UNICA IRIS Institutional Research Information System

VANZI, MASSIMO
 Distribuzione geografica
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Continente #
EU - Europa 123.504
NA - Nord America 6.899
AS - Asia 983
AF - Africa 9
OC - Oceania 8
Continente sconosciuto - Info sul continente non disponibili 6
SA - Sud America 3
Totale 131.412
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Nazione #
IT - Italia 121.578
US - Stati Uniti d'America 6.834
CN - Cina 697
UA - Ucraina 693
SE - Svezia 523
SG - Singapore 195
GB - Regno Unito 181
FI - Finlandia 178
DE - Germania 168
FR - Francia 98
CA - Canada 62
IN - India 33
BE - Belgio 23
IR - Iran 17
KR - Corea 17
RU - Federazione Russa 13
NL - Olanda 10
ES - Italia 9
MU - Mauritius 9
VN - Vietnam 7
CZ - Repubblica Ceca 6
EU - Europa 6
SI - Slovenia 6
AU - Australia 5
JP - Giappone 5
AT - Austria 4
IQ - Iraq 4
IE - Irlanda 3
MX - Messico 3
MY - Malesia 3
NZ - Nuova Zelanda 3
PT - Portogallo 3
RO - Romania 3
CL - Cile 2
ID - Indonesia 2
BG - Bulgaria 1
CH - Svizzera 1
CO - Colombia 1
HK - Hong Kong 1
LT - Lituania 1
NO - Norvegia 1
PL - Polonia 1
TR - Turchia 1
TW - Taiwan 1
Totale 131.412
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Città #
Cagliari 109.340
Uta 11.722
Fairfield 959
Woodbridge 638
Chandler 621
Houston 507
Ann Arbor 493
Ashburn 429
Nyköping 388
Seattle 388
Boardman 369
Jacksonville 367
Wilmington 364
Cambridge 348
Dearborn 151
Singapore 117
Nanjing 116
Shanghai 93
Boston 92
Beijing 75
Helsinki 73
San Diego 51
Nanchang 43
Milan 41
Guangzhou 40
Shenyang 39
Hebei 33
Redwood City 33
Toronto 33
Los Angeles 29
San Mateo 26
Jinan 25
Changsha 24
Jiaxing 23
Verona 21
Zhengzhou 20
Norwalk 19
Orange 19
Brussels 18
New York 18
London 17
Mountain View 17
Wuhan 17
Tianjin 16
Ningbo 15
Ardabil 14
Auburn Hills 14
Augusta 13
Monmouth Junction 13
Pune 11
Quartu Sant'elena 11
Sassari 11
Atlanta 10
Hefei 10
Hangzhou 9
Padova 9
Rome 9
Indiana 8
Mumbai 8
Ottawa 8
Seoul 7
Assèmini 6
Centro 6
Dong Ket 6
Ferrara 6
Saint-pierre-de-lages 6
Shenzhen 6
Washington 6
Bologna 5
Fuzhou 5
Guasila 5
Kilburn 5
Kunming 5
Leawood 5
Austin 4
Duncan 4
Frascati 4
Redmond 4
Taizhou 4
Annemasse 3
Antwerpen 3
Borås 3
Bucharest 3
Calonne-ricouart 3
Decimomannu 3
Edinburgh 3
Genova 3
Hamburg 3
Melbourne 3
Minneapolis 3
Ozieri 3
Qingdao 3
Simi Valley 3
Tertenìa 3
Tricase 3
Valenciennes 3
Alcalá De Henares 2
Aversa 2
Baden bei Wien 2
Barcelona 2
Totale 128.603
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Nome #
Clamp voltage and ideality factor in laser diodes 3.019
Photometric stereo for 3D mapping of carvings and relieves: case studies on prehistorical art in Sardinia 2.765
Recent improvements in photometric stereo for rock art 3D imaging 2.720
Nuovi sviluppi nelle tecniche di stereofotometria 3D di incisioni e rilievi. Applicazioni nella tomba XV di Sos Furrighesos, Sardegna 2.675
Rilievo 3D non a contatto: tecniche speciali per l'arte rupestre 2.261
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.258
ESD tests on 850 nm GaAs-based VCSELs 2.246
Extended Modal Gain Measurement in DFB Laser Diodes 2.195
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.152
Side-Mode Excitation in Single-Mode Laser Diodes 2.086
Reliability issues in Optical Emitters 2.052
Further improvements of an extended Hakki-Paoli method 2.018
Practical optical gain by an extended Hakki-Paoli method 1.931
DC parameters for laser diodes from experimental curves 1.903
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.866
Reliability prediction and real world for LED lamps 1.830
External cavity ITLA degradation 1.807
The role of the optical trans-characteristics in laser diode analysis 1.779
FIB-induced electro-optical alterations in a DFB InP laser diode 1.752
“Hot-plugging” of led modules: electrical characterization and device degradation 1.718
Ideality factor and threshold voltage in laser diodes 1.700
XEBIC at the Dual Beam 1.695
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.634
An automated lifetest equipment for optical emitters 1.619
SEM Remote Control with a 3D option 1.586
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.580
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.568
Optical losses in single-mode laser diodes 1.547
High Brightness InGaN LEDs degradation at high injection current bias 1.498
null 1.457
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.448
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.429
Implementation of TV-rate EBIC at a Dual BEam 1.423
Optical gain in laser diodes with null reflectivity 1.421
Chip and package-related degradation of high power white LEDs 1.377
Application of Photometric Stereo in the optical field and Scanning Electron Microscopy. Physical sculptures from Archaeology to Microelectronics 1.376
Degradation mechanisms of white LEDs for lighting applications 1.316
