UNICA IRIS Institutional Research Information System

MURA, GIOVANNA
 Distribuzione geografica
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Continente #
EU - Europa 97.121
NA - Nord America 5.327
AS - Asia 703
SA - Sud America 25
OC - Oceania 9
Continente sconosciuto - Info sul continente non disponibili 7
AF - Africa 6
Totale 103.198
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Nazione #
IT - Italia 95.928
US - Stati Uniti d'America 5.278
CN - Cina 441
UA - Ucraina 416
SE - Svezia 340
SG - Singapore 182
DE - Germania 125
FI - Finlandia 108
GB - Regno Unito 98
CA - Canada 47
FR - Francia 42
BR - Brasile 23
IN - India 23
IR - Iran 17
BE - Belgio 13
IE - Irlanda 13
MY - Malesia 10
KR - Corea 9
NL - Olanda 9
RU - Federazione Russa 9
ES - Italia 8
EU - Europa 7
CZ - Repubblica Ceca 5
NZ - Nuova Zelanda 5
AU - Australia 4
BD - Bangladesh 4
IQ - Iraq 4
GR - Grecia 3
HK - Hong Kong 3
TW - Taiwan 3
JP - Giappone 2
MU - Mauritius 2
MX - Messico 2
AT - Austria 1
CH - Svizzera 1
DZ - Algeria 1
EC - Ecuador 1
EE - Estonia 1
MA - Marocco 1
MZ - Mozambico 1
PE - Perù 1
PK - Pakistan 1
PT - Portogallo 1
QA - Qatar 1
SC - Seychelles 1
TR - Turchia 1
UZ - Uzbekistan 1
VN - Vietnam 1
Totale 103.198
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Città #
Cagliari 87.913
Uta 7.658
Fairfield 860
Woodbridge 514
Houston 377
Chandler 369
Ashburn 356
Seattle 350
Cambridge 329
Wilmington 315
Ann Arbor 300
Nyköping 276
Boardman 266
Jacksonville 208
Singapore 97
Santa Clara 92
Dearborn 89
Nanjing 74
Boston 63
Shanghai 57
Helsinki 44
San Diego 40
Beijing 36
Hebei 27
Milan 27
Guangzhou 26
San Mateo 25
Redwood City 24
Nanchang 23
Shenyang 22
Toronto 22
Mountain View 17
Jinan 15
Los Angeles 15
Ardabil 14
Monmouth Junction 14
Tianjin 14
Norwalk 13
Orange 13
Verona 12
Augusta 11
Brussels 11
Changsha 11
Jiaxing 11
London 11
Wuhan 11
Hangzhou 10
Munich 10
Zhengzhou 10
Leawood 9
Mumbai 9
Sassari 9
Atlanta 8
Hefei 8
Indiana 8
Pavia 8
Assèmini 7
Auburn Hills 7
Ningbo 7
Kajang 6
New York 6
Ploaghe 6
Pune 6
Rheinfelden 6
Fuzhou 5
Guasila 5
Kilburn 5
Ottawa 5
Padova 5
Redmond 5
Scorzè 5
Shenzhen 5
Austin 4
Frascati 4
Natal 4
Quartu Sant'elena 4
Annemasse 3
Athens 3
Calonne-ricouart 3
Capoterra 3
Chengdu 3
Dhaka 3
Dublin 3
Duncan 3
Genova 3
Hamburg 3
Kilworth 3
Southwark 3
São José dos Campos 3
Valenciennes 3
Alcalá De Henares 2
Auckland 2
Barcelona 2
Berlin 2
Besano 2
Bologna 2
Borås 2
Braunschweig 2
Centro 2
Chicago 2
Totale 101.330
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Nome #
Clamp voltage and ideality factor in laser diodes 3.053
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.288
ESD tests on 850 nm GaAs-based VCSELs 2.283
Extended Modal Gain Measurement in DFB Laser Diodes 2.215
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.203
Side-Mode Excitation in Single-Mode Laser Diodes 2.120
Reliability issues in Optical Emitters 2.083
Further improvements of an extended Hakki-Paoli method 2.041
Degradation mechanisms and lifetime of state-of-the-art green laser diodes 2.037
Practical optical gain by an extended Hakki-Paoli method 1.956
DC parameters for laser diodes from experimental curves 1.930
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.877
Reliability prediction and real world for LED lamps 1.851
External cavity ITLA degradation 1.851
The role of the optical trans-characteristics in laser diode analysis 1.804
FIB-induced electro-optical alterations in a DFB InP laser diode 1.776
“Hot-plugging” of led modules: electrical characterization and device degradation 1.744
Ideality factor and threshold voltage in laser diodes 1.721
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.654
An automated lifetest equipment for optical emitters 1.632
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.601
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.590
Optical losses in single-mode laser diodes 1.569
High Brightness InGaN LEDs degradation at high injection current bias 1.509
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.467
null 1.457
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.449
Optical gain in laser diodes with null reflectivity 1.448
Chip and package-related degradation of high power white LEDs 1.400
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs 1.396
Single Event Transient acquisition and mapping for space device Characterization 1.349
