VANZI, MASSIMO
VANZI, MASSIMO
DIPARTIMENTO DI INGEGNERIA ELETTRICA ED ELETTRONICA
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM
2010-01-01 S., Podda; R., Pintus; E., Musu; Vanzi, Massimo
3D reconstruction of FIB microstructures from BSE images
2010-01-01 Podda, Simona; R., Pintus; E., Musu; Vanzi, Massimo
3D Sculptures from SEM images
2008-01-01 Pintus, R; Podda, Simona; Vanzi, Massimo
3D statistics from TEM observations of TPFG EEPROM memory cells
1990-01-01 P., Mengucci; D., Rinaldi; S., Santini; Vanzi, Massimo
A different approach to the analysis of data in life-tests of laser diodes
1998-01-01 Bonfiglio, Annalisa; CASU M., B; Vanzi, Massimo; Magistrali, F; Salmini, G.
A Failure Analysis Oriented E- Beam Test System
1990-01-01 A., Haardt; C., Morandi; Vanzi, Massimo
A model for the DC characteristics of a laser diode
2008-01-01 Vanzi, Massimo
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps
2012-01-01 M., Meneghini; M., Bertin; G., dal Santo; A., Stocco; A., Chini; D., Marcon; P. E., Malinowski; Mura, Giovanna; E., Musu; Vanzi, Massimo; G., Meneghesso; E., Zanoni
A simpler method for life-testing laser diodes
1999-01-01 Vanzi, Massimo; Martines, Giovanni; Bonfiglio, Annalisa; Licheri, M; Darco, R; Salmini, G; DE PALO, R.
A specimen-current branching approach for FA of long Electromigration test lines
2002-01-01 C., Caprile; I., DE MUNARI; M., Impronta; Podda, Simona; A., Scorzoni; Vanzi, Massimo
Accelerated Life Test of High Brightness Light Emitting Diodes
2008-01-01 L., Trevisanello; M., Meneghini; Mura, Giovanna; Vanzi, Massimo; M., Pavesi; G., Meneghesso; E., Zanoni
An automated lifetest equipment for optical emitters
2002-01-01 Giglio, M; Martines, Giovanni; Mura, Giovanna; Podda, Simona; Vanzi, Massimo
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy
2006-01-01 Pintus, R; Podda, Simona; Vanzi, Massimo
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy
2008-01-01 Pintus, R; Podda, Simona; Vanzi, Massimo
An Effective Method for Gold Dissolution in Microelectronic Devices Failure Analysis
2004-01-01 Artizzu, Flavia; Cabras, Mc; Deplano, Paola; Mercuri, MARIA LAURA; Morelli, A; Serpe, Angela; Trogu, Ef; Vanzi, Massimo
An original DoE-based tool for silicon photodetectors EoL estimation in space environments
2011-01-01 Vanzi, Massimo; Spezzigu, P; Bechou, L; Quadri, G; Gilard, O; Ousten, Y.
Analysis of GaN based high-power diode lasers after singular degradation events
2017-01-01 Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W.
Analysis of RFIC Amplifiers
2004-01-01 Mura, Giovanna; Vanzi, Massimo; G., Micheletti
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs
2009-01-01 Meneghesso, G; Meneghini, M; Trivellin, N; Rodighiero, L; Mura, Giovanna; Vanzi, Massimo; Zanoni, E.
