Comments on 'Simultaneous determination of transistors noise, gain and scattering parameters for amplifiers design through noise figure measurements only'[and reply]

Comments on 'Simultaneous determination of transistors noise, gain and scattering parameters for amplifiers design through noise figure measurements only'[and reply] / POSPIESZALSKI M.W; MARTINES G; SANNINO M. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - IM-35(1986), pp. 228-228.

Trovami (UniCASearch)


Titolo: Comments on 'Simultaneous determination of transistors noise, gain and scattering parameters for amplifiers design through noise figure measurements only'[and reply]
Autori: 
MARTINES, GIOVANNI
mostra contributor esterni 
Data di pubblicazione: 1986
Rivista: 
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT  
Citazione: Comments on 'Simultaneous determination of transistors noise, gain and scattering parameters for amplifiers design through noise figure measurements only'[and reply] / POSPIESZALSKI M.W; MARTINES G; SANNINO M. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - IM-35(1986), pp. 228-228.
Handle: http://hdl.handle.net/11584/5602
Tipologia:1.1 Articolo in rivista

File in questo prodotto:
Non ci sono file associati a questo prodotto.
Utilizza questo identificativo per citare o creare un link a questo documento:
http://hdl.handle.net/11584/5602
  • Citazioni
  • PubMed Central ND
  • Scopus ND
  • WOS ND

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
 
 
 
Powered by IRIS-about IRIS-Utilizzo dei cookie
Logo CINECA  Copyright © 2021