MURA, GIOVANNA
MURA, GIOVANNA
DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA
Catastrophic degradation of LEDs: failure analysis and perspective
2024-01-01 Trivellin, N.; Caria, A.; Huang, A.; Piva, F.; Buffolo, M.; De Santi, C.; Magnien, J.; Rosc, J.; Mura, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs
2024-01-01 Nicoletto, Marco; Caria, Alessandro; Rampazzo, Fabiana; De Santi, Carlo; Buffolo, Matteo; Mura, Giovanna; Rossi, Francesca; Huang, Xuanqi; Fu, Houqiang; Chen, Hong; Zhao, Yuji; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress
2024-01-01 Caria, Alessandro; Fraccaroli, Riccardo; Pierobon, Giulia; Castellaro, Thomas; Mura, Giovanna; Ricci, Pier Carlo; De Santi, Carlo; Buffolo, Matteo; Trivellin, Nicola; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo
The Threat of Counterfeit Electronics to the Development of CubeSats
2024-01-01 Mura, Giovanna
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films
2023-01-01 Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.
A Transparent Curved Microstrip Patch Antenna
2023-01-01 Muntoni, G.; Mura, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.; Montisci, G.
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant
2023-01-01 Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M
Electronic Components Authentication via Physical Analysis
2023-01-01 Mura, G.; Carta, S.; Ricci, P. C.; Martines, G.
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells
2023-01-01 Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M.
Reliability risks from counterfeit electronics
2022-01-01 Mura, Giovanna; Martines, Giovanni
Analysis of Fake Amplifiers
2021-01-01 Mura, G.; Murru, R.; Martines, G.
CdTe solar cells: technology, operation and reliability
2021-01-01 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G.
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH
2021-01-01 Mura, Giovanna; Fois, Gabriele
Laser Diode DC Measurement Protocols
2021-01-01 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G.
Laser Diode Reliability
2021-01-01 Mura, Giovanna; Mitsuo, Fukuda
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms
2021-01-01 Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter
Analysis of counterfeit electronics
2020-01-01 Mura, G.; Murru, R.; Martines, G.
Peculiar failure mechanisms in GaN power transistors
2020-01-01 Vanzi, M.; Mura, G.
New paradigm for EBIC amplifier on FIB X-section
2019-01-01 SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO
Optical gain in laser diodes with null reflectivity
2019-01-01 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y.
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Catastrophic degradation of LEDs: failure analysis and perspective | 1-gen-2024 | Trivellin, N.; Caria, A.; Huang, A.; Piva, F.; Buffolo, M.; De Santi, C.; Magnien, J.; Rosc, J.; Mura, G.; Meneghesso, G.; Zanoni, E.; Meneghini, M. | - | - |
| Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs | 1-gen-2024 | Nicoletto, Marco; Caria, Alessandro; Rampazzo, Fabiana; De Santi, Carlo; Buffolo, Matteo; Mura, Giovanna; Rossi, Francesca; Huang, Xuanqi; Fu, Houqiang; Chen, Hong; Zhao, Yuji; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo | - | SPIE-INT SOC OPTICAL ENGINEERING |
| Robustness and reliability of high-power white LEDs under high-temperature, high-current stress | 1-gen-2024 | Caria, Alessandro; Fraccaroli, Riccardo; Pierobon, Giulia; Castellaro, Thomas; Mura, Giovanna; Ricci, Pier Carlo; De Santi, Carlo; Buffolo, Matteo; Trivellin, Nicola; Zanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo | - | - |
| The Threat of Counterfeit Electronics to the Development of CubeSats | 1-gen-2024 | Mura, Giovanna | - | IEEE |
| A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films | 1-gen-2023 | Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M. | IEEE ACCESS | - |
| A Transparent Curved Microstrip Patch Antenna | 1-gen-2023 | Muntoni, G.; Mura, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.; Montisci, G. | - | Institute of Electrical and Electronics Engineers |
| Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant | 1-gen-2023 | Caria, A; Fraccaroli, R; Pierobon, G; Castellaro, T; Mura, G; Ricci, Pc; De Santi, C; Buffolo, M; Trivellin, N; Zanoni, E; Meneghesso, G; Meneghini, M | MICROELECTRONICS RELIABILITY | - |
| Electronic Components Authentication via Physical Analysis | 1-gen-2023 | Mura, G.; Carta, S.; Ricci, P. C.; Martines, G. | - | - |
| Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells | 1-gen-2023 | Nicoletto, M.; Caria, A.; Rampazzo, F.; De Santi, C.; Buffolo, M.; Mura, G.; Rossi, F.; Huang, X.; Fu, H.; Chen, H.; Zhao, Y.; Meneghesso, G.; Zanoni, E.; Meneghini, M. | IEEE JOURNAL OF PHOTOVOLTAICS | - |
| Reliability risks from counterfeit electronics | 1-gen-2022 | Mura, Giovanna; Martines, Giovanni | - | IEEE |
| Analysis of Fake Amplifiers | 1-gen-2021 | Mura, G.; Murru, R.; Martines, G. | - | IEEE |
| CdTe solar cells: technology, operation and reliability | 1-gen-2021 | Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. | JOURNAL OF PHYSICS D. APPLIED PHYSICS | - |
| CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH | 1-gen-2021 | Mura, Giovanna; Fois, Gabriele | - | AIT Series Trends in earth observation Volume 2 |
| Laser Diode DC Measurement Protocols | 1-gen-2021 | Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. | - | Elsevier |
| Laser Diode Reliability | 1-gen-2021 | Mura, Giovanna; Mitsuo, Fukuda | - | ISTE Press Ltd. - Elsevier |
| Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms | 1-gen-2021 | Zagaglia, Luca; Argiolas, Simone; Iadanza, Simone; Mura, Giovanna; Floris, Francesco; O’Brien, Peter | - | - |
| Analysis of counterfeit electronics | 1-gen-2020 | Mura, G.; Murru, R.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
| Peculiar failure mechanisms in GaN power transistors | 1-gen-2020 | Vanzi, M.; Mura, G. | MICROELECTRONICS RELIABILITY | - |
| New paradigm for EBIC amplifier on FIB X-section | 1-gen-2019 | SANNA VALLE, Valerio; Perez, Guy; Bascoul, Guillaume; Chauvin, Helene; Viallet, Benoît; Mura, Giovanna; Apeddu, GIAN PAOLO | - | - |
| Optical gain in laser diodes with null reflectivity | 1-gen-2019 | Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. | MICROELECTRONICS RELIABILITY | - |