UNICA IRIS Institutional Research Information System

MURA, GIOVANNA
 Distribuzione geografica
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Continente #
EU - Europa 99.945
NA - Nord America 6.429
AS - Asia 2.009
SA - Sud America 546
AF - Africa 35
OC - Oceania 10
Continente sconosciuto - Info sul continente non disponibili 7
Totale 108.981
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Nazione #
IT - Italia 98.479
US - Stati Uniti d'America 6.308
CN - Cina 840
SG - Singapore 776
BR - Brasile 448
UA - Ucraina 424
SE - Svezia 384
DE - Germania 171
GB - Regno Unito 137
FI - Finlandia 130
VN - Vietnam 115
CA - Canada 80
FR - Francia 64
AR - Argentina 45
KR - Corea 45
IN - India 41
HK - Hong Kong 30
RU - Federazione Russa 28
MX - Messico 25
NL - Olanda 24
PL - Polonia 24
IQ - Iraq 23
ES - Italia 21
JP - Giappone 21
IR - Iran 19
EC - Ecuador 18
BD - Bangladesh 17
IE - Irlanda 14
BE - Belgio 13
TR - Turchia 13
MY - Malesia 11
CO - Colombia 9
ID - Indonesia 9
MA - Marocco 9
ZA - Sudafrica 8
AT - Austria 7
EU - Europa 7
PY - Paraguay 7
SA - Arabia Saudita 7
AZ - Azerbaigian 6
CZ - Repubblica Ceca 6
NZ - Nuova Zelanda 6
TW - Taiwan 6
UY - Uruguay 6
CL - Cile 5
JM - Giamaica 5
LT - Lituania 5
TN - Tunisia 5
AU - Australia 4
GR - Grecia 4
PK - Pakistan 4
UZ - Uzbekistan 4
VE - Venezuela 4
EG - Egitto 3
KE - Kenya 3
PA - Panama 3
PE - Perù 3
QA - Qatar 3
AE - Emirati Arabi Uniti 2
AM - Armenia 2
DZ - Algeria 2
EE - Estonia 2
IL - Israele 2
JO - Giordania 2
KG - Kirghizistan 2
LK - Sri Lanka 2
MU - Mauritius 2
NP - Nepal 2
PT - Portogallo 2
BG - Bulgaria 1
BH - Bahrain 1
BN - Brunei Darussalam 1
BO - Bolivia 1
CH - Svizzera 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
DK - Danimarca 1
DM - Dominica 1
GD - Grenada 1
HN - Honduras 1
KH - Cambogia 1
KW - Kuwait 1
LU - Lussemburgo 1
MZ - Mozambico 1
NI - Nicaragua 1
OM - Oman 1
PR - Porto Rico 1
RO - Romania 1
RS - Serbia 1
SC - Seychelles 1
SV - El Salvador 1
TT - Trinidad e Tobago 1
Totale 108.981
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Città #
Cagliari 90.619
Uta 7.487
Fairfield 860
Woodbridge 514
Ashburn 509
Houston 381
Singapore 366
Chandler 364
Seattle 355
Cambridge 329
Wilmington 316
Ann Arbor 300
Dallas 285
Nyköping 274
Boardman 263
Jacksonville 209
Beijing 153
Santa Clara 109
Los Angeles 100
Dearborn 89
Nanjing 74
Boston 72
Hefei 61
Shanghai 56
Helsinki 46
Ho Chi Minh City 45
Buffalo 40
San Diego 40
New York 39
Seoul 38
São Paulo 36
Guangzhou 30
Munich 30
Milan 28
Hebei 27
Hong Kong 27
Toronto 26
San Mateo 25
Redwood City 24
Hanoi 23
Nanchang 23
Rio de Janeiro 22
Shenyang 22
Warsaw 22
Montreal 20
Tokyo 20
Atlanta 19
Brooklyn 18
Chicago 18
Redondo Beach 18
Tianjin 18
London 17
Mountain View 17
Changsha 16
The Dalles 16
Turku 16
Denver 15
Jinan 15
Ardabil 14
Belo Horizonte 14
Monmouth Junction 14
Orem 14
Columbus 13
Curitiba 13
Mexico City 13
Norwalk 13
Orange 13
Wuhan 13
Brasília 12
Council Bluffs 12
Stockholm 12
Verona 12
Augusta 11
Baghdad 11
Brussels 11
Jiaxing 11
Phoenix 11
Sassari 11
Zhengzhou 11
Frankfurt am Main 10
Hangzhou 10
Mumbai 10
San Francisco 10
Amsterdam 9
Leawood 9
Nuremberg 9
Poplar 9
Quito 9
Da Nang 8
Indiana 8
Johannesburg 8
Pavia 8
Salt Lake City 8
Xi'an 8
Ankara 7
Assèmini 7
Auburn Hills 7
Goiânia 7
Lauterbourg 7
Natal 7
Totale 105.435
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Nome #
Clamp voltage and ideality factor in laser diodes 3.142
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.384
ESD tests on 850 nm GaAs-based VCSELs 2.377
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.325
Extended Modal Gain Measurement in DFB Laser Diodes 2.289
Side-Mode Excitation in Single-Mode Laser Diodes 2.209
Reliability issues in Optical Emitters 2.135
Further improvements of an extended Hakki-Paoli method 2.133
Degradation mechanisms and lifetime of state-of-the-art green laser diodes 2.095
Practical optical gain by an extended Hakki-Paoli method 2.038
DC parameters for laser diodes from experimental curves 2.013
Reliability prediction and real world for LED lamps 1.943
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.923
External cavity ITLA degradation 1.918
The role of the optical trans-characteristics in laser diode analysis 1.857
FIB-induced electro-optical alterations in a DFB InP laser diode 1.826
“Hot-plugging” of led modules: electrical characterization and device degradation 1.816
Ideality factor and threshold voltage in laser diodes 1.776
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.702
An automated lifetest equipment for optical emitters 1.686
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.680
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.678
Optical losses in single-mode laser diodes 1.622
High Brightness InGaN LEDs degradation at high injection current bias 1.558
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.553
