UNICA IRIS Institutional Research Information System

VANZI, MASSIMO
 Distribuzione geografica
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Continente #
EU - Europa 126.152
NA - Nord America 7.028
AS - Asia 1.055
SA - Sud America 35
AF - Africa 11
OC - Oceania 8
Continente sconosciuto - Info sul continente non disponibili 6
Totale 134.295
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Nazione #
IT - Italia 124.206
US - Stati Uniti d'America 6.962
CN - Cina 698
UA - Ucraina 694
SE - Svezia 524
SG - Singapore 249
GB - Regno Unito 181
FI - Finlandia 179
DE - Germania 176
FR - Francia 98
CA - Canada 63
IN - India 33
BR - Brasile 28
BE - Belgio 24
IR - Iran 17
KR - Corea 17
RU - Federazione Russa 15
NL - Olanda 12
ES - Italia 9
MU - Mauritius 9
VN - Vietnam 7
CZ - Repubblica Ceca 6
EU - Europa 6
IQ - Iraq 6
SI - Slovenia 6
AT - Austria 5
AU - Australia 5
JP - Giappone 5
BD - Bangladesh 3
HK - Hong Kong 3
IE - Irlanda 3
MX - Messico 3
MY - Malesia 3
NZ - Nuova Zelanda 3
PT - Portogallo 3
RO - Romania 3
CL - Cile 2
EC - Ecuador 2
ID - Indonesia 2
NO - Norvegia 2
TR - Turchia 2
AM - Armenia 1
AR - Argentina 1
BG - Bulgaria 1
CH - Svizzera 1
CO - Colombia 1
GE - Georgia 1
HU - Ungheria 1
IS - Islanda 1
KG - Kirghizistan 1
LT - Lituania 1
MA - Marocco 1
PH - Filippine 1
PK - Pakistan 1
PL - Polonia 1
QA - Qatar 1
SA - Arabia Saudita 1
TH - Thailandia 1
TW - Taiwan 1
UZ - Uzbekistan 1
VE - Venezuela 1
ZA - Sudafrica 1
Totale 134.295
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Città #
Cagliari 111.966
Uta 11.722
Fairfield 959
Woodbridge 638
Chandler 621
Houston 507
Ann Arbor 493
Ashburn 437
Nyköping 388
Seattle 388
Boardman 369
Jacksonville 367
Wilmington 364
Cambridge 348
Dearborn 151
Singapore 142
Nanjing 116
Santa Clara 101
Shanghai 93
Boston 92
Beijing 75
Helsinki 74
San Diego 51
Milan 43
Nanchang 43
Guangzhou 40
Shenyang 39
Hebei 33
Redwood City 33
Toronto 33
Los Angeles 31
San Mateo 26
Jinan 25
Changsha 24
Jiaxing 23
Verona 21
Zhengzhou 20
Brussels 19
Norwalk 19
Orange 19
New York 18
London 17
Mountain View 17
Wuhan 17
Tianjin 16
Ningbo 15
Ardabil 14
Auburn Hills 14
Augusta 13
Monmouth Junction 13
Pune 11
Quartu Sant'elena 11
Sassari 11
Atlanta 10
Hefei 10
Hangzhou 9
Ottawa 9
Padova 9
Rome 9
Indiana 8
Mumbai 8
Seoul 7
Assèmini 6
Centro 6
Dong Ket 6
Ferrara 6
Munich 6
Saint-pierre-de-lages 6
Shenzhen 6
Washington 6
Bologna 5
Fuzhou 5
Guasila 5
Kilburn 5
Kunming 5
Leawood 5
Austin 4
Duncan 4
Frascati 4
Redmond 4
Taizhou 4
Annemasse 3
Antwerpen 3
Borås 3
Bucharest 3
Calonne-ricouart 3
Decimomannu 3
Edinburgh 3
Frankfurt am Main 3
Genova 3
Hamburg 3
Melbourne 3
Minneapolis 3
Moscow 3
Ozieri 3
Qingdao 3
Rio de Janeiro 3
Simi Valley 3
Tertenìa 3
Tricase 3
Totale 131.374
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Nome #
Clamp voltage and ideality factor in laser diodes 3.070
Photometric stereo for 3D mapping of carvings and relieves: case studies on prehistorical art in Sardinia 2.825
Recent improvements in photometric stereo for rock art 3D imaging 2.765
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna 2.727
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.305
ESD tests on 850 nm GaAs-based VCSELs 2.305
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre 2.294
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.232
Extended Modal Gain Measurement in DFB Laser Diodes 2.228
Side-Mode Excitation in Single-Mode Laser Diodes 2.139
Reliability issues in Optical Emitters 2.091
Further improvements of an extended Hakki-Paoli method 2.065
Practical optical gain by an extended Hakki-Paoli method 1.971
DC parameters for laser diodes from experimental curves 1.943
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.888
Reliability prediction and real world for LED lamps 1.875
External cavity ITLA degradation 1.871
The role of the optical trans-characteristics in laser diode analysis 1.816
FIB-induced electro-optical alterations in a DFB InP laser diode 1.791
“Hot-plugging” of led modules: electrical characterization and device degradation 1.765
Ideality factor and threshold voltage in laser diodes 1.732
XEBIC at the Dual Beam 1.715
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.663
An automated lifetest equipment for optical emitters 1.640
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.611
SEM Remote Control with a 3D option 1.601
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.601
Optical losses in single-mode laser diodes 1.585
High Brightness InGaN LEDs degradation at high injection current bias 1.513
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.477
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.470
Optical gain in laser diodes with null reflectivity 1.469
null 1.457
Implementation of TV-rate EBIC at a Dual BEam 1.448
