UNICA IRIS Institutional Research Information System

MURA, GIOVANNA
 Distribuzione geografica
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Continente #
EU - Europa 99.774
NA - Nord America 6.939
AS - Asia 2.884
SA - Sud America 623
AF - Africa 70
OC - Oceania 9
Continente sconosciuto - Info sul continente non disponibili 8
Totale 110.307
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Nazione #
IT - Italia 98.097
US - Stati Uniti d'America 6.805
SG - Singapore 1.116
CN - Cina 956
BR - Brasile 484
UA - Ucraina 423
SE - Svezia 376
VN - Vietnam 286
DE - Germania 190
FI - Finlandia 189
GB - Regno Unito 160
FR - Francia 157
HK - Hong Kong 97
CA - Canada 81
IN - India 69
AR - Argentina 55
IQ - Iraq 51
KR - Corea 46
BD - Bangladesh 37
JP - Giappone 33
MX - Messico 33
RU - Federazione Russa 31
NL - Olanda 28
PL - Polonia 28
TR - Turchia 25
EC - Ecuador 24
ES - Italia 23
IR - Iran 20
MY - Malesia 20
CO - Colombia 18
ID - Indonesia 18
ZA - Sudafrica 18
PK - Pakistan 16
IE - Irlanda 15
PH - Filippine 15
BE - Belgio 13
AZ - Azerbaigian 12
MA - Marocco 12
PY - Paraguay 11
TW - Taiwan 11
TN - Tunisia 10
UZ - Uzbekistan 10
VE - Venezuela 10
SA - Arabia Saudita 9
CL - Cile 8
UY - Uruguay 8
AT - Austria 7
EU - Europa 7
JM - Giamaica 7
CZ - Repubblica Ceca 6
KE - Kenya 6
LT - Lituania 6
NZ - Nuova Zelanda 6
CH - Svizzera 5
DZ - Algeria 5
EG - Egitto 5
ET - Etiopia 5
AE - Emirati Arabi Uniti 4
GR - Grecia 4
IL - Israele 4
JO - Giordania 4
NP - Nepal 4
PT - Portogallo 4
AU - Australia 3
EE - Estonia 3
MU - Mauritius 3
PA - Panama 3
PE - Perù 3
QA - Qatar 3
AM - Armenia 2
BH - Bahrain 2
BO - Bolivia 2
CR - Costa Rica 2
HU - Ungheria 2
KG - Kirghizistan 2
KZ - Kazakistan 2
LK - Sri Lanka 2
PS - Palestinian Territory 2
AO - Angola 1
BG - Bulgaria 1
BJ - Benin 1
BN - Brunei Darussalam 1
CI - Costa d'Avorio 1
DK - Danimarca 1
DM - Dominica 1
DO - Repubblica Dominicana 1
GD - Grenada 1
HN - Honduras 1
HR - Croazia 1
KH - Cambogia 1
KW - Kuwait 1
LU - Lussemburgo 1
MM - Myanmar 1
MZ - Mozambico 1
NI - Nicaragua 1
NO - Norvegia 1
OM - Oman 1
PR - Porto Rico 1
RO - Romania 1
RS - Serbia 1
Totale 110.301
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Città #
Cagliari 90.445
Uta 7.264
Fairfield 849
Ashburn 590
Singapore 567
Woodbridge 508
Houston 376
Seattle 353
Chandler 351
Cambridge 325
Wilmington 311
Ann Arbor 299
Dallas 288
San Jose 267
Nyköping 266
Boardman 258
Jacksonville 207
Beijing 155
Los Angeles 128
Santa Clara 112
Helsinki 100
Ho Chi Minh City 94
Dearborn 89
Hong Kong 89
Lauterbourg 86
Nanjing 74
Boston 72
The Dalles 72
Hanoi 67
Hefei 61
Shanghai 60
New York 47
Buffalo 42
São Paulo 40
Orem 38
Seoul 38
San Diego 37
Tokyo 32
Guangzhou 31
Council Bluffs 29
Milan 28
Munich 28
Hebei 27
Frankfurt am Main 25
San Mateo 25
Chicago 24
Rio de Janeiro 24
Toronto 24
Nanchang 23
Redwood City 23
Tianjin 23
Atlanta 22
Baghdad 22
Brooklyn 21
Montreal 21
Shenyang 21
Warsaw 21
Da Nang 20
London 20
Hangzhou 19
Denver 18
Mexico City 18
Phoenix 18
Redondo Beach 18
Mountain View 17
Changsha 16
Turku 16
Ardabil 14
Belo Horizonte 14
Jinan 14
Manchester 14
Monmouth Junction 14
Mumbai 14
San Francisco 14
Wuhan 14
Brasília 13
Columbus 13
Curitiba 13
Orange 13
Amsterdam 12
Ankara 12
Norwalk 12
Verona 12
Augusta 11
Brussels 11
Haiphong 11
Jiaxing 11
Lappeenranta 11
Sassari 11
Stockholm 11
Zhengzhou 11
Johannesburg 10
Nuremberg 10
Biên Hòa 9
Lahore 9
Leawood 9
Poplar 9
Quito 9
Salt Lake City 9
Tashkent 9
Totale 106.082
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Nome #
Clamp voltage and ideality factor in laser diodes 3.170
Nanoscale Investigation of Degradation and Wavelength Fluctuations in InGaN-Based Green Laser Diodes 2.420
ESD tests on 850 nm GaAs-based VCSELs 2.413
