VANZI, MASSIMO
VANZI, MASSIMO
DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA
Identifying the lights position in photometric stereo under unknown lighting
2021-01-01 Concas, A.; Dessi, R.; Fenu, C.; Rodriguez, G.; Vanzi, M.
Laser Diode DC Measurement Protocols
2021-01-01 Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G.
Peculiar failure mechanisms in GaN power transistors
2020-01-01 Vanzi, M.; Mura, G.
Optical gain in laser diodes with null reflectivity
2019-01-01 Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y.
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices
2018-01-01 Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno
Further improvements of an extended Hakki-Paoli method
2018-01-01 Vanzi, M.; Mura, G.; Martines, G.
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes
2018-01-01 Vanzi, M.; Mura, G.; SANNA VALLE, Valerio
Analysis of GaN based high-power diode lasers after singular degradation events
2017-01-01 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W.
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers
2017-01-01 Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M.
Extended Modal Gain Measurement in DFB Laser Diodes
2017-01-01 Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L.
Practical optical gain by an extended Hakki-Paoli method
2017-01-01 Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L.
ESD tests on 850 nm GaAs-based VCSELs
2016-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K.
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue
2016-01-01 Mura, Giovanna; Vanzi, Massimo
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes
2016-01-01 De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico
Photometric stereo 3D visualizations of rock-art panels, bas-reliefs, and graffiti
2016-01-01 Vanzi, Massimo; Emilio Bagnoli, Paolo; Mannu, Carla; Rodriguez, Giuseppe
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre
2016-01-01 Mannu, Carla; Rodriguez, Giuseppe; Vanzi, Massimo
Side-Mode Excitation in Single-Mode Laser Diodes
2016-01-01 Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna
Clamp voltage and ideality factor in laser diodes
2015-01-01 Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna
2015-01-01 Mannu, C; Rodriguez, Giuseppe; Tanda, Giuseppa; Vanzi, Massimo
Proton irradiation effects on commercial laser diodes
2015-01-01 Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| Identifying the lights position in photometric stereo under unknown lighting | 1-gen-2021 | Concas, A.; Dessi, R.; Fenu, C.; Rodriguez, G.; Vanzi, M. | - | Institute of Electrical and Electronics Engineers Inc. |
| Laser Diode DC Measurement Protocols | 1-gen-2021 | Vanzi, M.; Mura, G.; Bechou, L.; Marcello, G. | - | Elsevier |
| Peculiar failure mechanisms in GaN power transistors | 1-gen-2020 | Vanzi, M.; Mura, G. | MICROELECTRONICS RELIABILITY | - |
| Optical gain in laser diodes with null reflectivity | 1-gen-2019 | Vanzi, M.; Mura, G.; Rampulla, A.; Marchetti, R.; Sanna Valle, V.; Uenoc, Y. | MICROELECTRONICS RELIABILITY | - |
| Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices | 1-gen-2018 | Tomm, Jens W.; Kernke, Robert; Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Acklin, Bruno | JOURNAL OF ELECTRONIC MATERIALS | - |
| Further improvements of an extended Hakki-Paoli method | 1-gen-2018 | Vanzi, M.; Mura, G.; Martines, G. | MICROELECTRONICS RELIABILITY | - |
| Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes | 1-gen-2018 | Vanzi, M.; Mura, G.; SANNA VALLE, Valerio | - | SPIE |
| Analysis of GaN based high-power diode lasers after singular degradation events | 1-gen-2017 | Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. | PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS | - |
| Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers | 1-gen-2017 | Tomm, J. W.; Kernke, R.; Mura, G.; Vanzi, M.; Hempel, M. | - | IEEE (Institute of Electrical and Electronics Engineers) |
| Extended Modal Gain Measurement in DFB Laser Diodes | 1-gen-2017 | Vanzi, Massimo; Marcello, Giulia; Mura, Giovanna; Le Gales, G; Joly, S; Deshayes, Y; Bechou, L. | IEEE PHOTONICS TECHNOLOGY LETTERS | - |
| Practical optical gain by an extended Hakki-Paoli method | 1-gen-2017 | Vanzi, M.; Marcello, G.; Mura, G.; Le Galès, G.; Joly, S.; Deshayes, Y.; Bechou, L. | MICROELECTRONICS RELIABILITY | - |
| ESD tests on 850 nm GaAs-based VCSELs | 1-gen-2016 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Xiao, K. | MICROELECTRONICS RELIABILITY | - |
| Logics of Failure Analysis: 20 Years of rules of the Rue Morgue | 1-gen-2016 | Mura, Giovanna; Vanzi, Massimo | - | Institute of Electrical and Electronics Engineers Inc. |
| Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes | 1-gen-2016 | De Santi, Carlo; Meneghini, Matteo; Gachet, David; Mura, Giovanna; Vanzi, Massimo; Meneghesso, Gaudenzio; Zanoni, Enrico | IEEE TRANSACTIONS ON NANOTECHNOLOGY | - |
| Photometric stereo 3D visualizations of rock-art panels, bas-reliefs, and graffiti | 1-gen-2016 | Vanzi, Massimo; Emilio Bagnoli, Paolo; Mannu, Carla; Rodriguez, Giuseppe | - | Archaeopress Archaeology |
| Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre | 1-gen-2016 | Mannu, Carla; Rodriguez, Giuseppe; Vanzi, Massimo | - | Condaghes |
| Side-Mode Excitation in Single-Mode Laser Diodes | 1-gen-2016 | Vanzi, Massimo; Xiao, K.; Marcello, Giulia; Mura, Giovanna | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - |
| Clamp voltage and ideality factor in laser diodes | 1-gen-2015 | Vanzi, Massimo; Mura, Giovanna; Marcello, Giulia; Martines, Giovanni | MICROELECTRONICS RELIABILITY | - |
| Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna | 1-gen-2015 | Mannu, C; Rodriguez, Giuseppe; Tanda, Giuseppa; Vanzi, Massimo | - | Edizioni del Centro - Centro Camuno di Studi Preistorici |
| Proton irradiation effects on commercial laser diodes | 1-gen-2015 | Marcello, Giulia; Mura, Giovanna; Vanzi, Massimo; Bagatin, Marta; Gerardin, Simone; Paccagnella, Alessandro | - | Institute of Electrical and Electronics Engineers Inc. |