VANZI, MASSIMO

VANZI, MASSIMO  

DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA  

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Risultati 1 - 20 di 116 (tempo di esecuzione: 0.038 secondi).
Titolo Data di pubblicazione Autore(i) Rivista Editore
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM 1-gen-2010 S., Podda; R., Pintus; E., Musu; Vanzi, Massimo - Royal microscopy society
3D reconstruction of FIB microstructures from BSE images 1-gen-2010 Podda, Simona; R., Pintus; E., Musu; Vanzi, Massimo - -
3D Sculptures from SEM images 1-gen-2008 Pintus, R; Podda, Simona; Vanzi, Massimo - -
3D statistics from TEM observations of TPFG EEPROM memory cells 1-gen-1990 P., Mengucci; D., Rinaldi; S., Santini; Vanzi, Massimo MICROSCOPY MICROANALYSIS MICROSTRUCTURES -
A different approach to the analysis of data in life-tests of laser diodes 1-gen-1998 Bonfiglio, Annalisa; CASU M., B; Vanzi, Massimo; Magistrali, F; Salmini, G. MICROELECTRONICS RELIABILITY -
A Failure Analysis Oriented E- Beam Test System 1-gen-1990 A., Haardt; C., Morandi; Vanzi, Massimo MICROELECTRONIC ENGINEERING -
A model for the DC characteristics of a laser diode 1-gen-2008 Vanzi, Massimo - -
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1-gen-2012 M., Meneghini; M., Bertin; G., dal Santo; A., Stocco; A., Chini; D., Marcon; P. E., Malinowski; Mura, Giovanna; E., Musu; Vanzi, Massimo; G., Meneghesso; E., Zanoni - -
A simpler method for life-testing laser diodes 1-gen-1999 Vanzi, Massimo; Martines, Giovanni; Bonfiglio, Annalisa; Licheri, M; Darco, R; Salmini, G; DE PALO, R. MICROELECTRONICS RELIABILITY Elsevier science
A specimen-current branching approach for FA of long Electromigration test lines 1-gen-2002 C., Caprile; I., DE MUNARI; M., Impronta; Podda, Simona; A., Scorzoni; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
Accelerated Life Test of High Brightness Light Emitting Diodes 1-gen-2008 L., Trevisanello; M., Meneghini; Mura, Giovanna; Vanzi, Massimo; M., Pavesi; G., Meneghesso; E., Zanoni IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY -
An automated lifetest equipment for optical emitters 1-gen-2002 Giglio, M; Martines, Giovanni; Mura, Giovanna; Podda, Simona; Vanzi, Massimo MICROELECTRONICS RELIABILITY -
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy 1-gen-2006 Pintus, R; Podda, Simona; Vanzi, Massimo - -
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy 1-gen-2008 Pintus, R; Podda, Simona; Vanzi, Massimo IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT -
An Effective Method for Gold Dissolution in Microelectronic Devices Failure Analysis 1-gen-2004 Artizzu, Flavia; Cabras, Mc; Deplano, Paola; Mercuri, MARIA LAURA; Morelli, A; Serpe, Angela; Trogu, Ef; Vanzi, Massimo - -
Analysis of GaN based high-power diode lasers after singular degradation events 1-gen-2017 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS -
Analysis of RFIC Amplifiers 1-gen-2004 Mura, Giovanna; Vanzi, Massimo; G., Micheletti MICROELECTRONICS RELIABILITY -
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1-gen-2009 Meneghesso, G; Meneghini, M; Trivellin, N; Rodighiero, L; Mura, Giovanna; Vanzi, Massimo; Zanoni, E. - -
Anodic Gold Corrosion in Optical Modulators” proc. SPIE 2001, p.4277-14 1-gen-2001 Furcas, P.; DE PALO, R.; Patella, M. E.; Salmini, G; Vanzi, Massimo - -
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1-gen-2011 Vanzi, Massimo; Podda, Simona - Elisabetta Falcieri