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities 1.349
Degradation mechanisms of white LEDs for lighting applications 1.328
Reverse bias degradation of metal wrap through silicon solar cells 1.325
Reliability of visible GaN LEDs in plastic package 1.315
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.295
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells 1.292
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.275
null 1.225
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.208
Early stages of the mechanical alloying of TiC-TiN powder mixtures 1.201
Peculiar failure mechanisms in GaN power transistors 1.180
null 1.152
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi 1.108
From automotive to space qualification: Overlaps, gaps and possible convergence 1.073
Faulty Failure Analyses 1.071
Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress 1.058
Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress 1.057
Reliability concerns from the gray market 1.052
Backside Failure Analysis of GaAs ICs after EDS tests 996
Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis 990
Failure modes and mechanisms of DC-aged GaN LEDs 962
Accelerated Life Test of High Brightness Light Emitting Diodes 919
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence 900
Reliability predictions in electronic industrial applications 847
High temperature electro-optical degradation of InGaN/GaN HBLEDs 842
The rules of the Rue Morgue: a decade later 817
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 801
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 794
null 786
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 767
Failure modes and mechanisms of DC-aged GaN LEDs 735
Failure analysis of RFIC Amplifiers 729
MIM Capacitor_related early-stage field failures 711
Analysis of GaN based high-power diode lasers after singular degradation events 707
Sulfur-contamination of High Power White LEDs 687
CdTe solar cells: technology, operation and reliability 684
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 682
Brightness InGaN LEDs degradation at high injection current bias 671
Analysis of counterfeit electronics 640
Analysis of Fake Amplifiers 607
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 593
Analysis of RFIC Amplifiers 572
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms 566
Laser Diode DC Measurement Protocols 526
Proton irradiation effects on commercial laser diodes 520
null 515
Failure Analysis of High Power White LEDs 483
Faulty failure analyses 457
Failure Analysis And Field Failures: A Real Shortcut To Reliability Improvements 453
Are Soft-Breakdown and Hard-Breakdown of thin gate oxides actually different failure mechanism 428
Electrical and structural characterization of metal contacts on Gallium Nitride 419
Laser Diode Reliability 376
Reliability risks from counterfeit electronics 373
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant 368
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH 357
Electronic Components Authentication via Physical Analysis 305
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 288
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films 258
New paradigm for EBIC amplifier on FIB X-section 257
A Transparent Curved Microstrip Patch Antenna 57
Failure Analysis-assisted FMEA 22
null 21
A review on the physical mechanisms that limit the reliability of GaN-based LEDs 17
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress 16
The Threat of Counterfeit Electronics to the Development of CubeSats 9
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs 4
Catastrophic degradation of LEDs: failure analysis and perspective 3
Totale 103.455
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Categoria #
all - tutte 128.498
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 128.498
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202014.907 0 0 0 0 5.094 3.785 1.971 1.380 604 510 499 1.064
2020/202120.578 984 899 1.067 5.371 4.311 1.887 2.063 1.150 599 800 672 775
2021/20225.788 762 360 225 461 492 331 165 287 512 737 810 646
2022/20239.552 731 1.321 1.383 758 501 1.110 331 1.204 656 487 630 440
2023/202412.458 724 801 746 812 1.130 1.774 2.067 887 416 628 1.230 1.243
2024/202519.346 3.005 4.455 8.492 1.958 1.436 0 0 0 0 0 0 0
Totale 103.455