UNICA IRIS Institutional Research Information System

MURA, GIOVANNA
 Distribuzione geografica
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Continente #
EU - Europa 100.256
NA - Nord America 7.430
AS - Asia 2.951
SA - Sud America 632
Continente sconosciuto - Info sul continente non disponibili 347
AF - Africa 71
OC - Oceania 10
Totale 111.697
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Nazione #
IT - Italia 98.568
US - Stati Uniti d'America 7.274
SG - Singapore 1.126
CN - Cina 970
BR - Brasile 488
UA - Ucraina 423
SE - Svezia 377
VN - Vietnam 287
DE - Germania 192
FI - Finlandia 189
GB - Regno Unito 162
FR - Francia 158
HK - Hong Kong 100
CA - Canada 90
BD - Bangladesh 70
IN - India 70
AR - Argentina 59
IQ - Iraq 51
KR - Corea 46
JP - Giappone 34
MX - Messico 34
RU - Federazione Russa 31
PL - Polonia 29
NL - Olanda 28
TR - Turchia 25
EC - Ecuador 24
ES - Italia 23
MY - Malesia 21
IR - Iran 20
CO - Colombia 18
ID - Indonesia 18
ZA - Sudafrica 18
JM - Giamaica 16
PK - Pakistan 16
IE - Irlanda 15
PH - Filippine 15
BE - Belgio 13
AZ - Azerbaigian 12
MA - Marocco 12
TW - Taiwan 12
PY - Paraguay 11
TN - Tunisia 10
UZ - Uzbekistan 10
VE - Venezuela 10
SA - Arabia Saudita 9
CL - Cile 8
UY - Uruguay 8
AT - Austria 7
CH - Svizzera 7
EU - Europa 7
KE - Kenya 7
CZ - Repubblica Ceca 6
IL - Israele 6
LT - Lituania 6
NZ - Nuova Zelanda 6
DZ - Algeria 5
EG - Egitto 5
ET - Etiopia 5
AE - Emirati Arabi Uniti 4
AU - Australia 4
GR - Grecia 4
JO - Giordania 4
NP - Nepal 4
PE - Perù 4
PT - Portogallo 4
CR - Costa Rica 3
EE - Estonia 3
MU - Mauritius 3
PA - Panama 3
QA - Qatar 3
AM - Armenia 2
BG - Bulgaria 2
BH - Bahrain 2
BO - Bolivia 2
HN - Honduras 2
HU - Ungheria 2
KG - Kirghizistan 2
KZ - Kazakistan 2
LK - Sri Lanka 2
PS - Palestinian Territory 2
AO - Angola 1
BB - Barbados 1
BJ - Benin 1
BN - Brunei Darussalam 1
CI - Costa d'Avorio 1
DK - Danimarca 1
DM - Dominica 1
DO - Repubblica Dominicana 1
GD - Grenada 1
HR - Croazia 1
KH - Cambogia 1
KW - Kuwait 1
LU - Lussemburgo 1
MD - Moldavia 1
MM - Myanmar 1
MZ - Mozambico 1
NI - Nicaragua 1
NO - Norvegia 1
OM - Oman 1
PR - Porto Rico 1
Totale 111.350
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Città #
Cagliari 90.855
Uta 7.264
Fairfield 850
Ashburn 618
Singapore 574
Woodbridge 508
Houston 378
Seattle 353
Chandler 351
Cambridge 325
Wilmington 311
Ann Arbor 299
Dallas 293
San Jose 289
Nyköping 266
Boardman 258
Jacksonville 208
Beijing 163
Los Angeles 131
Santa Clara 130
Council Bluffs 111
Helsinki 100
Ho Chi Minh City 94
Hong Kong 92
Dearborn 89
Lauterbourg 86
New York 75
Nanjing 74
Boston 73
The Dalles 73
Hanoi 67
Hefei 61
Shanghai 61
Buffalo 45
São Paulo 40
Orem 38
San Diego 38
Seoul 38
Milan 37
Columbus 34
Tokyo 32
Guangzhou 31
Munich 28
Chicago 27
Hebei 27
Atlanta 26
San Mateo 26
Brooklyn 25
Frankfurt am Main 25
Toronto 25
Rio de Janeiro 24
Montreal 23
Nanchang 23
Phoenix 23
Redwood City 23
Tianjin 23
Baghdad 22
London 22
Shenyang 21
Warsaw 21
Da Nang 20
Denver 19
Hangzhou 19
Mexico City 19
Redondo Beach 18
Mountain View 17
Changsha 16
Turku 16
Mumbai 15
Ardabil 14
Belo Horizonte 14
Jinan 14
Manchester 14
Monmouth Junction 14
San Francisco 14
Wuhan 14
Bologna 13
Brasília 13
Curitiba 13
Orange 13
Amsterdam 12
Ankara 12
Augusta 12
Norwalk 12
Verona 12
Brussels 11
Haiphong 11
Jiaxing 11
Lappeenranta 11
Sassari 11
Stockholm 11
Zhengzhou 11
Johannesburg 10
Nuremberg 10
Biên Hòa 9
Lahore 9
Leawood 9
Poplar 9
Quito 9
Rome 9
Totale 106.767
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Nome #
Clamp voltage and ideality factor in laser diodes 3.177
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.432
ESD tests on 850 nm GaAs-based VCSELs 2.422
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.374
Extended Modal Gain Measurement in DFB Laser Diodes 2.343
Side-Mode Excitation in Single-Mode Laser Diodes 2.254
Further improvements of an extended Hakki-Paoli method 2.185
Reliability issues in Optical Emitters 2.177
Degradation mechanisms and lifetime of state-of-the-art green laser diodes 2.138
Practical optical gain by an extended Hakki-Paoli method 2.082
DC parameters for laser diodes from experimental curves 2.058
Reliability prediction and real world for LED lamps 1.980
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.965
External cavity ITLA degradation 1.959
The role of the optical trans-characteristics in laser diode analysis 1.889
FIB-induced electro-optical alterations in a DFB InP laser diode 1.863
“Hot-plugging” of led modules: electrical characterization and device degradation 1.839
Ideality factor and threshold voltage in laser diodes 1.820
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.746
An automated lifetest equipment for optical emitters 1.729
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.727
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.726
Optical losses in single-mode laser diodes 1.653
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.600
High Brightness InGaN LEDs degradation at high injection current bias 1.599