Chip and package-related degradation of high power white LEDs 1.414
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1.385
Degradation mechanisms of white LEDs for lighting applications 1.336
Charge diffusion and reciprocity theorems: A direct approach to EBIC of ridge laser diodes 1.320
Reliability of visible GaN LEDs in plastic package 1.316
A simpler method for life-testing laser diodes 1.308
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.305
Improvements in automated Photometric Stereo 3D SEM 1.281
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.281
null 1.225
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.224
3D reconstruction of FIB microstructures from BSE images 1.218
Implementation of a "Design of experiments" methodology for the prediction of phototransistor degradation in a space environment 1.203
Peculiar failure mechanisms in GaN power transistors 1.196
null 1.152
Faulty Failure Analyses 1.078
Failure Analysis of RuO2 Thick Film Chip Resistors 1.052
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy 1.032
3D Sculptures from SEM images 1.032
An original DoE-based tool for silicon photodetectors EoL estimation in space environments 1.007
Prediction of Phototransistor Spectral Responsivity Degradation in a Space Environment using DOE methodology 1.004
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy 1.002
Backside Failure Analysis of GaAs ICs after EDS tests 998
Failure modes and mechanisms of DC-aged GaN LEDs 980
Quantitative 3D reconstruction from BS imaging 973
Effects of BSE detector geometry on 3D SEM 967
Practical SEM 3D by BSE Photometric Stereo 967
Image Alignment for 3D reconstruction in a SEM 966
Accelerated Life Test of High Brightness Light Emitting Diodes 939
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM 935
High brightness GaN LEDs degradation during DC and pulsed stress 898
Process for recovering noble metals from electric and electronic wastes 860
High temperature electro-optical degradation of InGaN/GaN HBLEDs 856
Reliability predictions in electronic industrial applications 851
Photometric stereo 3D visualizations of rock-art panels, bas-reliefs, and graffiti 850
The rules of the Rue Morgue: a decade later 821
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 810
Optimized "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment 806
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 800
Procedimento per il recupero di metalli nobili da rifiuti elettrici ed elettronici 799
null 786
A specimen-current branching approach for FA of long Electromigration test lines 782
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 774
Video Streaming in Electron Microscopy Applications 756
Identifying the lights position in photometric stereo under unknown lighting 752
Failure modes and mechanisms of DC-aged GaN LEDs 741
Failure analysis of RFIC Amplifiers 732
Analysis of GaN based high-power diode lasers after singular degradation events 728
Invenstigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs 717
Technological Applications of New Reagents for Selective Gold Removal 716
Selective Au-etching on aged GaAs-based devices 696
Sulfur-contamination of High Power White LEDs 694
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 688
Customized and highly reliable channel phototransistor array for aerospace optical encoders 687
Brightness InGaN LEDs degradation at high injection current bias 679
Gold removal in failure analysis of GaAs-based laser diodes 663
Silicon phototransistor reliability assessment and new selection strategies for space applications 655
An Effective Method for Gold Dissolution in Microelectronic Devices Failure Analysis 632
Selective Au Etching in Au/Al Bonds in Current IC Technology 628
Process for recovering noble metals from electric and electronic wastes 618
Trapped mobile charges effects on electrooptical performances in silicon phototransistors for space applications 606
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 597
Analysis of RFIC Amplifiers 579
Investigation on ESD-stressed GaN/InGaN- on-sapphire Blue LED 570
Laser Diode DC Measurement Protocols 547
Proton irradiation effects on commercial laser diodes 538
Totale 125.956
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Categoria #
all - tutte 165.193
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 165.193
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202012.847 0 0 0 0 0 5.135 2.832 1.432 723 645 719 1.361
2020/202129.948 1.338 1.195 1.425 7.969 6.372 2.988 3.045 1.759 794 1.032 992 1.039
2021/20226.898 886 493 311 578 487 418 230 374 595 833 896 797
2022/202310.477 910 1.526 1.483 881 596 1.128 335 1.441 689 516 567 405
2023/202412.524 960 667 746 905 1.224 1.677 1.763 966 501 814 1.196 1.105
2024/202522.534 2.520 3.177 12.719 1.808 1.350 960 0 0 0 0 0 0
Totale 134.527