UNICA IRIS Institutional Research Information System

VANZI, MASSIMO
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
EU - Europa 129.132
NA - Nord America 10.223
AS - Asia 3.579
SA - Sud America 553
Continente sconosciuto - Info sul continente non disponibili 240
AF - Africa 75
OC - Oceania 8
Totale 143.810
Salva come PNG Salva come JPEG
Nazione #
IT - Italia 126.698
US - Stati Uniti d'America 10.009
SG - Singapore 1.373
CN - Cina 1.329
UA - Ucraina 698
SE - Svezia 573
BR - Brasile 429
VN - Vietnam 290
FI - Finlandia 260
DE - Germania 248
GB - Regno Unito 240
FR - Francia 230
CA - Canada 122
HK - Hong Kong 106
IN - India 81
KR - Corea 76
BD - Bangladesh 63
AR - Argentina 60
IQ - Iraq 51
JP - Giappone 37
RU - Federazione Russa 35
MX - Messico 30
BE - Belgio 24
TR - Turchia 23
ES - Italia 22
IR - Iran 20
NL - Olanda 20
EC - Ecuador 19
MA - Marocco 19
PL - Polonia 19
PH - Filippine 16
ID - Indonesia 15
PK - Pakistan 15
ZA - Sudafrica 15
CO - Colombia 14
JM - Giamaica 13
MU - Mauritius 11
MY - Malesia 10
SA - Arabia Saudita 10
CL - Cile 8
HN - Honduras 8
PY - Paraguay 8
AT - Austria 7
CR - Costa Rica 7
IE - Irlanda 7
TN - Tunisia 7
VE - Venezuela 7
AZ - Azerbaigian 6
CH - Svizzera 6
CZ - Repubblica Ceca 6
EU - Europa 6
KE - Kenya 6
PR - Porto Rico 6
SI - Slovenia 6
UY - Uruguay 6
UZ - Uzbekistan 6
ET - Etiopia 5
IL - Israele 5
JO - Giordania 5
LT - Lituania 5
AE - Emirati Arabi Uniti 4
AU - Australia 4
EG - Egitto 4
HU - Ungheria 4
KG - Kirghizistan 4
NZ - Nuova Zelanda 4
RO - Romania 4
TT - Trinidad e Tobago 4
AL - Albania 3
AM - Armenia 3
BB - Barbados 3
DZ - Algeria 3
GT - Guatemala 3
KZ - Kazakistan 3
NP - Nepal 3
PA - Panama 3
PS - Palestinian Territory 3
PT - Portogallo 3
QA - Qatar 3
SV - El Salvador 3
TW - Taiwan 3
BG - Bulgaria 2
BH - Bahrain 2
BN - Brunei Darussalam 2
BO - Bolivia 2
DO - Repubblica Dominicana 2
GD - Grenada 2
GE - Georgia 2
GP - Guadalupe 2
KW - Kuwait 2
MD - Moldavia 2
MK - Macedonia 2
NI - Nicaragua 2
NO - Norvegia 2
TH - Thailandia 2
TJ - Tagikistan 2
AG - Antigua e Barbuda 1
AO - Angola 1
BA - Bosnia-Erzegovina 1
BF - Burkina Faso 1
Totale 143.561
Salva come PNG Salva come JPEG
Città #
Cagliari 114.741
Uta 11.371
Ashburn 1.015
Fairfield 948
Singapore 716
Woodbridge 633
Chandler 604
Houston 509
Ann Arbor 492
San Jose 472
Seattle 388
Nyköping 378
Jacksonville 369
Boardman 361
Wilmington 359
Dallas 353
Cambridge 344
Beijing 220
Los Angeles 181
Dearborn 151
Santa Clara 143
Helsinki 140
Council Bluffs 122
Nanjing 118
Lauterbourg 113
Boston 101
Shanghai 101
Hefei 100
Hong Kong 96
The Dalles 91
Ho Chi Minh City 88
New York 83
Buffalo 72
Hanoi 71
Seoul 66
Milan 56
San Diego 51
Toronto 48
Guangzhou 46
São Paulo 45
Nanchang 43
Shenyang 38
Chicago 36
Atlanta 33
Hebei 33
Columbus 32
Frankfurt am Main 32
Redwood City 32
Tokyo 32
Orem 31
Brooklyn 29
Changsha 27
San Mateo 27
Munich 26
Phoenix 26
Zhengzhou 25
Jinan 24
London 24
Jiaxing 23
Tianjin 23
Princeton 22
Redondo Beach 21
Verona 21
Wuhan 21
Brussels 19
Denver 19
Orange 19
Norwalk 18
Baghdad 17
Da Nang 17
Montreal 17
Mountain View 17
Warsaw 16
Mumbai 15
Ningbo 15
Rome 15
Ardabil 14
Auburn Hills 14
Augusta 14
Rio de Janeiro 14
Turku 14
Brasília 13
Manchester 13
Monmouth Junction 13
Pune 13
San Francisco 13
Stockholm 12
Haiphong 11
Hangzhou 11
Quartu Sant'elena 11
Sassari 11
Düsseldorf 10
Amsterdam 9
Curitiba 9
Ferrara 9
Mexico City 9
Ottawa 9
Padova 9
Shenzhen 9
Washington 9
Totale 137.514
Salva come PNG Salva come JPEG
Nome #
Clamp voltage and ideality factor in laser diodes 3.187
Photometric stereo for 3D mapping of carvings and relieves: case studies on prehistorical art in Sardinia 3.017
Recent improvements in photometric stereo for rock art 3D imaging 2.891
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna 2.891
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.452
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre 2.449
ESD tests on 850 nm GaAs-based VCSELs 2.438
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.390
Extended Modal Gain Measurement in DFB Laser Diodes 2.360
Side-Mode Excitation in Single-Mode Laser Diodes 2.267
Further improvements of an extended Hakki-Paoli method 2.198
Reliability issues in Optical Emitters 2.190
Practical optical gain by an extended Hakki-Paoli method 2.100
DC parameters for laser diodes from experimental curves 2.066
Reliability prediction and real world for LED lamps 1.990
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.978
External cavity ITLA degradation 1.970
The role of the optical trans-characteristics in laser diode analysis 1.899
FIB-induced electro-optical alterations in a DFB InP laser diode 1.876
“Hot-plugging” of led modules: electrical characterization and device degradation 1.850
Ideality factor and threshold voltage in laser diodes 1.831
XEBIC at the Dual Beam 1.806
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.754
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.744
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.743
An automated lifetest equipment for optical emitters 1.738
SEM Remote Control with a 3D option 1.711
Optical losses in single-mode laser diodes 1.661
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.618
