UNICA IRIS Institutional Research Information System

MARTINES, GIOVANNI
 Distribuzione geografica
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Continente #
EU - Europa 61.612
NA - Nord America 3.759
AS - Asia 1.740
SA - Sud America 223
Continente sconosciuto - Info sul continente non disponibili 75
AF - Africa 32
OC - Oceania 2
Totale 67.443
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Nazione #
IT - Italia 60.588
US - Stati Uniti d'America 3.712
SG - Singapore 695
CN - Cina 677
UA - Ucraina 290
SE - Svezia 200
BR - Brasile 167
GB - Regno Unito 142
FI - Finlandia 128
VN - Vietnam 122
FR - Francia 94
DE - Germania 89
IN - India 55
KR - Corea 35
BD - Bangladesh 32
IQ - Iraq 28
HK - Hong Kong 22
CA - Canada 21
RU - Federazione Russa 21
AR - Argentina 17
BE - Belgio 16
MX - Messico 15
JP - Giappone 13
NL - Olanda 10
ZA - Sudafrica 10
CO - Colombia 9
TR - Turchia 9
PK - Pakistan 8
VE - Venezuela 6
CL - Cile 5
EC - Ecuador 5
MA - Marocco 5
PL - Polonia 5
PY - Paraguay 5
AT - Austria 4
EG - Egitto 4
ES - Italia 4
IR - Iran 4
JM - Giamaica 4
LT - Lituania 4
MY - Malesia 4
UY - Uruguay 4
UZ - Uzbekistan 4
AZ - Azerbaigian 3
CR - Costa Rica 3
CZ - Repubblica Ceca 3
DZ - Algeria 3
IE - Irlanda 3
IL - Israele 3
KG - Kirghizistan 3
PE - Perù 3
TN - Tunisia 3
TW - Taiwan 3
AU - Australia 2
BO - Bolivia 2
ID - Indonesia 2
JO - Giordania 2
KE - Kenya 2
LA - Repubblica Popolare Democratica del Laos 2
LK - Sri Lanka 2
MU - Mauritius 2
PH - Filippine 2
SA - Arabia Saudita 2
AL - Albania 1
AM - Armenia 1
BF - Burkina Faso 1
BG - Bulgaria 1
BH - Bahrain 1
BN - Brunei Darussalam 1
CH - Svizzera 1
DK - Danimarca 1
EE - Estonia 1
ET - Etiopia 1
EU - Europa 1
GD - Grenada 1
GE - Georgia 1
GR - Grecia 1
GT - Guatemala 1
HR - Croazia 1
HU - Ungheria 1
KW - Kuwait 1
KZ - Kazakistan 1
MK - Macedonia 1
NG - Nigeria 1
PR - Porto Rico 1
PT - Portogallo 1
RO - Romania 1
SV - El Salvador 1
SY - Repubblica araba siriana 1
TH - Thailandia 1
Totale 67.369
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Città #
Cagliari 58.859
Uta 1.474
Singapore 406
Chandler 353
Ashburn 316
Fairfield 274
Houston 234
Woodbridge 219
Ann Arbor 209
San Jose 184
Boardman 178
Jacksonville 160
Dallas 146
Nyköping 140
Seattle 131
Wilmington 116
Beijing 114
Cambridge 112
Hefei 106
Helsinki 76
Los Angeles 74
Santa Clara 59
Dearborn 54
Council Bluffs 51
Ho Chi Minh City 48
Boston 46
Nanjing 46
Lauterbourg 45
Milan 43
The Dalles 42
Shanghai 40
Seoul 35
Columbus 33
Hanoi 25
Buffalo 22
Pune 21
Munich 20
New York 18
Changsha 17
Chicago 17
Hong Kong 17
Sassari 17
Redwood City 16
Verona 16
Hebei 15
Tianjin 15
Shenyang 14
Guangzhou 13
Brooklyn 12
Nanchang 12
San Diego 12
Baghdad 11
Brussels 11
Jiaxing 11
Tokyo 11
Washington 11
Bologna 10
Frankfurt am Main 9
London 9
Ningbo 9
Selargius 9
São Paulo 9
Wuhan 9
Hangzhou 8
Les Lilas 8
Mexico City 8
Orem 8
Atlanta 7
Auburn Hills 7
Denver 7
Jinan 7
Manchester 7
Phoenix 7
San Francisco 7
Ankara 6
Benetutti 6
Da Nang 6
Mumbai 6
Orange 6
Rio de Janeiro 6
Toronto 6
Turku 6
Montreal 5
Ploaghe 5
Redondo Beach 5
Scorzè 5
Warsaw 5
Brasília 4
Caracas 4
Chennai 4
Curitiba 4
Frascati 4
Fuzhou 4
Haiphong 4
Johannesburg 4
Norwalk 4
Quito 4
Tashkent 4
Zhengzhou 4
Belo Horizonte 3
Totale 65.046
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Nome #
Ultra-low voltage, self-aligned OTFTs for frequency applications 14.554
Clamp voltage and ideality factor in laser diodes 3.177
Further improvements of an extended Hakki-Paoli method 2.186
DC parameters for laser diodes from experimental curves 2.058
External cavity ITLA degradation 1.959
An automated lifetest equipment for optical emitters 1.729
A simpler method for life-testing laser diodes 1.430
Charge diffusion and reciprocity theorems: A direct approach to EBIC of ridge laser diodes 1.423
A novel approach to determine the start-up conditions in microwave negative impedance oscillator design 1.398
Proposal of up-to-date standards on methods of measuring noise in linear two-ports 1.293
A global approach to the noise and small-signal characterization of microwave field-effect transistors 1.214
Full characterization of low-noise HEMTs using only noise figure measurements 1.207