Logics of Failure Analysis: 20 Years of rules of the Rue Morgue 2.367
Extended Modal Gain Measurement in DFB Laser Diodes 2.335
Side-Mode Excitation in Single-Mode Laser Diodes 2.248
Further improvements of an extended Hakki-Paoli method 2.176
Reliability issues in Optical Emitters 2.169
Degradation mechanisms and lifetime of state-of-the-art green laser diodes 2.127
Practical optical gain by an extended Hakki-Paoli method 2.075
DC parameters for laser diodes from experimental curves 2.051
Reliability prediction and real world for LED lamps 1.970
A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps 1.954
External cavity ITLA degradation 1.949
The role of the optical trans-characteristics in laser diode analysis 1.882
FIB-induced electro-optical alterations in a DFB InP laser diode 1.850
“Hot-plugging” of led modules: electrical characterization and device degradation 1.833
Ideality factor and threshold voltage in laser diodes 1.809
Phosphors for LED-based light sources: Thermal properties and reliability issues 1.738
An automated lifetest equipment for optical emitters 1.723
Comparison of catastrophic optical damage events in GaAs- and GaN-based diode lasers 1.720
Optical gain beyond Hakki-Paoli. a new power tool for reliability of laser diodes 1.718
Optical losses in single-mode laser diodes 1.649
High Brightness InGaN LEDs degradation at high injection current bias 1.589
Catastrophic Optical Damage of GaN-Based Diode Lasers: Sequence of Events, Damage Pattern, and Comparison with GaAs-Based Devices 1.589
Optical gain in laser diodes with null reflectivity 1.585
Thermal and electrical investigation of the reverse bias degradation of silicon solar cells 1.561
Analytical model for the I-V characteristics of fresh and degraded commercial LEDs 1.496
Chip and package-related degradation of high power white LEDs 1.488
Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities 1.445
Single Event Transient acquisition and mapping for space device Characterization 1.444
Reverse bias degradation of metal wrap through silicon solar cells 1.412
Reliability of visible GaN LEDs in plastic package 1.404
Degradation mechanisms of white LEDs for lighting applications 1.403
The interpretation of the DC characteristics of LED and laser diodes to address their failure analysis 1.383
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells 1.381
Analysis of the degradation of AlGaN-based deep-ultraviolet LEDs 1.352
Peculiar failure mechanisms in GaN power transistors 1.330
Proton irradiation effects on commercial laser diodes 1.311
Early stages of the mechanical alloying of TiC-TiN powder mixtures 1.289
Lot reliability issues in commercial off the shelf (COTS) microelectronic devices 1.284
Formation of metastable solid solutions by mechanical alloying of immiscible Ag and Bi 1.199
From automotive to space qualification: Overlaps, gaps and possible convergence 1.189
null 1.152
Reliability concerns from the gray market 1.151
Faulty Failure Analyses 1.143
Microscopic-scale investigation of the degradation of InGaN-based laser diodes submitted to electrical stress 1.139
Influence of shunt resistance on the performance of an illuminated string of solar cells: Theory, simulation, and experimental analysis 1.108
Backside Failure Analysis of GaAs ICs after EDS tests 1.068
Failure modes and mechanisms of DC-aged GaN LEDs 1.065
Investigation of the time-dependent failure of InGaN-based LEDs submitted to reverse-bias stress 1.057
Accelerated Life Test of High Brightness Light Emitting Diodes 1.042
Degradation of InGaN/GaN laser diodes investigated by micro-cathodoluminescence and micro-photoluminescence 986
High temperature electro-optical degradation of InGaN/GaN HBLEDs 948
