UNICA IRIS Institutional Research Information System

MARTINES, GIOVANNI
 Distribuzione geografica
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Continente #
EU - Europa 61.500
NA - Nord America 3.465
AS - Asia 1.720
SA - Sud America 217
AF - Africa 32
OC - Oceania 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 66.937
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Nazione #
IT - Italia 60.482
US - Stati Uniti d'America 3.430
SG - Singapore 692
CN - Cina 676
UA - Ucraina 289
SE - Svezia 200
BR - Brasile 163
GB - Regno Unito 142
FI - Finlandia 128
VN - Vietnam 122
FR - Francia 94
DE - Germania 89
IN - India 55
KR - Corea 35
IQ - Iraq 28
HK - Hong Kong 22
RU - Federazione Russa 21
BD - Bangladesh 18
CA - Canada 17
AR - Argentina 16
MX - Messico 15
BE - Belgio 14
JP - Giappone 13
ZA - Sudafrica 10
CO - Colombia 9
NL - Olanda 9
TR - Turchia 9
PK - Pakistan 8
VE - Venezuela 6
CL - Cile 5
EC - Ecuador 5
MA - Marocco 5
PL - Polonia 5
PY - Paraguay 5
AT - Austria 4
EG - Egitto 4
IR - Iran 4
LT - Lituania 4
MY - Malesia 4
UY - Uruguay 4
UZ - Uzbekistan 4
AZ - Azerbaigian 3
CZ - Repubblica Ceca 3
DZ - Algeria 3
IE - Irlanda 3
KG - Kirghizistan 3
TN - Tunisia 3
TW - Taiwan 3
AU - Australia 2
BO - Bolivia 2
ES - Italia 2
ID - Indonesia 2
JO - Giordania 2
KE - Kenya 2
LA - Repubblica Popolare Democratica del Laos 2
LK - Sri Lanka 2
MU - Mauritius 2
PE - Perù 2
PH - Filippine 2
SA - Arabia Saudita 2
AL - Albania 1
AM - Armenia 1
BF - Burkina Faso 1
BG - Bulgaria 1
BH - Bahrain 1
BN - Brunei Darussalam 1
CH - Svizzera 1
CR - Costa Rica 1
DK - Danimarca 1
EE - Estonia 1
ET - Etiopia 1
EU - Europa 1
GD - Grenada 1
GE - Georgia 1
GR - Grecia 1
HR - Croazia 1
HU - Ungheria 1
IL - Israele 1
KW - Kuwait 1
KZ - Kazakistan 1
MK - Macedonia 1
NG - Nigeria 1
PR - Porto Rico 1
PT - Portogallo 1
RO - Romania 1
SY - Repubblica araba siriana 1
TH - Thailandia 1
Totale 66.937
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Città #
Cagliari 58.782
Uta 1.474
Singapore 405
Chandler 353
Ashburn 311
Fairfield 274
Houston 232
Woodbridge 219
Ann Arbor 209
Boardman 177
Jacksonville 160
San Jose 160
Dallas 144
Nyköping 140
Seattle 131
Wilmington 115
Beijing 113
Cambridge 111
Hefei 106
Helsinki 76
Los Angeles 71
Santa Clara 56
Dearborn 54
Ho Chi Minh City 48
Boston 46
Nanjing 46
Lauterbourg 45
The Dalles 42
Shanghai 40
Milan 37
Seoul 35
Hanoi 25
Pune 21
Buffalo 20
Munich 20
Changsha 17
Hong Kong 17
Sassari 17
Redwood City 16
Verona 16
Chicago 15
Hebei 15
Tianjin 15
Shenyang 14
Guangzhou 13
New York 13
Brooklyn 12
Nanchang 12
San Diego 12
Baghdad 11
Brussels 11
Jiaxing 11
Tokyo 11
Bologna 10
Washington 10
Frankfurt am Main 9
London 9
Ningbo 9
Selargius 9
São Paulo 9
Wuhan 9
Hangzhou 8
Les Lilas 8
Mexico City 8
Orem 8
Atlanta 7
Auburn Hills 7
Jinan 7
Manchester 7
San Francisco 7
Ankara 6
Benetutti 6
Da Nang 6
Denver 6
Mumbai 6
Orange 6
Rio de Janeiro 6
Turku 6
Montreal 5
Phoenix 5
Ploaghe 5
Redondo Beach 5
Scorzè 5
Toronto 5
Warsaw 5
Brasília 4
Caracas 4
Chennai 4
Curitiba 4
Frascati 4
Fuzhou 4
Haiphong 4
Johannesburg 4
Norwalk 4
Quito 4
Tashkent 4
Zhengzhou 4
Bishkek 3
Bogotá 3
Canoas 3
Totale 64.827
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Nome #
Ultra-low voltage, self-aligned OTFTs for frequency applications 14.536
Clamp voltage and ideality factor in laser diodes 3.170
Further improvements of an extended Hakki-Paoli method 2.176
DC parameters for laser diodes from experimental curves 2.051
External cavity ITLA degradation 1.949
An automated lifetest equipment for optical emitters 1.723
A simpler method for life-testing laser diodes 1.416
Charge diffusion and reciprocity theorems: A direct approach to EBIC of ridge laser diodes 1.408
A novel approach to determine the start-up conditions in microwave negative impedance oscillator design 1.391
Proposal of up-to-date standards on methods of measuring noise in linear two-ports 1.291
Full characterization of low-noise HEMTs using only noise figure measurements 1.201
A global approach to the noise and small-signal characterization of microwave field-effect transistors 1.197
