UNICA IRIS Institutional Research Information System

VANZI, MASSIMO
 Distribuzione geografica
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Continente #
EU - Europa 128.104
NA - Nord America 8.715
AS - Asia 3.523
SA - Sud America 526
AF - Africa 74
OC - Oceania 8
Continente sconosciuto - Info sul continente non disponibili 7
Totale 140.957
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Nazione #
IT - Italia 125.704
US - Stati Uniti d'America 8.582
SG - Singapore 1.364
CN - Cina 1.319
UA - Ucraina 697
SE - Svezia 564
BR - Brasile 406
VN - Vietnam 289
FI - Finlandia 260
DE - Germania 242
GB - Regno Unito 231
FR - Francia 229
HK - Hong Kong 104
CA - Canada 88
IN - India 80
KR - Corea 76
AR - Argentina 57
IQ - Iraq 51
BD - Bangladesh 35
JP - Giappone 35
RU - Federazione Russa 32
MX - Messico 28
BE - Belgio 24
TR - Turchia 23
ES - Italia 22
IR - Iran 20
EC - Ecuador 19
MA - Marocco 19
NL - Olanda 19
PL - Polonia 18
PH - Filippine 16
ID - Indonesia 15
PK - Pakistan 15
ZA - Sudafrica 15
CO - Colombia 13
MU - Mauritius 11
MY - Malesia 10
SA - Arabia Saudita 10
CL - Cile 8
PY - Paraguay 8
AT - Austria 7
IE - Irlanda 7
TN - Tunisia 7
VE - Venezuela 7
AZ - Azerbaigian 6
CZ - Repubblica Ceca 6
EU - Europa 6
KE - Kenya 6
SI - Slovenia 6
UY - Uruguay 6
UZ - Uzbekistan 6
CH - Svizzera 5
ET - Etiopia 5
JO - Giordania 5
LT - Lituania 5
AE - Emirati Arabi Uniti 4
AU - Australia 4
EG - Egitto 4
HU - Ungheria 4
IL - Israele 4
KG - Kirghizistan 4
NZ - Nuova Zelanda 4
RO - Romania 4
AL - Albania 3
AM - Armenia 3
DZ - Algeria 3
JM - Giamaica 3
KZ - Kazakistan 3
NP - Nepal 3
PA - Panama 3
PR - Porto Rico 3
PS - Palestinian Territory 3
PT - Portogallo 3
QA - Qatar 3
BG - Bulgaria 2
BH - Bahrain 2
BN - Brunei Darussalam 2
BO - Bolivia 2
DO - Repubblica Dominicana 2
KW - Kuwait 2
MK - Macedonia 2
NO - Norvegia 2
TH - Thailandia 2
TJ - Tagikistan 2
TT - Trinidad e Tobago 2
TW - Taiwan 2
AO - Angola 1
BA - Bosnia-Erzegovina 1
BF - Burkina Faso 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
CY - Cipro 1
DK - Danimarca 1
EE - Estonia 1
GD - Grenada 1
GE - Georgia 1
HN - Honduras 1
HR - Croazia 1
IS - Islanda 1
LA - Repubblica Popolare Democratica del Laos 1
Totale 140.951
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Città #
Cagliari 113.798
Uta 11.371
Fairfield 948
Singapore 709
Ashburn 657
Woodbridge 632
Chandler 603
Houston 506
Ann Arbor 492
Seattle 388
Nyköping 378
Jacksonville 366
Boardman 361
Wilmington 359
San Jose 354
Cambridge 344
Dallas 335
Beijing 215
Los Angeles 164
Dearborn 151
Helsinki 140
Nanjing 118
Santa Clara 115
Lauterbourg 113
Boston 100
Hefei 100
Shanghai 99
Hong Kong 94
The Dalles 90
Ho Chi Minh City 88
Buffalo 71
Hanoi 71
Seoul 66
Milan 50
New York 50
San Diego 49
Guangzhou 46
Nanchang 43
Shenyang 38
Toronto 35
Hebei 33
Frankfurt am Main 32
Redwood City 32
São Paulo 31
Tokyo 31
Orem 30
Changsha 27
Munich 26
San Mateo 26
Zhengzhou 25
Atlanta 24
Jinan 24
Jiaxing 23
London 23
Tianjin 23
Brooklyn 22
Council Bluffs 22
Chicago 21
Redondo Beach 21
Verona 21
Wuhan 21
Brussels 19
Orange 19
Norwalk 18
Baghdad 17
Da Nang 17
Mountain View 17
Warsaw 16
Denver 15
Mumbai 15
Ningbo 15
Ardabil 14
Auburn Hills 14
Augusta 14
Phoenix 14
Rio de Janeiro 14
Turku 14
Monmouth Junction 13
Montreal 13
Pune 13
Brasília 12
Columbus 12
Manchester 12
Rome 12
Stockholm 12
Haiphong 11
Hangzhou 11
Quartu Sant'elena 11
Sassari 11
Düsseldorf 10
Curitiba 9
Ottawa 9
Padova 9
San Francisco 9
Shenzhen 9
Amsterdam 8
Belo Horizonte 8
Indiana 8
Mexico City 8
Poplar 8
Totale 135.735
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Nome #
Clamp voltage and ideality factor in laser diodes 3.170
Photometric stereo for 3D mapping of carvings and relieves: case studies on prehistorical art in Sardinia 2.939
Recent improvements in photometric stereo for rock art 3D imaging 2.878
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna 2.834
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.420
ESD tests on 850 nm GaAs-based VCSELs 2.413
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre 2.412
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.367
Extended Modal Gain Measurement in DFB Laser Diodes 2.335
Side-Mode Excitation in Single-Mode Laser Diodes 2.248
Further improvements of an extended Hakki-Paoli method 2.176
Reliability issues in Optical Emitters 2.169
Practical optical gain by an extended Hakki-Paoli method 2.075
DC parameters for laser diodes from experimental curves 2.052
Reliability prediction and real world for LED lamps 1.970
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.954
External cavity ITLA degradation 1.949
The role of the optical trans-characteristics in laser diode analysis 1.882
FIB-induced electro-optical alterations in a DFB InP laser diode 1.851
“Hot-plugging” of led modules: electrical characterization and device degradation 1.833
Ideality factor and threshold voltage in laser diodes 1.811
XEBIC at the Dual Beam 1.790
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.738
An automated lifetest equipment for optical emitters 1.723
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.720
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.718
SEM Remote Control with a 3D option 1.697
Optical losses in single-mode laser diodes 1.649