Reliability predictions in electronic industrial applications 913
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology 898
The rules of the Rue Morgue: a decade later 897
Thermal stability analysis of High Brightness LED during high temperature and electrical aging 871
Failure Analysis of Failure Analyses: The rules of the Rue Morgue, ten years later 839
Failure modes and mechanisms of DC-aged GaN LEDs 824
CdTe solar cells: technology, operation and reliability 818
Failure analysis of RFIC Amplifiers 809
null 786
MIM Capacitor_related early-stage field failures 777
Analysis of counterfeit electronics 761
Sulfur-contamination of High Power White LEDs 755
Brightness InGaN LEDs degradation at high injection current bias 754
Study of the factors that limit the reliability of GaN-based LEDs at high temperature levels 752
Analysis of Fake Amplifiers 731
Laser diode DC measurement protocols 688
Vertical assisted directional-coupler from Silicon-on-Insulator to Silicon Nitride platforms 681
On the behavior of the selective Iodine-based Gold etch for the Failure Analysis of aged optoelectronic devices 679
Analysis of RFIC Amplifiers 657
Failure Analysis of High Power White LEDs 548
Faulty failure analyses 529
Early failure of high-power white LEDs for outdoor applications under extreme electrical stress: role of silicone encapsulant 518
null 515
Failure Analysis And Field Failures: A Real Shortcut To Reliability Improvements 502
Reliability risks from counterfeit electronics 502
Electrical and structural characterization of metal contacts on Gallium Nitride 500
Electronic components authentication via physical analysis 479
Laser Diode Reliability 458
CUBESATS: PAVING THE WAY TOWARDS AN EFFECTIVE RELIABILITY – ORIENTED APPROACH 455
null 449
A Curved Microstrip Patch Antenna Designed From Transparent Conductive Films 442
Influence of V-Pits on the Turn-On Voltage of GaN-Based High Periodicity Multiple Quantum Well Solar Cells 419
New paradigm for EBIC amplifier on FIB X-section 344
A transparent curved microstrip patch antenna 199
Robustness and reliability of high-power white LEDs under high-temperature, high-current stress 178
Catastrophic degradation of LEDs: failure analysis and perspective 127
Influence of V-pits on the electro-optical properties of high-periodicity InGaN MQWs 125
Electronics authentication using electrical measurements and machine learning 112
Evaluation of flexible organic transistor stability in harsh conditions 110
The threat of counterfeit electronics to the development of CubeSats 110
Counterfeit electronics in industry 4.0: risks and detection 98
Failure Analysis-assisted FMEA 86
Detecting counterfeit electronic circuits: the effect of PCB thickness and dielectric permittivity on the electromagnetic fingerprint 84
Counterfeit electronics detection via physical analysis 78
Enhancing Thermal and Radiation Hardness of All-Organic Printed Transistors by a Flexible and Transparent Encapsulation Layer for Low Earth Orbit Applications 76
Counterfeit electronics: A threat for new space economy 75
Totale 110.347
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Categoria #
all - tutte 144.229
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 144.229
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20212.192 0 0 0 0 0 0 0 0 0 779 660 753
2021/20225.703 751 351 220 450 487 323 163 284 502 726 807 639
2022/20239.309 711 1.287 1.345 741 494 1.082 327 1.178 628 472 610 434
2023/202412.143 697 785 735 794 1.097 1.724 2.010 866 404 616 1.206 1.209
2024/202522.158 2.948 4.368 8.061 1.907 1.453 1.411 1.058 149 222 193 175 213
2025/20266.393 342 247 677 837 655 433 987 1.075 327 813 0 0
Totale 110.645