MURA, GIOVANNA

MURA, GIOVANNA  

DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA  

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Risultati 1 - 20 di 91 (tempo di esecuzione: 0.027 secondi).
Titolo Data di pubblicazione Autore(i) Rivista Editore
Catastrophic degradation of LEDs: failure analysis and perspective 1-gen-2024 Trivellin, N.; Caria, A.; Huang, A.; Piva, F.; Buffolo, M.; De Santi, C.; Magnien, J.; Rosc, J.; Mura, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M. - -
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs 1-gen-2024 Nicoletto, Marco; Caria, Alessandro; Rampazzo, Fabiana; De Santi, Carlo; Buffolo, Matteo; Mura, Giovanna; Rossi, Francesca; Huang, Xuanqi; Fu, Houqiang; Chen, Hong; Zhao, Yuji; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo - SPIE-INT SOC OPTICAL ENGINEERING
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress 1-gen-2024 Caria, Alessandro; Fraccaroli, Riccardo; Pierobon, Giulia; Castellaro, Thomas; Mura, Giovanna; Ricci, Pier Carlo; De Santi, Carlo; Buffolo, Matteo; Trivellin, Nicola; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo - -
The Threat of Counterfeit Electronics to the Development of CubeSats 1-gen-2024 Mura, Giovanna - IEEE
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films 1-gen-2023 Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M. IEEE ACCESS -
A Transparent Curved Microstrip Patch Antenna 1-gen-2023 Muntoni, G.; Mura, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.; Montisci, G. - Institute of Electrical and Electronics Engineers
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant 1-gen-2023 Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M MICROELECTRONICS RELIABILITY -
Electronic Components Authentication via Physical Analysis 1-gen-2023 Mura, G.; Carta, S.; Ricci, P. C.; Martines, G. - -
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 1-gen-2023 Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M. IEEE JOURNAL OF PHOTOVOLTAICS -
Reliability risks from counterfeit electronics 1-gen-2022 Mura, Giovanna; Martines, Giovanni - IEEE
Analysis of Fake Amplifiers 1-gen-2021 Mura, G.; Murru, R.; Martines, G. - IEEE
CdTe solar cells: technology, operation and reliability 1-gen-2021 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. JOURNAL OF PHYSICS D. APPLIED PHYSICS -
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH 1-gen-2021 Mura, Giovanna; Fois, Gabriele - AIT Series Trends in earth observation Volume 2
Laser Diode DC Measurement Protocols 1-gen-2021 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. - Elsevier
Laser Diode Reliability 1-gen-2021 Mura, Giovanna; Mitsuo, Fukuda - ISTE Press Ltd. - Elsevier
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms 1-gen-2021 Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter - -
Analysis of counterfeit electronics 1-gen-2020 Mura, G.; Murru, R.; Martines, G. MICROELECTRONICS RELIABILITY -
Peculiar failure mechanisms in GaN power transistors 1-gen-2020 Vanzi, M.; Mura, G. MICROELECTRONICS RELIABILITY -
New paradigm for EBIC amplifier on FIB X-section 1-gen-2019 SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO - -
Optical gain in laser diodes with null reflectivity 1-gen-2019 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. MICROELECTRONICS RELIABILITY -