Reliability of visible GaN LEDs in plastic package 1.307
Charge diffusion and reciprocity theorems: A direct approach to EBIC of ridge laser diodes 1.300
A simpler method for life-testing laser diodes 1.285
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.282
Improvements in automated Photometric Stereo 3D SEM 1.273
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.260
null 1.225
3D reconstruction of FIB microstructures from BSE images 1.195
Implementation of a "Design of experiments" methodology for the prediction of phototransistor degradation in a space environment 1.187
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.184
Peculiar failure mechanisms in GaN power transistors 1.159
null 1.152
Faulty Failure Analyses 1.064
Failure Analysis of RuO2 Thick Film Chip Resistors 1.038
An Automatic Alignment Procedure for a Four-Source Photometric Stereo Technique Applied to Scanning Electron Microscopy 1.018
3D Sculptures from SEM images 1.016
An Automatic Alignment Procedure for a 4-Source Photometric Stereo Technique applied to Scanning Electron Microscopy 992
An original DoE-based tool for silicon photodetectors EoL estimation in space environments 980
Prediction of Phototransistor Spectral Responsivity Degradation in a Space Environment using DOE methodology 974
Backside Failure Analysis of GaAs ICs after EDS tests 970
Quantitative 3D reconstruction from BS imaging 962
Effects of BSE detector geometry on 3D SEM 958
Practical SEM 3D by BSE Photometric Stereo 958
Image Alignment for 3D reconstruction in a SEM 950
Failure modes and mechanisms of DC-aged GaN LEDs 923
3D reconstruction of FIB microstructures by Photometric Stereo at the SEM 915
High brightness GaN LEDs degradation during DC and pulsed stress 889
Accelerated Life Test of High Brightness Light Emitting Diodes 877
Process for recovering noble metals from electric and electronic wastes 848
Reliability predictions in electronic industrial applications 828
High temperature electro-optical degradation of InGaN/GaN HBLEDs 814
The rules of the Rue Morgue: a decade later 802
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 791
Failure Analysis-assisted FMEA 780
Optimized "Design of Experiments" Methodology for the Prediction of Phototransistor Degradation in a Space Environment 779
A specimen-current branching approach for FA of long Electromigration test lines 771
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 771
Procedimento per il recupero di metalli nobili da rifiuti elettrici ed elettronici 766
Photometric stereo 3D visualizations of rock-art panels, bas-reliefs, and graffiti 760
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 750
Video Streaming in Electron Microscopy Applications 745
Failure modes and mechanisms of DC-aged GaN LEDs 720
Identifying the lights position in photometric stereo under unknown lighting 715
Failure analysis of RFIC Amplifiers 714
Technological Applications of New Reagents for Selective Gold Removal 712
Invenstigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs 709
Selective Au-etching on aged GaAs-based devices 690
Sulfur-contamination of High Power White LEDs 680
Customized and highly reliable channel phototransistor array for aerospace optical encoders 677
Analysis of GaN based high-power diode lasers after singular degradation events 669
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 666
Brightness InGaN LEDs degradation at high injection current bias 658
Gold removal in failure analysis of GaAs-based laser diodes 654
Silicon phototransistor reliability assessment and new selection strategies for space applications 646
Selective Au Etching in Au/Al Bonds in Current IC Technology 623
An Effective Method for Gold Dissolution in Microelectronic Devices Failure Analysis 617
Process for recovering noble metals from electric and electronic wastes 612
Trapped mobile charges effects on electrooptical performances in silicon phototransistors for space applications 599
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 584
Investigation on ESD-stressed GaN/InGaN- on-sapphire Blue LED 565
Analysis of RFIC Amplifiers 557
Electron microscopy of life-tested semiconductor laser diodes 527
null 522
Totale 123.321
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Categoria #
all - tutte 160.573
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 160.573
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202020.862 0 0 0 587 7.428 5.135 2.832 1.432 723 645 719 1.361
2020/202129.948 1.338 1.195 1.425 7.969 6.372 2.988 3.045 1.759 794 1.032 992 1.039
2021/20226.898 886 493 311 578 487 418 230 374 595 833 896 797
2022/202310.477 910 1.526 1.483 881 596 1.128 335 1.441 689 516 567 405
2023/202412.524 960 667 746 905 1.224 1.677 1.763 966 501 814 1.196 1.105
2024/202519.646 2.520 3.177 12.719 1.230 0 0 0 0 0 0 0 0
Totale 131.639