UNICA IRIS Institutional Research Information System

MARTINES, GIOVANNI
 Distribuzione geografica
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Continente #
EU - Europa 61.239
NA - Nord America 3.227
AS - Asia 1.383
SA - Sud America 188
AF - Africa 16
OC - Oceania 2
Continente sconosciuto - Info sul continente non disponibili 1
Totale 66.056
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Nazione #
IT - Italia 60.321
US - Stati Uniti d'America 3.193
CN - Cina 607
SG - Singapore 577
UA - Ucraina 290
SE - Svezia 202
BR - Brasile 152
GB - Regno Unito 135
DE - Germania 86
FI - Finlandia 84
FR - Francia 47
VN - Vietnam 47
IN - India 43
KR - Corea 35
RU - Federazione Russa 19
CA - Canada 18
IQ - Iraq 15
BE - Belgio 14
AR - Argentina 13
MX - Messico 13
JP - Giappone 10
NL - Olanda 9
HK - Hong Kong 8
BD - Bangladesh 7
ZA - Sudafrica 7
AT - Austria 5
EC - Ecuador 5
PL - Polonia 5
TR - Turchia 5
CO - Colombia 4
IR - Iran 4
LT - Lituania 4
PY - Paraguay 4
VE - Venezuela 4
CZ - Repubblica Ceca 3
ES - Italia 3
IE - Irlanda 3
KG - Kirghizistan 3
PK - Pakistan 3
TW - Taiwan 3
AU - Australia 2
CL - Cile 2
EG - Egitto 2
KE - Kenya 2
LK - Sri Lanka 2
MA - Marocco 2
PE - Perù 2
UY - Uruguay 2
UZ - Uzbekistan 2
AM - Armenia 1
BG - Bulgaria 1
BH - Bahrain 1
BN - Brunei Darussalam 1
CH - Svizzera 1
CR - Costa Rica 1
DK - Danimarca 1
DZ - Algeria 1
EE - Estonia 1
EU - Europa 1
GD - Grenada 1
GE - Georgia 1
GR - Grecia 1
ID - Indonesia 1
IL - Israele 1
KH - Cambogia 1
KW - Kuwait 1
LA - Repubblica Popolare Democratica del Laos 1
LV - Lettonia 1
MK - Macedonia 1
MU - Mauritius 1
MY - Malesia 1
PR - Porto Rico 1
PT - Portogallo 1
RO - Romania 1
SA - Arabia Saudita 1
TH - Thailandia 1
TN - Tunisia 1
Totale 66.056
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Città #
Cagliari 58.626
Uta 1.474
Chandler 353
Singapore 315
Ashburn 274
Fairfield 274
Houston 232
Woodbridge 219
Ann Arbor 209
Boardman 175
Jacksonville 160
Dallas 141
Nyköping 140
Seattle 131
Wilmington 115
Beijing 111
Cambridge 111
Hefei 105
Los Angeles 71
Santa Clara 55
Dearborn 54
Boston 46
Nanjing 46
Shanghai 38
Milan 37
Seoul 35
Helsinki 33
Ho Chi Minh City 23
Pune 21
Buffalo 20
Munich 20
The Dalles 19
Changsha 17
Sassari 17
Redwood City 16
Verona 16
Hebei 15
New York 14
Shenyang 14
Tianjin 14
Chicago 13
Nanchang 12
San Diego 12
Brooklyn 11
Brussels 11
Jiaxing 11
Bologna 10
Washington 10
Guangzhou 9
Ningbo 9
Selargius 9
São Paulo 9
Hong Kong 8
Les Lilas 8
London 8
Mexico City 8
San Francisco 8
Tokyo 8
Wuhan 8
Auburn Hills 7
Jinan 7
Benetutti 6
Denver 6
Hanoi 6
Montreal 6
Orange 6
Phoenix 6
Redondo Beach 6
Turku 6
Atlanta 5
Frankfurt am Main 5
Manchester 5
Ploaghe 5
Rio de Janeiro 5
Scorzè 5
Toronto 5
Warsaw 5
Baghdad 4
Brasília 4
Curitiba 4
Frascati 4
Fuzhou 4
Johannesburg 4
Mumbai 4
Norwalk 4
Poplar 4
Quito 4
Zhengzhou 4
Amsterdam 3
Ankara 3
Bishkek 3
Bogotá 3
Canoas 3
Caracas 3
Chennai 3
Florianópolis 3
Goiânia 3
Joinville 3
Lucca 3
Monmouth Junction 3
Totale 64.170
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Nome #
Ultra-low voltage, self-aligned OTFTs for frequency applications 14.504
Clamp voltage and ideality factor in laser diodes 3.145
Further improvements of an extended Hakki-Paoli method 2.137
DC parameters for laser diodes from experimental curves 2.017
External cavity ITLA degradation 1.925
An automated lifetest equipment for optical emitters 1.691
A simpler method for life-testing laser diodes 1.376
Charge diffusion and reciprocity theorems: A direct approach to EBIC of ridge laser diodes 1.376
A novel approach to determine the start-up conditions in microwave negative impedance oscillator design 1.370
Proposal of up-to-date standards on methods of measuring noise in linear two-ports 1.275
Full characterization of low-noise HEMTs using only noise figure measurements 1.186
A global approach to the noise and small-signal characterization of microwave field-effect transistors 1.175
Noisy characterization for CAD-oriented modeling of a pseudomorphic HEMT series versus frequency and temperature 1.166
CAD-oriented modeling of pseudomorphic HEMTs from simultaneous noise and scattering measurements 1.163