Optical gain in laser diodes with null reflectivity 1.591
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.569
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs 1.501
Chip and package-related degradation of high power white LEDs 1.497
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities 1.453
Single Event Transient acquisition and mapping for space device Characterization 1.451
Reverse bias degradation of metal wrap through silicon solar cells 1.423
Reliability of visible GaN LEDs in plastic package 1.418
Degradation mechanisms of white LEDs for lighting applications 1.409
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.389
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells 1.386
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.358
Peculiar failure mechanisms in GaN power transistors 1.334
Proton irradiation effects on commercial laser diodes 1.323
Early stages of the mechanical alloying of TiC-TiN powder mixtures 1.305
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.293
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi 1.210
From automotive to space qualification: Overlaps, gaps and possible convergence 1.195
Reliability concerns from the gray market 1.158
Faulty Failure Analyses 1.152
null 1.152
Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress 1.149
Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis 1.120
Backside Failure Analysis of GaAs ICs after EDS tests 1.076
Failure modes and mechanisms of DC-aged GaN LEDs 1.071
Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress 1.057
Accelerated Life Test of High Brightness Light Emitting Diodes 1.048
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence 997
High temperature electro-optical degradation of InGaN/GaN HBLEDs 955
Reliability predictions in electronic industrial applications 921
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 908
The rules of the Rue Morgue: a decade later 903
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 876
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 846
Failure modes and mechanisms of DC-aged GaN LEDs 830
CdTe solar cells: technology, operation and reliability 824
Failure analysis of RFIC Amplifiers 819
null 786
MIM Capacitor_related early-stage field failures 783
Brightness InGaN LEDs degradation at high injection current bias 771
Analysis of counterfeit electronics 769
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 765
Sulfur-contamination of High Power White LEDs 758
Analysis of Fake Amplifiers 748
Laser diode DC measurement protocols 692
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 688
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms 686
Analysis of RFIC Amplifiers 663
Failure Analysis of High Power White LEDs 564
Faulty failure analyses 536
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant 532
null 515
Failure Analysis And Field Failures: A Real Shortcut To Reliability Improvements 510
Reliability risks from counterfeit electronics 508
Electrical and structural characterization of metal contacts on Gallium Nitride 507
Electronic components authentication via physical analysis 490
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH 489
Laser Diode Reliability 466
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films 453
null 449
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 430
New paradigm for EBIC amplifier on FIB X-section 351
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress 218
A transparent curved microstrip patch antenna 214
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs 156
Catastrophic degradation of LEDs: failure analysis and perspective 144
Evaluation of flexible organic transistor stability in harsh conditions 128
The threat of counterfeit electronics to the development of CubeSats 123
Electronics authentication using electrical measurements and machine learning 122
Counterfeit electronics in industry 4.0: risks and detection 118
Detecting counterfeit electronic circuits: the effect of PCB thickness and dielectric permittivity on the electromagnetic fingerprint 102
Counterfeit electronics detection via physical analysis 100
Enhancing Thermal and Radiation Hardness of All-Organic Printed Transistors by a Flexible and Transparent Encapsulation Layer for Low Earth Orbit Applications 94
Failure Analysis-assisted FMEA 93
Defects in InGaN QW structures: microscopic properties and modeling 87
Totale 111.312
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Categoria #
all - tutte 149.757
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 149.757
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20224.952 0 351 220 450 487 323 163 284 502 726 807 639
2022/20239.309 711 1.287 1.345 741 494 1.082 327 1.178 628 472 610 434
2023/202412.143 697 785 735 794 1.097 1.724 2.010 866 404 616 1.206 1.209
2024/202522.158 2.948 4.368 8.061 1.907 1.453 1.411 1.058 149 222 193 175 213
2025/20267.065 342 247 677 837 655 433 987 1.075 327 828 375 282
2026/2027380 137 243 0 0 0 0 0 0 0 0 0 0
Totale 111.697