Anodic Gold Corrosion in Optical Modulators” proc. SPIE 2001, p.4277-14
2001-01-01 Furcas, P.; DE PALO, R.; Patella, M. E.; Salmini, G; Vanzi, Massimo
| Titolo | Data di pubblicazione | Autore(i) | Rivista | Editore |
|---|---|---|---|---|
| 3D reconstruction of FIB microstructures by Photometric Stereo at the SEM | 1-gen-2010 | S., Podda; R., Pintus; E., Musu; Vanzi, Massimo | - | Royal microscopy society |
| 3D reconstruction of FIB microstructures from BSE images | 1-gen-2010 | Podda, Simona; R., Pintus; E., Musu; Vanzi, Massimo | - | - |
| 3D Sculptures from SEM images | 1-gen-2008 | Pintus, R; Podda, Simona; Vanzi, Massimo | - | - |
| 3D statistics from TEM observations of TPFG EEPROM memory cells | 1-gen-1990 | P., Mengucci; D., Rinaldi; S., Santini; Vanzi, Massimo | MICROSCOPY MICROANALYSIS MICROSTRUCTURES | - |
| A different approach to the analysis of data in life-tests of laser diodes | 1-gen-1998 | Bonfiglio, Annalisa; CASU M., B; Vanzi, Massimo; Magistrali, F; Salmini, G. | MICROELECTRONICS RELIABILITY | - |
| A Failure Analysis Oriented E- Beam Test System | 1-gen-1990 | A., Haardt; C., Morandi; Vanzi, Massimo | MICROELECTRONIC ENGINEERING | - |
| A model for the DC characteristics of a laser diode | 1-gen-2008 | Vanzi, Massimo | - | - |
| A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps | 1-gen-2012 | M., Meneghini; M., Bertin; G., dal Santo; A., Stocco; A., Chini; D., Marcon; P. E., Malinowski; Mura, Giovanna; E., Musu; Vanzi, Massimo; G., Meneghesso; E., Zanoni | - | - |
| A simpler method for life-testing laser diodes | 1-gen-1999 | Vanzi, Massimo; Martines, Giovanni; Bonfiglio, Annalisa; Licheri, M; Darco, R; Salmini, G; DE PALO, R. | MICROELECTRONICS RELIABILITY | Elsevier science |
| A specimen-current branching approach for FA of long Electromigration test lines | 1-gen-2002 | C., Caprile; I., DE MUNARI; M., Impronta; Podda, Simona; A., Scorzoni; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | - |
| Accelerated Life Test of High Brightness Light Emitting Diodes | 1-gen-2008 | L., Trevisanello; M., Meneghini; Mura, Giovanna; Vanzi, Massimo; M., Pavesi; G., Meneghesso; E., Zanoni | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY | - |
| An automated lifetest equipment for optical emitters | 1-gen-2002 | Giglio, M; Martines, Giovanni; Mura, Giovanna; Podda, Simona; Vanzi, Massimo | MICROELECTRONICS RELIABILITY | - |
| An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy | 1-gen-2006 | Pintus, R; Podda, Simona; Vanzi, Massimo | - | - |
| An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy | 1-gen-2008 | Pintus, R; Podda, Simona; Vanzi, Massimo | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | - |
| An Effective Method for Gold Dissolution in Microelectronic Devices Failure Analysis | 1-gen-2004 | Artizzu, Flavia; Cabras, Mc; Deplano, Paola; Mercuri, MARIA LAURA; Morelli, A; Serpe, Angela; Trogu, Ef; Vanzi, Massimo | - | - |
| An original DoE-based tool for silicon photodetectors EoL estimation in space environments | 1-gen-2011 | Vanzi, Massimo; Spezzigu, P; Bechou, L; Quadri, G; Gilard, O; Ousten, Y. | MICROELECTRONICS RELIABILITY | Elsevier |
| Analysis of GaN based high-power diode lasers after singular degradation events | 1-gen-2017 | Mura, Giovanna; Vanzi, Massimo; Hempel, Martin; Tomm, Jens W. | PHYSICA STATUS SOLIDI. RAPID RESEARCH LETTERS | - |
| Analysis of RFIC Amplifiers | 1-gen-2004 | Mura, Giovanna; Vanzi, Massimo; G., Micheletti | MICROELECTRONICS RELIABILITY | - |
| Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs | 1-gen-2009 | Meneghesso, G; Meneghini, M; Trivellin, N; Rodighiero, L; Mura, Giovanna; Vanzi, Massimo; Zanoni, E. | - | - |
| Anodic Gold Corrosion in Optical Modulators” proc. SPIE 2001, p.4277-14 | 1-gen-2001 | Furcas, P.; DE PALO, R.; Patella, M. E.; Salmini, G; Vanzi, Massimo | - | - |