UNICA IRIS Institutional Research Information System

VANZI, MASSIMO
 Distribuzione geografica
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Continente #
EU - Europa 128.145
NA - Nord America 8.162
AS - Asia 2.821
SA - Sud America 471
AF - Africa 44
OC - Oceania 9
Continente sconosciuto - Info sul continente non disponibili 7
Totale 139.659
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Nazione #
IT - Italia 125.961
US - Stati Uniti d'America 8.039
CN - Cina 1.222
SG - Singapore 1.147
UA - Ucraina 699
SE - Svezia 574
BR - Brasile 382
DE - Germania 227
GB - Regno Unito 213
FI - Finlandia 194
VN - Vietnam 133
FR - Francia 117
CA - Canada 90
KR - Corea 76
IN - India 50
AR - Argentina 44
RU - Federazione Russa 31
JP - Giappone 27
IQ - Iraq 26
BE - Belgio 24
HK - Hong Kong 22
ES - Italia 20
IR - Iran 20
MX - Messico 19
PL - Polonia 18
NL - Olanda 17
BD - Bangladesh 15
MA - Marocco 15
EC - Ecuador 14
TR - Turchia 13
ID - Indonesia 11
MU - Mauritius 9
ZA - Sudafrica 9
CO - Colombia 8
SA - Arabia Saudita 8
AT - Austria 7
CL - Cile 6
CZ - Repubblica Ceca 6
EU - Europa 6
PK - Pakistan 6
SI - Slovenia 6
UY - Uruguay 6
AU - Australia 5
LT - Lituania 5
MY - Malesia 5
VE - Venezuela 5
AZ - Azerbaigian 4
IE - Irlanda 4
IL - Israele 4
KG - Kirghizistan 4
NZ - Nuova Zelanda 4
PY - Paraguay 4
RO - Romania 4
UZ - Uzbekistan 4
AL - Albania 3
AM - Armenia 3
EG - Egitto 3
JM - Giamaica 3
JO - Giordania 3
KE - Kenya 3
PT - Portogallo 3
QA - Qatar 3
TN - Tunisia 3
AE - Emirati Arabi Uniti 2
BG - Bulgaria 2
DO - Repubblica Dominicana 2
NO - Norvegia 2
PA - Panama 2
RS - Serbia 2
TT - Trinidad e Tobago 2
BA - Bosnia-Erzegovina 1
BH - Bahrain 1
BN - Brunei Darussalam 1
BO - Bolivia 1
CH - Svizzera 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
DK - Danimarca 1
DZ - Algeria 1
EE - Estonia 1
GD - Grenada 1
GE - Georgia 1
HN - Honduras 1
HU - Ungheria 1
IS - Islanda 1
KW - Kuwait 1
KZ - Kazakistan 1
LA - Repubblica Popolare Democratica del Laos 1
LB - Libano 1
LK - Sri Lanka 1
NP - Nepal 1
PE - Perù 1
PH - Filippine 1
PR - Porto Rico 1
PS - Palestinian Territory 1
SV - El Salvador 1
TH - Thailandia 1
TW - Taiwan 1
XK - ???statistics.table.value.countryCode.XK??? 1
Totale 139.659
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Città #
Cagliari 113.837
Uta 11.594
Fairfield 959
Woodbridge 638
Chandler 616
Ashburn 582
Singapore 539
Houston 509
Ann Arbor 493
Seattle 390
Nyköping 386
Jacksonville 368
Boardman 366
Wilmington 364
Cambridge 348
Dallas 333
Beijing 214
Dearborn 151
Los Angeles 134
Nanjing 117
Santa Clara 110
Boston 100
Hefei 100
Shanghai 94
Helsinki 74
Buffalo 71
Seoul 66
San Diego 51
Milan 49
Guangzhou 45
New York 44
Ho Chi Minh City 43
Nanchang 43
Shenyang 39
Toronto 37
The Dalles 36
Hebei 33
Redwood City 33
Hanoi 30
Munich 28
São Paulo 28
Changsha 26
San Mateo 26
Jinan 25
Atlanta 24
Tokyo 24
Jiaxing 23
Tianjin 23
Zhengzhou 23
Brooklyn 21
Hong Kong 21
London 21
Redondo Beach 21
Verona 21
Wuhan 20
Brussels 19
Norwalk 19
Orange 19
Council Bluffs 18
Frankfurt am Main 17
Mountain View 17
Chicago 16
Warsaw 16
Ningbo 15
Ardabil 14
Auburn Hills 14
Augusta 14
Denver 14
Stockholm 14
Turku 14
Monmouth Junction 13
Montreal 13
Brasília 12
Columbus 12
Pune 12
Rio de Janeiro 12
Rome 12
Phoenix 11
Quartu Sant'elena 11
Sassari 11
Düsseldorf 10
Mumbai 10
Curitiba 9
Hangzhou 9
Orem 9
Ottawa 9
Padova 9
Belo Horizonte 8
Da Nang 8
Indiana 8
Poplar 8
Shenzhen 8
Baghdad 7
Centro 7
Lauterbourg 7
San Francisco 7
Assèmini 6
Dong Ket 6
Ferrara 6
Johannesburg 6
Totale 134.927
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Nome #
Clamp voltage and ideality factor in laser diodes 3.145
Photometric stereo for 3D mapping of carvings and relieves: case studies on prehistorical art in Sardinia 2.896
Recent improvements in photometric stereo for rock art 3D imaging 2.833
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna 2.803
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.387
ESD tests on 850 nm GaAs-based VCSELs 2.379
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre 2.366
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.328
Extended Modal Gain Measurement in DFB Laser Diodes 2.293
Side-Mode Excitation in Single-Mode Laser Diodes 2.211
Reliability issues in Optical Emitters 2.139
Further improvements of an extended Hakki-Paoli method 2.136
Practical optical gain by an extended Hakki-Paoli method 2.041
DC parameters for laser diodes from experimental curves 2.016
Reliability prediction and real world for LED lamps 1.944
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.924
External cavity ITLA degradation 1.924
The role of the optical trans-characteristics in laser diode analysis 1.859
FIB-induced electro-optical alterations in a DFB InP laser diode 1.831
“Hot-plugging” of led modules: electrical characterization and device degradation 1.817
Ideality factor and threshold voltage in laser diodes 1.777
XEBIC at the Dual Beam 1.760
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.703
An automated lifetest equipment for optical emitters 1.691
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.687
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.682
SEM Remote Control with a 3D option 1.662
Optical losses in single-mode laser diodes 1.624