Optical gain in laser diodes with null reflectivity 1.541
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.531
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs 1.461
null 1.457
Chip and package-related degradation of high power white LEDs 1.452
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities 1.416
Single Event Transient acquisition and mapping for space device Characterization 1.414
Reverse bias degradation of metal wrap through silicon solar cells 1.389
Reliability of visible GaN LEDs in plastic package 1.373
Degradation mechanisms of white LEDs for lighting applications 1.371
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.353
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells 1.348
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.317
Peculiar failure mechanisms in GaN power transistors 1.287
Early stages of the mechanical alloying of TiC-TiN powder mixtures 1.265
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.261
Proton irradiation effects on commercial laser diodes 1.261
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi 1.178
From automotive to space qualification: Overlaps, gaps and possible convergence 1.161
null 1.152
Reliability concerns from the gray market 1.123
Faulty Failure Analyses 1.117
Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress 1.113
Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis 1.064
Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress 1.057
Backside Failure Analysis of GaAs ICs after EDS tests 1.033
Failure modes and mechanisms of DC-aged GaN LEDs 1.027
Accelerated Life Test of High Brightness Light Emitting Diodes 1.003
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence 953
High temperature electro-optical degradation of InGaN/GaN HBLEDs 915
Reliability predictions in electronic industrial applications 881
The rules of the Rue Morgue: a decade later 861
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 858
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 835
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 803
Analysis of GaN based high-power diode lasers after singular degradation events 793
Failure modes and mechanisms of DC-aged GaN LEDs 788
CdTe solar cells: technology, operation and reliability 787
null 786
Failure analysis of RFIC Amplifiers 771
MIM Capacitor_related early-stage field failures 751
Analysis of counterfeit electronics 723
Brightness InGaN LEDs degradation at high injection current bias 721
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 721
Sulfur-contamination of High Power White LEDs 719
Analysis of Fake Amplifiers 692
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 648
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms 643
Laser Diode DC Measurement Protocols 621
Analysis of RFIC Amplifiers 618
null 515
Failure Analysis of High Power White LEDs 514
Faulty failure analyses 496
Failure Analysis And Field Failures: A Real Shortcut To Reliability Improvements 481
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant 477
Electrical and structural characterization of metal contacts on Gallium Nitride 471
Reliability risks from counterfeit electronics 455
null 449
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH 437
Electronic components authentication via physical analysis 435
Laser Diode Reliability 431
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films 396
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 382
New paradigm for EBIC amplifier on FIB X-section 323
A transparent curved microstrip patch antenna 153
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress 133
Catastrophic degradation of LEDs: failure analysis and perspective 84
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs 77
The Threat of Counterfeit Electronics to the Development of CubeSats 70
Failure Analysis-assisted FMEA 67
Electronics authentication using electrical measurements and machine learning 59
Counterfeit electronics in industry 4.0: risks and detection 50
Evaluation of flexible organic transistor stability in harsh conditions 48
Counterfeit electronics: A threat for new space economy 48
Detecting counterfeit electronic circuits: the effect of PCB thickness and dielectric permittivity on the electromagnetic fingerprint 39
Totale 109.181
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Categoria #
all - tutte 141.742
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 141.742
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20217.946 0 0 0 0 0 1.887 2.063 1.150 599 800 672 775
2021/20225.788 762 360 225 461 492 331 165 287 512 737 810 646
2022/20239.495 731 1.321 1.383 755 500 1.096 329 1.197 645 480 619 439
2023/202412.291 705 790 742 801 1.111 1.747 2.035 876 408 623 1.222 1.231
2024/202522.583 2.976 4.429 8.290 1.935 1.480 1.436 1.073 151 224 194 179 216
2025/20262.845 349 253 681 848 661 53 0 0 0 0 0 0
Totale 109.313