VANZI, MASSIMO

VANZI, MASSIMO  

DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA  

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Risultati 1 - 20 di 117 (tempo di esecuzione: 0.034 secondi).
Titolo Data di pubblicazione Autore(i) Rivista Editore
Identifying the lights position in photometric stereo under unknown lighting 1-gen-2021 Concas, A.; Dessi, R.; Fenu, C.; Rodriguez, G.; Vanzi, M. - Institute of Electrical and Electronics Engineers Inc.
Laser Diode DC Measurement Protocols 1-gen-2021 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. - Elsevier
Peculiar failure mechanisms in GaN power transistors 1-gen-2020 Vanzi, M.; Mura, G. MICROELECTRONICS RELIABILITY -
Optical gain in laser diodes with null reflectivity 1-gen-2019 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. MICROELECTRONICS RELIABILITY -
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1-gen-2018 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno JOURNAL OF ELECTRONIC MATERIALS -
Further improvements of an extended Hakki-Paoli method 1-gen-2018 Vanzi, M.; Mura, G.; Martines, G. MICROELECTRONICS RELIABILITY -
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1-gen-2018 Vanzi, M.; Mura, G.; SANNA VALLE, Valerio - SPIE
Analysis of GaN based high-power diode lasers after singular degradation events 1-gen-2017 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS -
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1-gen-2017 Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. - IEEE (Institute of Electrical and Electronics Engineers)
Extended Modal Gain Measurement in DFB Laser Diodes 1-gen-2017 Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L. IEEE PHOTONICS TECHNOLOGY LETTERS -
Practical optical gain by an extended Hakki-Paoli method 1-gen-2017 Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. MICROELECTRONICS RELIABILITY -
ESD tests on 850 nm GaAs-based VCSELs 1-gen-2016 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K. MICROELECTRONICS RELIABILITY -
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 1-gen-2016 Mura, Giovanna; Vanzi, Massimo - Institute of Electrical and Electronics Engineers Inc.
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 1-gen-2016 De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico IEEE TRANSACTIONS ON NANOTECHNOLOGY -
Photometric stereo 3D visualizations of rock-art panels, bas-reliefs, and graffiti 1-gen-2016 Vanzi, Massimo; Emilio Bagnoli, Paolo; Mannu, Carla; Rodriguez, Giuseppe - Archaeopress Archaeology
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre 1-gen-2016 Mannu, Carla; Rodriguez, Giuseppe; Vanzi, Massimo - Condaghes
Side-Mode Excitation in Single-Mode Laser Diodes 1-gen-2016 Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY -
Clamp voltage and ideality factor in laser diodes 1-gen-2015 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni MICROELECTRONICS RELIABILITY -
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna 1-gen-2015 Mannu, C; Rodriguez, Giuseppe; Tanda, Giuseppa; Vanzi, Massimo - Edizioni del Centro - Centro Camuno di Studi Preistorici
Proton irradiation effects on commercial laser diodes 1-gen-2015 Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro - Institute of Electrical and Electronics Engineers Inc.