The determination of noise, gain and scattering parameters of microwave transistors (HEMTs) using only an automatic noise figure test-set 1.157
DC, low frequency and RF drift in AlGaAs/InGaAs PM-HEMTs biased in high field and high power dissipation regime 1.138
Statistical modeling of pseudomorphic HEMTs from automated noise and scattering parameter measurements 1.127
Failure mechanisms of Schottky gate contact degradation and deep traps creation in AlGaAs/InGaAs PM-HEMT’s submitted to accelerated life tests 1.065
A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters 1.048
CAD-oriented modeling of low-noise HEMTs 1.040
Automatic characterization and modeling of microwave low noise HEMTs 1.019
Failure mechanisms of Schottky gate contact degradation and deep traps creation in AlGaAs/InGaAs PM-HEMT submitted to accelerated life tests 1.018
An automated measuring system for the simultaneous determination of noise, gain and scattering parameters of HEMTs 1.004
Automatic characterization and modeling of microwave low-noise HEMTs 1.001
HEMT for Low Noise Microwaves: CAD Oriented Modeling 968
CAD-oriented HEMT models from noise and scattering measurements 962
Merit Figures of Low Noise HEMTs from Complete Characterization 958
An automated test-set for the complete characterization on low noise microwave transistors 943
Simultaneous determination of transistor noise, gain and scattering parameters for amplifier design through noise figure measurements only 943
A new automated test-set for the characterization of low-noise devices in terms of noise, gain and scattering parameters 929
Computer-controlled complete characterization of low noise microwave transistors 924
A computer-assisted noise parameter test-set for the characterization of microwave transistors in terms of noise, gain and scattering parameters 895
A computer-controlled test-set for the complete characterization of GaAs low noise devices 879
Automated test-set for accurate measurements of minimum noise figure of GaAs FETs 877
Comments on `A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters' [and reply] 869
Characterization and modeling of low noise HEMTs for microwave radio link 858
A method for measurement of losses in the noise-matching microwave network while measuring transistor noise parameters 836
Complete characterization of GaAs low noise devices through noise figure test-set controlled by computer 824
Characterization of GaAs FET's in terms of noise, gain, and scattering parameters through a noise parameter test set 810
Determination of microwave transistor noise and gain parameters through noise-figure measurements only 800
MMIC-oriented modeling of low-noise HEMTs 788
Simultaneous determination of transistor noise, gain and scattering parameters for amplifier design through noise figure measurements only 776
State-of-art of computer aided characterization of GaAs low noise microwave transistors 769
Comments on 'Simultaneous determination of transistors noise, gain and scattering parameters for amplifiers design through noise figure measurements only'[and reply] 747
Analysis of counterfeit electronics 728
Analysis of Fake Amplifiers 697
Reliability risks from counterfeit electronics 460
Electronic components authentication via physical analysis 440
Effect of centre volume on pathological outcomes and postoperative complications after surgery for colorectal cancer: results of a multicentre national study 225
The pan - COVID - AGICT study. The impact of COVID-19 pandemic on surgically treated pancreatic cancer patients. A multicentric Italian study 58
null 47
Totale 66.133
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Categoria #
all - tutte 80.990
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 80.990
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20213.929 0 0 0 0 0 1.022 1.275 608 208 286 280 250
2021/20223.158 236 262 285 138 171 289 248 227 244 242 356 460
2022/20235.520 418 591 463 480 459 393 205 597 421 489 698 306
2023/20246.489 235 290 331 386 700 1.182 1.295 425 429 270 467 479
2024/202519.865 7.344 2.883 6.452 1.136 604 506 420 65 99 80 104 172
2025/20261.384 193 115 351 268 250 207 0 0 0 0 0 0
Totale 66.133