High Brightness InGaN LEDs degradation at high injection current bias 1.605
Optical gain in laser diodes with null reflectivity 1.603
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.582
Implementation of TV-rate EBIC at a Dual BEam 1.540
Chip and package-related degradation of high power white LEDs 1.507
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1.485
A simpler method for life-testing laser diodes 1.434
Degradation mechanisms of white LEDs for lighting applications 1.426
Charge diffusion and reciprocity theorems: A direct approach to EBIC of ridge laser diodes 1.426
Reliability of visible GaN LEDs in plastic package 1.424
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.399
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.372
Improvements in automated Photometric Stereo 3D SEM 1.360
Peculiar failure mechanisms in GaN power transistors 1.351
Proton irradiation effects on commercial laser diodes 1.337
3D reconstruction of FIB microstructures from BSE images 1.321
Implementation of a "Design of experiments" methodology for the prediction of phototransistor degradation in a space environment 1.311
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.304
Photometric stereo 3D visualizations of rock-art panels, bas-reliefs, and graffiti 1.173
Faulty Failure Analyses 1.163
Failure Analysis of RuO2 Thick Film Chip Resistors 1.159
null 1.152
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy 1.130
Prediction of Phototransistor Spectral Responsivity Degradation in a Space Environment using DOE methodology 1.123
3D Sculptures from SEM images 1.114
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy 1.102
An original DoE-based tool for silicon photodetectors EoL estimation in space environments 1.097
Backside Failure Analysis of GaAs ICs after EDS tests 1.082
Failure modes and mechanisms of DC-aged GaN LEDs 1.082
Effects of BSE detector geometry on 3D SEM 1.070
Practical SEM 3D by BSE Photometric Stereo 1.069
Accelerated Life Test of High Brightness Light Emitting Diodes 1.060
Quantitative 3D reconstruction from BS imaging 1.059
Image Alignment for 3D reconstruction in a SEM 1.049
Process for recovering noble metals from electric and electronic wastes 1.046
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM 1.010
Procedimento per il recupero di metalli nobili da rifiuti elettrici ed elettronici 989
High brightness GaN LEDs degradation during DC and pulsed stress 983
High temperature electro-optical degradation of InGaN/GaN HBLEDs 964
Reliability predictions in electronic industrial applications 927
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 915
Optimized "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment 909
The rules of the Rue Morgue: a decade later 909
Identifying the lights position in photometric stereo under unknown lighting 904
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 880
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 862
A specimen-current branching approach for FA of long Electromigration test lines 856
Video Streaming in Electron Microscopy Applications 852
Failure modes and mechanisms of DC-aged GaN LEDs 838
Failure analysis of RFIC Amplifiers 830
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 807
Invenstigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs 801
Technological Applications of New Reagents for Selective Gold Removal 798
null 786
Brightness InGaN LEDs degradation at high injection current bias 785
Customized and highly reliable channel phototransistor array for aerospace optical encoders 775
Sulfur-contamination of High Power White LEDs 769
Selective Au-etching on aged GaAs-based devices 768
Silicon phototransistor reliability assessment and new selection strategies for space applications 742
Gold removal in failure analysis of GaAs-based laser diodes 737
Process for recovering noble metals from electric and electronic wastes 727
An Effective Method for Gold Dissolution in Microelectronic Devices Failure Analysis 726
Laser diode DC measurement protocols 706
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 699
Selective Au Etching in Au/Al Bonds in Current IC Technology 696
Trapped mobile charges effects on electrooptical performances in silicon phototransistors for space applications 679
Analysis of RFIC Amplifiers 679
Investigation on ESD-stressed GaN/InGaN- on-sapphire Blue LED 653
Electron microscopy of life-tested semiconductor laser diodes 622
A different approach to the analysis of data in life-tests of laser diodes 604
Early signatures for REDR-based laser degradations 601
Totale 135.370
Salva come PNG Salva come JPEG
Categoria #
all - tutte 190.816
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 190.816
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20224.581 0 0 0 0 482 410 228 371 585 822 893 790
2022/202310.234 890 1.492 1.445 864 589 1.100 331 1.415 661 501 547 399
2023/202412.209 933 651 735 887 1.191 1.627 1.706 945 489 802 1.172 1.071
2024/202523.951 2.463 3.090 12.288 1.757 1.307 1.166 914 125 206 181 205 249
2025/20268.129 432 453 788 891 762 422 1.250 1.154 313 798 638 228
2026/20271.752 98 388 641 548 77 0 0 0 0 0 0 0
Totale 143.810