Noisy characterization for CAD-oriented modeling of a pseudomorphic HEMT series versus frequency and temperature 1.195
CAD-oriented modeling of pseudomorphic HEMTs from simultaneous noise and scattering measurements 1.181
The determination of noise, gain and scattering parameters of microwave transistors (HEMTs) using only an automatic noise figure test-set 1.169
DC, low frequency and RF drift in AlGaAs/InGaAs PM-HEMTs biased in high field and high power dissipation regime 1.166
Statistical modeling of pseudomorphic HEMTs from automated noise and scattering parameter measurements 1.144
Failure mechanisms of Schottky gate contact degradation and deep traps creation in AlGaAs/InGaAs PM-HEMT’s submitted to accelerated life tests 1.093
A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters 1.068
CAD-oriented modeling of low-noise HEMTs 1.050
Failure mechanisms of Schottky gate contact degradation and deep traps creation in AlGaAs/InGaAs PM-HEMT submitted to accelerated life tests 1.040
Automatic characterization and modeling of microwave low noise HEMTs 1.037
Automatic characterization and modeling of microwave low-noise HEMTs 1.031
An automated measuring system for the simultaneous determination of noise, gain and scattering parameters of HEMTs 1.019
CAD-oriented HEMT models from noise and scattering measurements 986
HEMT for Low Noise Microwaves: CAD Oriented Modeling 981
Merit Figures of Low Noise HEMTs from Complete Characterization 978
An automated test-set for the complete characterization on low noise microwave transistors 963
Simultaneous determination of transistor noise, gain and scattering parameters for amplifier design through noise figure measurements only 961
A new automated test-set for the characterization of low-noise devices in terms of noise, gain and scattering parameters 951
Computer-controlled complete characterization of low noise microwave transistors 937
A computer-assisted noise parameter test-set for the characterization of microwave transistors in terms of noise, gain and scattering parameters 907
Automated test-set for accurate measurements of minimum noise figure of GaAs FETs 898
A computer-controlled test-set for the complete characterization of GaAs low noise devices 895
Comments on `A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters' [and reply] 888
Characterization and modeling of low noise HEMTs for microwave radio link 879
A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters 866
Complete characterization of GaAs low noise devices through noise figure test-set controlled by computer 840
Characterization of GaAs FET's in terms of noise, gain, and scattering parameters through a noise parameter test set 818
Determination of microwave transistor noise and gain parameters through noise-figure measurements only 811
MMIC-oriented modeling of low-noise HEMTs 808
Simultaneous determination of transistor noise, gain and scattering parameters for amplifier design through noise figure measurements only 798
State-of-art of computer aided characterization of GaAs low noise microwave transistors 785
Analysis of counterfeit electronics 769
Comments on 'Simultaneous determination of transistors noise, gain and scattering parameters for amplifiers design through noise figure measurements only'[and reply] 765
Analysis of Fake Amplifiers 748
Reliability risks from counterfeit electronics 508
Electronic components authentication via physical analysis 490
Effect of centre volume on pathological outcomes and postoperative complications after surgery for colorectal cancer: results of a multicentre national study 392
Totale 67.443
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Categoria #
all - tutte 84.597
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 84.597
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20222.922 0 262 285 138 171 289 248 227 244 242 356 460
2022/20235.520 418 591 463 480 459 393 205 597 421 489 698 306
2023/20246.489 235 290 331 386 700 1.182 1.295 425 429 270 467 479
2024/202519.803 7.344 2.883 6.452 1.134 591 495 403 64 94 74 103 166
2025/20262.576 183 110 348 258 242 213 418 164 149 245 173 73
2026/2027180 42 138 0 0 0 0 0 0 0 0 0 0
Totale 67.443