MURA, GIOVANNA
MURA, GIOVANNA
DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films
2023-01-01 Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M.
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps
2012-01-01 M., Meneghini; M., Bertin; G., dal Santo; A., Stocco; A., Chini; D., Marcon; P. E., Malinowski; Mura, Giovanna; E., Musu; Vanzi, Massimo; G., Meneghesso; E., Zanoni
A review on the physical mechanisms that limit the reliability of GaN-based LEDs
2010-01-01 Matteo, Meneghini; Augusto, Tazzoli; Gaudenzio, Meneghesso; Mura, Giovanna; Enrico, Zanoni
Accelerated Life Test of High Brightness Light Emitting Diodes
2008-01-01 L., Trevisanello; M., Meneghini; Mura, Giovanna; Vanzi, Massimo; M., Pavesi; G., Meneghesso; E., Zanoni
An automated lifetest equipment for optical emitters
2002-01-01 Giglio, M; Martines, Giovanni; Mura, Giovanna; Podda, Simona; Vanzi, Massimo
Analysis of counterfeit electronics
2020-01-01 Mura, G.; Murru, R.; Martines, G.
Analysis of Fake Amplifiers
2021-01-01 Mura, G.; Murru, R.; Martines, G.
Analysis of GaN based high-power diode lasers after singular degradation events
2017-01-01 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W.
Analysis of RFIC Amplifiers
2004-01-01 Mura, Giovanna; Vanzi, Massimo; G., Micheletti
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs
2009-01-01 Meneghesso, G; Meneghini, M; Trivellin, N; Rodighiero, L; Mura, Giovanna; Vanzi, Massimo; Zanoni, E.
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs
2017-01-01 Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO
Are Soft-Breakdown and Hard-Breakdown of thin gate oxides actually different failure mechanism
2000-01-01 J., Suñè; Mura, Giovanna; E., Miranda
Backside Failure Analysis of GaAs ICs after EDS tests
2002-01-01 Meneghesso, G; Cocco, A; Mura, Giovanna; Podda, Simona; Vanzi, Massimo
Brightness InGaN LEDs degradation at high injection current bias
2006-01-01 Levada, S; Meneghini, M; Zanoni, E; Buso, S; Spiazzi, G; Meneghesso, G; Podda, S; Mura, Giovanna; Vanzi, Massimo
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices
2018-01-01 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno
CdTe solar cells: technology, operation and reliability
2021-01-01 Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G.
Chip and package-related degradation of high power white LEDs
2012-01-01 Meneghini, M; Dal Lago, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Menegnesso, G; Zanoni, E.
Clamp voltage and ideality factor in laser diodes
2015-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers
2017-01-01 Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M.
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH
2021-01-01 Mura, Giovanna; Fois, Gabriele
Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
---|---|---|---|---|
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films | 1-gen-2023 | Montisci, G.; Mura, G.; Muntoni, G.; Casula, G. A.; Chietera, F. P.; Aburish-Hmidat, M. | IEEE ACCESS | - |
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps | 1-gen-2012 | M., Meneghini; M., Bertin; G., dal Santo; A., Stocco; A., Chini; D., Marcon; P. E., Malinowski; Mura, Giovanna; E., Musu; Vanzi, Massimo; G., Meneghesso; E., Zanoni | - | - |
A review on the physical mechanisms that limit the reliability of GaN-based LEDs | 1-gen-2010 | Matteo, Meneghini; Augusto, Tazzoli; Gaudenzio, Meneghesso; Mura, Giovanna; Enrico, Zanoni | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
Accelerated Life Test of High Brightness Light Emitting Diodes | 1-gen-2008 | L., Trevisanello; M., Meneghini; Mura, Giovanna; Vanzi, Massimo; M., Pavesi; G., Meneghesso; E., Zanoni | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - |
An automated lifetest equipment for optical emitters | 1-gen-2002 | Giglio, M; Martines, Giovanni; Mura, Giovanna; Podda, Simona; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | - |
Analysis of counterfeit electronics | 1-gen-2020 | Mura, G.; Murru, R.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
Analysis of Fake Amplifiers | 1-gen-2021 | Mura, G.; Murru, R.; Martines, G. | - | IEEE |
Analysis of GaN based high-power diode lasers after singular degradation events | 1-gen-2017 | Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. | PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS | - |
Analysis of RFIC Amplifiers | 1-gen-2004 | Mura, Giovanna; Vanzi, Massimo; G., Micheletti | MICROELECTRONICS RELIABILITY | - |
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs | 1-gen-2009 | Meneghesso, G; Meneghini, M; Trivellin, N; Rodighiero, L; Mura, Giovanna; Vanzi, Massimo; Zanoni, E. | - | - |
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs | 1-gen-2017 | Mura, G.; MIRANDA CASTELLANO, ENRIQUE ALBERTO | - | - |
Are Soft-Breakdown and Hard-Breakdown of thin gate oxides actually different failure mechanism | 1-gen-2000 | J., Suñè; Mura, Giovanna; E., Miranda | IEEE ELECTRON DEVICE LETTERS | - |
Backside Failure Analysis of GaAs ICs after EDS tests | 1-gen-2002 | Meneghesso, G; Cocco, A; Mura, Giovanna; Podda, Simona; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | - |
Brightness InGaN LEDs degradation at high injection current bias | 1-gen-2006 | Levada, S; Meneghini, M; Zanoni, E; Buso, S; Spiazzi, G; Meneghesso, G; Podda, S; Mura, Giovanna; Vanzi, Massimo | - | - |
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices | 1-gen-2018 | Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno | JOURNAL OF ELECTRONIC MATERIALS | - |
CdTe solar cells: technology, operation and reliability | 1-gen-2021 | Barbato, M.; Artegiani, E.; Bertoncello, M.; Meneghini, M.; Trivellin, N.; Mantoan, E.; Romeo, A.; Mura, G.; Ortolani, L.; Zanoni, E.; Meneghesso, G. | JOURNAL OF PHYSICS D. APPLIED PHYSICS | - |
Chip and package-related degradation of high power white LEDs | 1-gen-2012 | Meneghini, M; Dal Lago, M; Trivellin, N; Mura, Giovanna; Vanzi, Massimo; Menegnesso, G; Zanoni, E. | MICROELECTRONICS RELIABILITY | - |
Clamp voltage and ideality factor in laser diodes | 1-gen-2015 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni | MICROELECTRONICS RELIABILITY | - |
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers | 1-gen-2017 | Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. | - | IEEE (Institute of Electrical and Electronics Engineers) |
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH | 1-gen-2021 | Mura, Giovanna; Fois, Gabriele | - | AIT Series Trends in earth observation Volume 2 |