin, N.; Meneghesso, G.; Zanoni, E.; Oliver, R.; Grandjean, N.; Schwarz, U. T. | - | SPIE |
| Detecting counterfeit electronic circuits: the effect of PCB thickness and dielectric permittivity on the electromagnetic fingerprint | 1-gen-2025 | Mura, G.; Muntoni, G.; Casula, G. A.; Mattana, E.; Ortu, P.; Pilia, S.; Andronico, P.; Montisci, G. | IEEE SENSORS JOURNAL | - |
| Electronics authentication using electrical measurements and machine learning | 1-gen-2025 | Carta, S.; Urru, A.; Musa, M.; Andronico, P.; Mura, G. | MICROELECTRONICS RELIABILITY | - |
| Enhancing Thermal and Radiation Hardness of All-Organic Printed Transistors by a Flexible and Transparent Encapsulation Layer for Low Earth Orbit Applications | 1-gen-2025 | Casula, G.; Ricci, P. C.; Cosseddu, P.; Mura, G.; Lai, S. | PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE | - |
| Catastrophic degradation of LEDs: failure analysis and perspective | 1-gen-2024 | Trivellin, N.; Caria, A.; Huang, A.; Piva, F.; Buffolo, M.; De Santi, C.; Magnien, J.; Rosc, J.; Mura, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M. | - | - |
| Counterfeit Electronics Detection Via Physical Analysis | 1-gen-2024 | Mura, Giovanna | - | - |
| Evaluation of flexible organic transistor stability in harsh conditions | 1-gen-2024 | Casula, G.; Ricci, P. C.; Mura, G.; Lai, S. | - | IEEE |
| Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs | 1-gen-2024 | Nicoletto, Marco; Caria, Alessandro; Rampazzo, Fabiana; De Santi, Carlo; Buffolo, Matteo; Mura, Giovanna; Rossi, Francesca; Huang, Xuanqi; Fu, Houqiang; Chen, Hong; Zhao, Yuji; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo | - | SPIE-INT SOC OPTICAL ENGINEERING |
| Robustness and reliability of high-power white LEDs under high-temperature, high-current stress | 1-gen-2024 | Caria, Alessandro; Fraccaroli, Riccardo; Pierobon, Giulia; Castellaro, Thomas; Mura, Giovanna; Ricci, Pier Carlo; De Santi, Carlo; Buffolo, Matteo; Trivellin, Nicola; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo | - | SPIE |
| The Threat of Counterfeit Electronics to the Development of CubeSats | 1-gen-2024 | Mura, Giovanna | - | IEEE |
| A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films | 1-gen-2023 | Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M. | IEEE ACCESS | - |
| A transparent curved microstrip patch antenna | 1-gen-2023 | Muntoni, G.; Mura, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.; Montisci, G. | - | Institute of Electrical and Electronics Engineers |
| Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant | 1-gen-2023 | Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M | MICROELECTRONICS RELIABILITY | - |
| Electronic components authentication via physical analysis | 1-gen-2023 | Mura, G.; Carta, S.; Ricci, P. C.; Martines, G. | - | IEEE (EDS) |
| Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells | 1-gen-2023 | Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M. | IEEE JOURNAL OF PHOTOVOLTAICS | - |
| Reliability risks from counterfeit electronics | 1-gen-2022 | Mura, Giovanna; Martines, Giovanni | - | IEEE |
| Analysis of Fake Amplifiers | 1-gen-2021 | Mura, G.; Murru, R.; Martines, G. | - | IEEE |
| CdTe solar cells: technology, operation and reliability | 1-gen-2021 | Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. | JOURNAL OF PHYSICS D. APPLIED PHYSICS | - |