High Brightness InGaN LEDs degradation at high injection current bias 1.560
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.555
Optical gain in laser diodes with null reflectivity 1.543
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.534
Implementation of TV-rate EBIC at a Dual BEam 1.492
null 1.457
Chip and package-related degradation of high power white LEDs 1.453
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1.432
Reliability of visible GaN LEDs in plastic package 1.378
A simpler method for life-testing laser diodes 1.376
Charge diffusion and reciprocity theorems: A direct approach to EBIC of ridge laser diodes 1.375
Degradation mechanisms of white LEDs for lighting applications 1.372
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.357
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.319
Improvements in automated Photometric Stereo 3D SEM 1.316
Peculiar failure mechanisms in GaN power transistors 1.291
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.265
Proton irradiation effects on commercial laser diodes 1.264
3D reconstruction of FIB microstructures from BSE images 1.263
Implementation of a "Design of experiments" methodology for the prediction of phototransistor degradation in a space environment 1.260
null 1.152
Faulty Failure Analyses 1.121
Failure Analysis of RuO2 Thick Film Chip Resistors 1.109
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy 1.083
3D Sculptures from SEM images 1.068
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy 1.043
Prediction of Phototransistor Spectral Responsivity Degradation in a Space Environment using DOE methodology 1.040
An original DoE-based tool for silicon photodetectors EoL estimation in space environments 1.037
Backside Failure Analysis of GaAs ICs after EDS tests 1.034
Failure modes and mechanisms of DC-aged GaN LEDs 1.032
Quantitative 3D reconstruction from BS imaging 1.016
Practical SEM 3D by BSE Photometric Stereo 1.014
Effects of BSE detector geometry on 3D SEM 1.009
Image Alignment for 3D reconstruction in a SEM 1.008
Accelerated Life Test of High Brightness Light Emitting Diodes 1.005
Process for recovering noble metals from electric and electronic wastes 974
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM 970
High brightness GaN LEDs degradation during DC and pulsed stress 942
Photometric stereo 3D visualizations of rock-art panels, bas-reliefs, and graffiti 927
High temperature electro-optical degradation of InGaN/GaN HBLEDs 916
Procedimento per il recupero di metalli nobili da rifiuti elettrici ed elettronici 914
Reliability predictions in electronic industrial applications 885
The rules of the Rue Morgue: a decade later 862
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 860
Optimized "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment 848
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 837
Identifying the lights position in photometric stereo under unknown lighting 833
A specimen-current branching approach for FA of long Electromigration test lines 817
Video Streaming in Electron Microscopy Applications 808
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 807
Analysis of GaN based high-power diode lasers after singular degradation events 800
Failure modes and mechanisms of DC-aged GaN LEDs 789
null 786
Failure analysis of RFIC Amplifiers 776
Technological Applications of New Reagents for Selective Gold Removal 758
Invenstigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs 753
Selective Au-etching on aged GaAs-based devices 738
Customized and highly reliable channel phototransistor array for aerospace optical encoders 726
Brightness InGaN LEDs degradation at high injection current bias 725
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 725
Sulfur-contamination of High Power White LEDs 721
Gold removal in failure analysis of GaAs-based laser diodes 703
Silicon phototransistor reliability assessment and new selection strategies for space applications 697
An Effective Method for Gold Dissolution in Microelectronic Devices Failure Analysis 679
Process for recovering noble metals from electric and electronic wastes 673
Selective Au Etching in Au/Al Bonds in Current IC Technology 663
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 649
Trapped mobile charges effects on electrooptical performances in silicon phototransistors for space applications 642
Laser Diode DC Measurement Protocols 628
Analysis of RFIC Amplifiers 622
Investigation on ESD-stressed GaN/InGaN- on-sapphire Blue LED 608
Electron microscopy of life-tested semiconductor laser diodes 575
Totale 131.127
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Categoria #
all - tutte 179.004
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 179.004
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202111.649 0 0 0 0 0 2.988 3.045 1.759 794 1.032 992 1.039
2021/20226.898 886 493 311 578 487 418 230 374 595 833 896 797
2022/202310.420 910 1.526 1.483 878 595 1.114 333 1.434 678 509 556 404
2023/202412.357 941 656 742 894 1.205 1.650 1.731 955 493 809 1.188 1.093
2024/202524.376 2.491 3.151 12.517 1.785 1.334 1.191 929 127 208 182 209 252
2025/20263.749 439 459 792 902 768 389 0 0 0 0 0 0
Totale 139.894