High Brightness InGaN LEDs degradation at high injection current bias 1.589
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.589
Optical gain in laser diodes with null reflectivity 1.585
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.561
Implementation of TV-rate EBIC at a Dual BEam 1.520
Chip and package-related degradation of high power white LEDs 1.488
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1.464
A simpler method for life-testing laser diodes 1.417
Charge diffusion and reciprocity theorems: A direct approach to EBIC of ridge laser diodes 1.408
Reliability of visible GaN LEDs in plastic package 1.404
Degradation mechanisms of white LEDs for lighting applications 1.403
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.383
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.352
Improvements in automated Photometric Stereo 3D SEM 1.345
Peculiar failure mechanisms in GaN power transistors 1.330
Proton irradiation effects on commercial laser diodes 1.312
3D reconstruction of FIB microstructures from BSE images 1.293
Implementation of a "Design of experiments" methodology for the prediction of phototransistor degradation in a space environment 1.289
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.285
null 1.152
Faulty Failure Analyses 1.143
Failure Analysis of RuO2 Thick Film Chip Resistors 1.139
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy 1.114
3D Sculptures from SEM images 1.098
An original DoE-based tool for silicon photodetectors EoL estimation in space environments 1.077
Prediction of Phototransistor Spectral Responsivity Degradation in a Space Environment using DOE methodology 1.075
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy 1.074
Backside Failure Analysis of GaAs ICs after EDS tests 1.068
Failure modes and mechanisms of DC-aged GaN LEDs 1.065
Effects of BSE detector geometry on 3D SEM 1.047
Quantitative 3D reconstruction from BS imaging 1.044
Accelerated Life Test of High Brightness Light Emitting Diodes 1.042
Practical SEM 3D by BSE Photometric Stereo 1.040
Image Alignment for 3D reconstruction in a SEM 1.034
Process for recovering noble metals from electric and electronic wastes 1.003
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM 995
High brightness GaN LEDs degradation during DC and pulsed stress 972
Photometric stereo 3D visualizations of rock-art panels, bas-reliefs, and graffiti 969
High temperature electro-optical degradation of InGaN/GaN HBLEDs 948
Procedimento per il recupero di metalli nobili da rifiuti elettrici ed elettronici 945
Reliability predictions in electronic industrial applications 913
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 898
The rules of the Rue Morgue: a decade later 897
Optimized "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment 871
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 871
Identifying the lights position in photometric stereo under unknown lighting 871
A specimen-current branching approach for FA of long Electromigration test lines 847
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 839
Video Streaming in Electron Microscopy Applications 839
Failure modes and mechanisms of DC-aged GaN LEDs 824
Failure analysis of RFIC Amplifiers 809
null 786
Invenstigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs 782
Technological Applications of New Reagents for Selective Gold Removal 781
Selective Au-etching on aged GaAs-based devices 759
Customized and highly reliable channel phototransistor array for aerospace optical encoders 757
Sulfur-contamination of High Power White LEDs 755
Brightness InGaN LEDs degradation at high injection current bias 754
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 752
Silicon phototransistor reliability assessment and new selection strategies for space applications 726
Gold removal in failure analysis of GaAs-based laser diodes 726
Process for recovering noble metals from electric and electronic wastes 707
An Effective Method for Gold Dissolution in Microelectronic Devices Failure Analysis 703
Laser diode DC measurement protocols 688
Selective Au Etching in Au/Al Bonds in Current IC Technology 682
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 679
Trapped mobile charges effects on electrooptical performances in silicon phototransistors for space applications 665
Analysis of RFIC Amplifiers 657
Investigation on ESD-stressed GaN/InGaN- on-sapphire Blue LED 634
Electron microscopy of life-tested semiconductor laser diodes 604
A different approach to the analysis of data in life-tests of laser diodes 590
Early signatures for REDR-based laser degradations 585
Totale 133.085
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Categoria #
all - tutte 181.225
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 181.225
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20213.008 0 0 0 0 0 0 0 0 0 1.011 980 1.017
2021/20226.813 875 484 306 567 482 410 228 371 585 822 893 790
2022/202310.234 890 1.492 1.445 864 589 1.100 331 1.415 661 501 547 399
2023/202412.209 933 651 735 887 1.191 1.627 1.706 945 489 802 1.172 1.071
2024/202523.951 2.463 3.090 12.288 1.757 1.307 1.166 914 125 206 181 205 249
2025/20267.260 432 453 788 891 762 422 1.250 1.154 313 795 0 0
Totale 141.189