UNICA IRIS Institutional Research Information System

MURA, GIOVANNA
 Distribuzione geografica
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Continente #
EU - Europa 100.105
NA - Nord America 7.232
AS - Asia 2.918
SA - Sud America 624
AF - Africa 70
OC - Oceania 9
Continente sconosciuto - Info sul continente non disponibili 8
Totale 110.966
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Nazione #
IT - Italia 98.423
US - Stati Uniti d'America 7.081
SG - Singapore 1.123
CN - Cina 963
BR - Brasile 484
UA - Ucraina 423
SE - Svezia 377
VN - Vietnam 287
DE - Germania 190
FI - Finlandia 189
GB - Regno Unito 160
FR - Francia 157
HK - Hong Kong 98
CA - Canada 89
IN - India 69
AR - Argentina 55
IQ - Iraq 51
BD - Bangladesh 50
KR - Corea 46
JP - Giappone 34
MX - Messico 34
RU - Federazione Russa 31
PL - Polonia 29
NL - Olanda 28
TR - Turchia 25
EC - Ecuador 24
ES - Italia 23
MY - Malesia 21
IR - Iran 20
CO - Colombia 18
ID - Indonesia 18
ZA - Sudafrica 18
PK - Pakistan 16
IE - Irlanda 15
JM - Giamaica 15
PH - Filippine 15
BE - Belgio 13
AZ - Azerbaigian 12
MA - Marocco 12
TW - Taiwan 12
PY - Paraguay 11
TN - Tunisia 10
UZ - Uzbekistan 10
VE - Venezuela 10
SA - Arabia Saudita 9
CL - Cile 8
UY - Uruguay 8
AT - Austria 7
CH - Svizzera 7
EU - Europa 7
CZ - Repubblica Ceca 6
IL - Israele 6
KE - Kenya 6
LT - Lituania 6
NZ - Nuova Zelanda 6
DZ - Algeria 5
EG - Egitto 5
ET - Etiopia 5
AE - Emirati Arabi Uniti 4
GR - Grecia 4
JO - Giordania 4
NP - Nepal 4
PE - Perù 4
PT - Portogallo 4
AU - Australia 3
EE - Estonia 3
MU - Mauritius 3
PA - Panama 3
QA - Qatar 3
AM - Armenia 2
BH - Bahrain 2
BO - Bolivia 2
CR - Costa Rica 2
HU - Ungheria 2
KG - Kirghizistan 2
KZ - Kazakistan 2
LK - Sri Lanka 2
PS - Palestinian Territory 2
AO - Angola 1
BG - Bulgaria 1
BJ - Benin 1
BN - Brunei Darussalam 1
CI - Costa d'Avorio 1
DK - Danimarca 1
DM - Dominica 1
DO - Repubblica Dominicana 1
GD - Grenada 1
HN - Honduras 1
HR - Croazia 1
KH - Cambogia 1
KW - Kuwait 1
LU - Lussemburgo 1
MD - Moldavia 1
MM - Myanmar 1
MZ - Mozambico 1
NI - Nicaragua 1
NO - Norvegia 1
OM - Oman 1
PR - Porto Rico 1
RO - Romania 1
Totale 110.959
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Città #
Cagliari 90.738
Uta 7.264
Fairfield 849
Ashburn 596
Singapore 571
Woodbridge 508
Houston 377
Seattle 353
Chandler 351
Cambridge 325
Wilmington 311
Ann Arbor 299
Dallas 291
San Jose 288
Nyköping 266
Boardman 258
Jacksonville 208
Beijing 158
Los Angeles 130
Santa Clara 123
Helsinki 100
Ho Chi Minh City 94
Hong Kong 90
Dearborn 89
Lauterbourg 86
Nanjing 74
Boston 73
The Dalles 73
New York 72
Hanoi 67
Hefei 61
Shanghai 60
Council Bluffs 47
Buffalo 44
São Paulo 40
Orem 38
Seoul 38
San Diego 37
Milan 32
Tokyo 32
Guangzhou 31
Munich 28
Hebei 27
Brooklyn 25
Chicago 25
Frankfurt am Main 25
San Mateo 25
Toronto 25
Atlanta 24
Rio de Janeiro 24
Montreal 23
Nanchang 23
Redwood City 23
Tianjin 23
Baghdad 22
Phoenix 21
Shenyang 21
Warsaw 21
Da Nang 20
London 20
Denver 19
Hangzhou 19
Mexico City 19
Redondo Beach 18
Mountain View 17
Changsha 16
Turku 16
Ardabil 14
Belo Horizonte 14
Columbus 14
Jinan 14
Manchester 14
Monmouth Junction 14
Mumbai 14
San Francisco 14
Wuhan 14
Brasília 13
Curitiba 13
Orange 13
Amsterdam 12
Ankara 12
Augusta 12
Bologna 12
Norwalk 12
Verona 12
Brussels 11
Haiphong 11
Jiaxing 11
Lappeenranta 11
Sassari 11
Stockholm 11
Zhengzhou 11
Johannesburg 10
Nuremberg 10
Biên Hòa 9
Lahore 9
Leawood 9
Poplar 9
Quito 9
Salt Lake City 9
Totale 106.499
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Nome #
Clamp voltage and ideality factor in laser diodes 3.174
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.427
ESD tests on 850 nm GaAs-based VCSELs 2.418
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.373
Extended Modal Gain Measurement in DFB Laser Diodes 2.337
Side-Mode Excitation in Single-Mode Laser Diodes 2.253
Further improvements of an extended Hakki-Paoli method 2.182
Reliability issues in Optical Emitters 2.175
Degradation mechanisms and lifetime of state-of-the-art green laser diodes 2.134
Practical optical gain by an extended Hakki-Paoli method 2.078
DC parameters for laser diodes from experimental curves 2.056
Reliability prediction and real world for LED lamps 1.978
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.963
External cavity ITLA degradation 1.955
The role of the optical trans-characteristics in laser diode analysis 1.889
FIB-induced electro-optical alterations in a DFB InP laser diode 1.858
“Hot-plugging” of led modules: electrical characterization and device degradation 1.838
Ideality factor and threshold voltage in laser diodes 1.818
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.743
An automated lifetest equipment for optical emitters 1.728
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.727
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.721
Optical losses in single-mode laser diodes 1.652
High Brightness InGaN LEDs degradation at high injection current bias 1.597
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.595