Noisy characterization for CAD-oriented modeling of a pseudomorphic HEMT series versus frequency and temperature 1.191
CAD-oriented modeling of pseudomorphic HEMTs from simultaneous noise and scattering measurements 1.172
The determination of noise, gain and scattering parameters of microwave transistors (HEMTs) using only an automatic noise figure test-set 1.166
DC, low frequency and RF drift in AlGaAs/InGaAs PM-HEMTs biased in high field and high power dissipation regime 1.156
Statistical modeling of pseudomorphic HEMTs from automated noise and scattering parameter measurements 1.141
Failure mechanisms of Schottky gate contact degradation and deep traps creation in AlGaAs/InGaAs PM-HEMT’s submitted to accelerated life tests 1.088
A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters 1.064
CAD-oriented modeling of low-noise HEMTs 1.049
Failure mechanisms of Schottky gate contact degradation and deep traps creation in AlGaAs/InGaAs PM-HEMT submitted to accelerated life tests 1.037
Automatic characterization and modeling of microwave low noise HEMTs 1.029
An automated measuring system for the simultaneous determination of noise, gain and scattering parameters of HEMTs 1.017
Automatic characterization and modeling of microwave low-noise HEMTs 1.016
HEMT for Low Noise Microwaves: CAD Oriented Modeling 979
CAD-oriented HEMT models from noise and scattering measurements 978
Merit Figures of Low Noise HEMTs from Complete Characterization 975
An automated test-set for the complete characterization on low noise microwave transistors 954
Simultaneous determination of transistor noise, gain and scattering parameters for amplifier design through noise figure measurements only 953
A new automated test-set for the characterization of low-noise devices in terms of noise, gain and scattering parameters 939
Computer-controlled complete characterization of low noise microwave transistors 933
A computer-assisted noise parameter test-set for the characterization of microwave transistors in terms of noise, gain and scattering parameters 904
Automated test-set for accurate measurements of minimum noise figure of GaAs FETs 891
A computer-controlled test-set for the complete characterization of GaAs low noise devices 888
Comments on `A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters' [and reply] 882
Characterization and modeling of low noise HEMTs for microwave radio link 872
A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters 859
Complete characterization of GaAs low noise devices through noise figure test-set controlled by computer 837
Characterization of GaAs FET's in terms of noise, gain, and scattering parameters through a noise parameter test set 817
Determination of microwave transistor noise and gain parameters through noise-figure measurements only 809
MMIC-oriented modeling of low-noise HEMTs 803
Simultaneous determination of transistor noise, gain and scattering parameters for amplifier design through noise figure measurements only 789
State-of-art of computer aided characterization of GaAs low noise microwave transistors 779
Analysis of counterfeit electronics 761
Comments on 'Simultaneous determination of transistors noise, gain and scattering parameters for amplifiers design through noise figure measurements only'[and reply] 758
Analysis of Fake Amplifiers 731
Reliability risks from counterfeit electronics 502
Electronic components authentication via physical analysis 479
Effect of centre volume on pathological outcomes and postoperative complications after surgery for colorectal cancer: results of a multicentre national study 304
Totale 67.011
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Categoria #
all - tutte 82.286
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 82.286
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021816 0 0 0 0 0 0 0 0 0 286 280 250
2021/20223.158 236 262 285 138 171 289 248 227 244 242 356 460
2022/20235.520 418 591 463 480 459 393 205 597 421 489 698 306
2023/20246.489 235 290 331 386 700 1.182 1.295 425 429 270 467 479
2024/202519.803 7.344 2.883 6.452 1.134 591 495 403 64 94 74 103 166
2025/20262.324 183 110 348 258 242 213 418 164 149 239 0 0
Totale 67.011