Optical gain in laser diodes with null reflectivity 1.589
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.567
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs 1.497
Chip and package-related degradation of high power white LEDs 1.495
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities 1.450
Single Event Transient acquisition and mapping for space device Characterization 1.447
Reverse bias degradation of metal wrap through silicon solar cells 1.419
Reliability of visible GaN LEDs in plastic package 1.412
Degradation mechanisms of white LEDs for lighting applications 1.409
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.387
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells 1.383
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.356
Peculiar failure mechanisms in GaN power transistors 1.331
Proton irradiation effects on commercial laser diodes 1.318
Early stages of the mechanical alloying of TiC-TiN powder mixtures 1.304
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.291
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi 1.206
From automotive to space qualification: Overlaps, gaps and possible convergence 1.194
Reliability concerns from the gray market 1.157
null 1.152
Faulty Failure Analyses 1.148
Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress 1.147
Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis 1.118
Backside Failure Analysis of GaAs ICs after EDS tests 1.075
Failure modes and mechanisms of DC-aged GaN LEDs 1.069
Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress 1.057
Accelerated Life Test of High Brightness Light Emitting Diodes 1.044
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence 992
High temperature electro-optical degradation of InGaN/GaN HBLEDs 952
Reliability predictions in electronic industrial applications 918
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 906
The rules of the Rue Morgue: a decade later 901
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 875
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 844
Failure modes and mechanisms of DC-aged GaN LEDs 827
CdTe solar cells: technology, operation and reliability 820
Failure analysis of RFIC Amplifiers 814
null 786
MIM Capacitor_related early-stage field failures 780
Brightness InGaN LEDs degradation at high injection current bias 768
Analysis of counterfeit electronics 765
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 764
Sulfur-contamination of High Power White LEDs 757
Analysis of Fake Amplifiers 740
Laser diode DC measurement protocols 691
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 687
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms 683
Analysis of RFIC Amplifiers 660
Failure Analysis of High Power White LEDs 559
Faulty failure analyses 536
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant 528
null 515
Failure Analysis And Field Failures: A Real Shortcut To Reliability Improvements 508
Reliability risks from counterfeit electronics 506
Electrical and structural characterization of metal contacts on Gallium Nitride 504
Electronic components authentication via physical analysis 484
Laser Diode Reliability 464
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH 464
null 449
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films 448
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 429
New paradigm for EBIC amplifier on FIB X-section 347
A transparent curved microstrip patch antenna 207
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress 202
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs 139
Catastrophic degradation of LEDs: failure analysis and perspective 137
Electronics authentication using electrical measurements and machine learning 119
Evaluation of flexible organic transistor stability in harsh conditions 118
The threat of counterfeit electronics to the development of CubeSats 117
Counterfeit electronics in industry 4.0: risks and detection 109
Detecting counterfeit electronic circuits: the effect of PCB thickness and dielectric permittivity on the electromagnetic fingerprint 95
Counterfeit electronics detection via physical analysis 91
Failure Analysis-assisted FMEA 90
Enhancing Thermal and Radiation Hardness of All-Organic Printed Transistors by a Flexible and Transparent Encapsulation Layer for Low Earth Orbit Applications 85
Counterfeit electronics: A threat for new space economy 83
Totale 110.954
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Categoria #
all - tutte 147.122
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 147.122
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021753 0 0 0 0 0 0 0 0 0 0 0 753
2021/20225.703 751 351 220 450 487 323 163 284 502 726 807 639
2022/20239.309 711 1.287 1.345 741 494 1.082 327 1.178 628 472 610 434
2023/202412.143 697 785 735 794 1.097 1.724 2.010 866 404 616 1.206 1.209
2024/202522.158 2.948 4.368 8.061 1.907 1.453 1.411 1.058 149 222 193 175 213
2025/20267.053 342 247 677 837 655 433 987 1.075 327 828 375 270
Totale 111.305